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    • 3. 发明授权
    • Multiple species sputtering for improved bottom coverage and improved
sputter rate
    • 用于改善底部覆盖和改善溅射速率的多种溅射
    • US6083358A
    • 2000-07-04
    • US53354
    • 1998-04-01
    • P. J. IrelandHoward RhodesSujit SharanSukesh SandhuTim O'BrienTim Johnson
    • P. J. IrelandHoward RhodesSujit SharanSukesh SandhuTim O'BrienTim Johnson
    • C23C14/04C23C14/35H01L21/762H01L21/768C23C14/34
    • C23C14/35C23C14/046H01L21/762H01L21/76877
    • An improved sputtering process increases the perpendicularity of the sputtered flux to the target surface by bombarding the target with both low and high mass ions, with low mass ions predominating, packing the target with both low and high mass implanted ions, and causing target atoms ejected as a result of high mass incident ions to have a higher probability of perpendicular or near perpendicular ejection. An alternative improved sputtering process bombards the target with both low and high mass ions, with high mass ions predominating, resulting in a higher sputter rate than achievable with either the high or low mass species alone. Including in either process as the high or the low mass species a species having a lower ionization energy than a standard species allows a reduced pressure plasma, resulting in less scattering of the sputtered flux. A low ionization energy species may also be employed to assist in striking a plasma before sputtering by a single species during deposition.
    • 改进的溅射工艺通过以低质量离子和高质量离子轰击靶,通过以低质量离子为主来增加溅射通量对目标表面的垂直度,用低质量和高质量注入离子填充目标,并引起目标原子喷出 作为高质量入射离子的结果具有更高的垂直或近似垂直喷射的概率。 一种替代的改进的溅射工艺用低和高质量离子轰击靶,以高质量离子为主,导致比单独使用高质量或低质量物质可实现的更高的溅射速率。 在任一过程中,作为高质量或低质量物质,具有比标准物质更低的电离能的物质允许减压等离子体,导致溅射通量的较少散射。 也可以使用低电离能种来在沉积期间通过单一物质在溅射之前帮助击打等离子体。
    • 4. 发明授权
    • Multiple species sputtering method
    • 多种溅射法
    • US06398923B1
    • 2002-06-04
    • US09609441
    • 2000-07-03
    • P. J. IrelandHoward RhodesSujit SharanSukesh SandhuTim O'BrienTim Johnson
    • P. J. IrelandHoward RhodesSujit SharanSukesh SandhuTim O'BrienTim Johnson
    • C23C1434
    • C23C14/35C23C14/046H01L21/762H01L21/76877
    • An improved sputtering process increases the perpendicularity of the sputtered flux to the target surface by bombarding the target with both low and high mass ions, with low mass ions predominating, packing the target with both low and high mass implanted ions, and causing target atoms ejected as a result of high mass incident ions to have a higher probability of perpendicular or near perpendicular ejection. An alternative improved sputtering process bombards the target with both low and high mass ions, with high mass ions predominating, resulting in a higher sputter rate than achievable with either the high or low mass species alone. Including in either process as the high or the low mass species a species having a lower ionization energy than a standard species allows a reduced pressure plasma, resulting in less scattering of the sputtered flux. A low ionization energy species may also be employed to assist in striking a plasma before sputtering by a single species during deposition.
    • 改进的溅射工艺通过以低质量离子和高质量离子轰击靶,通过以低质量离子为主来增加溅射通量对目标表面的垂直度,用低质量和高质量注入离子填充目标,并引起目标原子喷出 作为高质量入射离子的结果具有更高的垂直或近似垂直喷射的概率。 一种替代的改进的溅射工艺用低和高质量离子轰击靶,以高质量离子为主,导致比单独使用高质量或低质量物质可实现的更高的溅射速率。 在任一过程中,作为高质量或低质量物质,具有比标准物质更低的电离能的物质允许减压等离子体,导致溅射通量的较少散射。 也可以使用低电离能种来在沉积期间通过单一物质在溅射之前帮助击打等离子体。
    • 5. 发明申请
    • RESONATOR FOR THERMO OPTIC DEVICE
    • 热电偶装置谐振器
    • US20080089647A1
    • 2008-04-17
    • US11951796
    • 2007-12-06
    • Gurtej SandhuGuy BlalockHoward Rhodes
    • Gurtej SandhuGuy BlalockHoward Rhodes
    • G02B6/26
    • G02B6/132G02B6/12004G02B6/12007G02B6/136G02F1/011G02F1/0147G02F2203/15
    • A resonator for thermo optic devices is formed in the same process steps as a waveguide and is formed in a depression of a lower cladding while the waveguide is formed on a surface of the lower cladding. Since upper surfaces of the resonator and waveguide are substantially coplanar, the aspect ratio, as between the waveguide and resonator in an area where the waveguide and resonator front one another, decreases thereby increasing the bandwidth of the resonator. The depression is formed by photomasking and etching the lower cladding before forming the resonator and waveguide. Pluralities of resonators are also taught that are formed in a plurality of depressions of the lower cladding. To decrease resonator bandwidth, waveguide(s) are formed in the depression(s) of the lower cladding while the resonator is formed on the surface. Thermo optic devices formed with these resonators are also taught.
    • 用于热光器件的谐振器以与波导相同的工艺步骤形成,并且形成在下包层的凹陷中,同时波导形成在下包层的表面上。 由于谐振器和波导的上表面基本上是共面的,因此在波导和谐振器彼此前向的区域中的波导和谐振器之间的纵横比减小,从而增加了谐振器的带宽。 在形成谐振器和波导之前,通过光掩模和蚀刻下部包层形成凹陷。 还教导了形成在下部包层的多个凹部中的多个谐振器。 为了减小谐振器带宽,当在表面上形成谐振器时,在下包层的凹陷中形成波导。 还教导了用这些谐振器形成的热光器件。
    • 7. 发明申请
    • Top electrode in a strongly oxidizing environment
    • 顶极电极处于强氧化环境
    • US20070069270A1
    • 2007-03-29
    • US11398498
    • 2006-04-04
    • Cem BasceriHoward RhodesGurtej SandhuF. GealyThomas Graettinger
    • Cem BasceriHoward RhodesGurtej SandhuF. GealyThomas Graettinger
    • H01L29/94
    • H01L28/65H01L21/31637H01L21/31691H01L23/5222H01L27/10852H01L28/56H01L28/60H01L2924/0002H01L2924/00
    • An improved charge storing device and methods for providing the same, the charge storing device comprising a conductor-insulator-conductor (CIC) sandwich. The CIC sandwich comprises a first conducting layer deposited on a semiconductor integrated circuit. The CIC sandwich further comprises a first insulating layer deposited over the first conducting layer in a flush manner. The first insulating layer comprises a structure having a plurality of oxygen cites and a plurality of oxygen atoms that partially fill the oxygen cites, wherein the unfilled oxygen cites define a concentration of oxygen vacancies. The CIC sandwich further comprises a second conducting layer deposited over the first insulating layer in a strongly oxidizing ambient so as to reduce the concentration of oxygen vacancies in the first insulating layer, so as to provide an oxygen-rich interface layer between the first insulating layer and the second conducting layer, and so as to trap a plurality of oxygen atoms within the second conducting layer. The oxygen-rich interface layer and second conducting layer act as oxygen vacancy sinks for absorbing migrating oxygen vacancies that originate from the first insulating layer to thereby reduce the concentration of oxygen vacancies in the first insulating layer and to thereby reduce the buildup of oxygen vacancies at the interface layer. Thus, the first insulating layer provides an increased dielectric constant and an increased resistance to current flowing therethrough so as to increase the capacitance of the CIC sandwich and so as to reduce leakage currents flowing through the CIC sandwich.
    • 一种改进的电荷存储装置及其提供方法,电荷存储装置包括导体 - 绝缘体导体(CIC)三明治。 CIC夹层包括沉积在半导体集成电路上的第一导电层。 CIC夹层还包括以齐平方式沉积在第一导电层上的第一绝缘层。 第一绝缘层包括具有多个氧化物和部分填充氧化物的多个氧原子的结构,其中未填充的氧气定义氧空位的浓度。 CIC夹层还包括在强氧化环境中沉积在第一绝缘层上的第二导电层,以便降低第一绝缘层中氧空位的浓度,从而在第一绝缘层之间提供富氧界面层 和第二导电层,以便在第二导电层内捕获多个氧原子。 富氧界面层和第二导电层用作氧空位吸收器,用于吸收源于第一绝缘层的迁移氧空位,从而降低第一绝缘层中氧空位的浓度,从而减少氧空位的累积 接口层。 因此,第一绝缘层提供增加的介电常数和增加的电流流过其中,从而增加CIC夹层的电容,并且减少流过CIC夹层的漏电流。
    • 10. 发明授权
    • Image sensor having a charge storage region provided within an implant region
    • 具有设置在植入区域内的电荷存储区域的图像传感器
    • US07750382B2
    • 2010-07-06
    • US12324083
    • 2008-11-26
    • Howard Rhodes
    • Howard Rhodes
    • H01L31/062
    • H01L27/14609H01L27/14643H01L27/14689H01L31/035272
    • A deep implanted region of a first conductivity type located below a transistor array of a pixel sensor cell and adjacent a doped region of a second conductivity type of a photodiode of the pixel sensor cell is disclosed. The deep implanted region reduces surface leakage and dark current and increases the capacitance of the photodiode by acting as a reflective barrier to photo-generated charge in the doped region of the second conductivity type of the photodiode. The deep implanted region also provides improved charge transfer from the charge collection region of the photodiode to a floating diffusion region adjacent the gate of the transfer transistor.
    • 公开了一种位于像素传感器单元的晶体管阵列下方并且与像素传感器单元的第二导电类型的光电二极管的掺杂区相邻的第一导电类型的深度注入区域。 深注入区域减小了表面泄漏和暗电流,并且通过在第二导电类型的光电二极管的掺杂区域中作为光生电荷的反射阻挡来增加光电二极管的电容。 深注入区域还提供从光电二极管的电荷收集区域到与传输晶体管的栅极相邻的浮动扩散区域的改进的电荷转移。