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    • 1. 发明授权
    • Image sensor having a charge storage region provided within an implant region
    • 具有设置在植入区域内的电荷存储区域的图像传感器
    • US07750382B2
    • 2010-07-06
    • US12324083
    • 2008-11-26
    • Howard Rhodes
    • Howard Rhodes
    • H01L31/062
    • H01L27/14609H01L27/14643H01L27/14689H01L31/035272
    • A deep implanted region of a first conductivity type located below a transistor array of a pixel sensor cell and adjacent a doped region of a second conductivity type of a photodiode of the pixel sensor cell is disclosed. The deep implanted region reduces surface leakage and dark current and increases the capacitance of the photodiode by acting as a reflective barrier to photo-generated charge in the doped region of the second conductivity type of the photodiode. The deep implanted region also provides improved charge transfer from the charge collection region of the photodiode to a floating diffusion region adjacent the gate of the transfer transistor.
    • 公开了一种位于像素传感器单元的晶体管阵列下方并且与像素传感器单元的第二导电类型的光电二极管的掺杂区相邻的第一导电类型的深度注入区域。 深注入区域减小了表面泄漏和暗电流,并且通过在第二导电类型的光电二极管的掺杂区域中作为光生电荷的反射阻挡来增加光电二极管的电容。 深注入区域还提供从光电二极管的电荷收集区域到与传输晶体管的栅极相邻的浮动扩散区域的改进的电荷转移。
    • 3. 发明申请
    • IMAGE SENSOR HAVING A CHARGE STORAGE REGION PROVIDED WITHIN AN IMPLANT REGION
    • 具有在一个植被区域内提供的充电储存区域的图像传感器
    • US20090078978A1
    • 2009-03-26
    • US12324083
    • 2008-11-26
    • Howard Rhodes
    • Howard Rhodes
    • H01L27/146
    • H01L27/14609H01L27/14643H01L27/14689H01L31/035272
    • A deep implanted region of a first conductivity type located below a transistor array of a pixel sensor cell and adjacent a doped region of a second conductivity type of a photodiode of the pixel sensor cell is disclosed. The deep implanted region reduces surface leakage and dark current and increases the capacitance of the photodiode by acting as a reflective barrier to photo-generated charge in the doped region of the second conductivity type of the photodiode. The deep implanted region also provides improved charge transfer from the charge collection region of the photodiode to a floating diffusion region adjacent the gate of the transfer transistor.
    • 公开了一种位于像素传感器单元的晶体管阵列下方并且与像素传感器单元的第二导电类型的光电二极管的掺杂区相邻的第一导电类型的深度注入区域。 深注入区域减小了表面泄漏和暗电流,并且通过在第二导电类型的光电二极管的掺杂区域中作为光生电荷的反射阻挡来增加光电二极管的电容。 深注入区域还提供从光电二极管的电荷收集区域到与传输晶体管的栅极相邻的浮动扩散区域的改进的电荷转移。
    • 8. 发明申请
    • Passivation planarization
    • 钝化平面化
    • US20070166854A1
    • 2007-07-19
    • US11717739
    • 2007-03-14
    • Howard Rhodes
    • Howard Rhodes
    • H01L21/00
    • H01L27/14618H01L21/76819H01L21/76837H01L27/14609H01L27/14621H01L27/14627H01L27/14687H01L2924/0002H01L2924/00
    • A pixel cell is formed by locating a first passivation layer over the final layer of metal lines. Subsequently, the uneven, non-uniform passivation layer is subjected to a planarization process such as chemical mechanical polishing, mechanical abrasion, or etching. A spin-on-glass layer may be deposited over the non-uniform passivation layer prior to planarization. Once a uniform, flat first passivation layer is achieved over the final metal, a second passivation layer, a color filter array, or a lens forming layer with uniform thickness is formed over the first passivation layer. The passivation layers can be oxide, nitride, a combination of oxide and nitride, or other suitable materials. The color filter array layer may also undergo a planarization process prior to formation of the lens forming layer. The present invention is also applicable to other devices.
    • 通过在金属线的最终层上定位第一钝化层来形成像素单元。 随后,对不均匀的不均匀的钝化层进行化学机械抛光,机械磨蚀或蚀刻等平面化处理。 在平坦化之前,可以在非均匀钝化层上沉积旋涂玻璃层。 一旦在最终金属上实现均匀的平坦的第一钝化层,则在第一钝化层上形成第二钝化层,滤色器阵列或具有均匀厚度的透镜形成层。 钝化层可以是氧化物,氮化物,氧化物和氮化物的组合,或其它合适的材料。 在形成透镜形成层之前,滤色器阵列层也可以进行平坦化处理。 本发明也适用于其他装置。
    • 9. 发明申请
    • Pixel cell with a controlled output signal knee characteristic response
    • 具有受控输出信号的像素单元膝盖特征响应
    • US20070096241A1
    • 2007-05-03
    • US11589206
    • 2006-10-30
    • Howard Rhodes
    • Howard Rhodes
    • H01L31/06
    • H01L27/14609H01L27/14603H01L27/14689H01L31/035272
    • A pixel cell with controlled leakage is formed by modifying the location and gate profile of a high dynamic range (HDR) transistor. The HDR transistor may have the gate profile of a transfer gate or a reset gate. The HDR transistor may be located on a side of the photodiode that is the same, opposite to, or perpendicular to the transfer gate. The leakage through the HDR transistor may be controlled by modifying the photodiode implants around the transistor. The photodiode implants at the HDR transistor may be placed similarly to the implants at the transfer gate. However, when the photodiode implants are moved away from the HDR transistor, leakage is reduced. When the photodiode implants are moved farther under the HDR transistor, leakage is increased to the extent desirable. The leakage through the HDR transistor may also be controlled by applying a voltage across the transistor.
    • 具有受控泄漏的像素单元通过修改高动态范围(HDR)晶体管的位置和栅极分布来形成。 HDR晶体管可以具有传输门或复位栅的栅极分布。 HDR晶体管可以位于与传输门相同或垂直的光电二极管的一侧。 可以通过修改晶体管周围的光电二极管植入来控制通过HDR晶体管的泄漏。 在HDR晶体管处的光电二极管植入物可以类似于在传输门处的植入物放置。 然而,当光电二极管植入物远离HDR晶体管时,漏电减少。 当光电二极管植入物在HDR晶体管下移动得更远时,泄漏增加到期望的程度。 也可以通过在晶体管两端施加电压来控制通过HDR晶体管的泄漏。
    • 10. 发明申请
    • Barrier regions for image sensors
    • 图像传感器的屏障区域
    • US20070063301A1
    • 2007-03-22
    • US11600891
    • 2006-11-17
    • Howard RhodesRichard MauritzsonWilliam Quinlin
    • Howard RhodesRichard MauritzsonWilliam Quinlin
    • H01L31/00
    • H01L27/14603H01L27/14607H01L27/14609H01L27/1463H01L27/14645H01L27/14654H01L27/14689
    • Embodiments of the invention provide an image sensor that includes a barrier region for isolating devices. The image sensor comprises a substrate and an array of pixel cells formed on the substrate. Each pixel cell comprises a photo-conversion device. The array comprises a first pixel cell having a first configuration, a second pixel cell having a second configuration, and at least one barrier region formed between the first and second pixel cells for capturing and removing charge. The barrier region comprises a charge accumulation region of a particular conductivity type in a substrate electrically connected to a voltage source terminal. The charge accumulation region accumulates charge and prevents charge transference from a pixel cell or peripheral circuitry on one side of the barrier region to a pixel cell on another side of the barrier region.
    • 本发明的实施例提供了一种图像传感器,其包括用于隔离装置的阻挡区域。 图像传感器包括衬底和形成在衬底上的像素单元的阵列。 每个像素单元包括光转换装置。 该阵列包括具有第一配置的第一像素单元,具有第二配置的第二像素单元,以及形成在第一和第二像素单元之间用于捕获和去除电荷的至少一个势垒区域。 阻挡区域包括在电连接到电压源端子的基板中的特定导电类型的电荷累积区域。 电荷累积区域累积电荷并防止从阻挡区域一侧上的像素单元或外围电路到屏障区域另一侧上的像素单元的电荷转移。