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    • 1. 发明授权
    • Integrated circuit device with input buffer capable of correspondence with highspeed clock
    • 具有与高速时钟对应的输入缓冲器的集成电路器件
    • US06239631B1
    • 2001-05-29
    • US09377104
    • 1999-08-19
    • Shinya FujiokaHiroyoshi Tomita
    • Shinya FujiokaHiroyoshi Tomita
    • H03L700
    • G11C7/1093G06F5/06G11C7/1087G11C7/222H03L7/00
    • One aspect of the present invention is characterized in that an input buffer circuit constitutes either 2 sets, or a plurality of sets relative to 1 input signal, either a pair of complementary internal clocks, or a plurality of internal clocks are generated by frequency-dividing a supplied clock inside the integrated circuit device, and input signals are received and latched either in synchronization with a pair of complementary clocks, or in synchronization with a plurality of clocks in accordance with an input buffer of either 2 sets or a plurality of sets. The output of input buffers of either 2 sets or a plurality of sets are combined by a combining circuit, and supplied internally. An H level or an L level period is set for the internally-generated internal clock so that outputs from the various input buffers are not in contention with one another. According to the present invention, the operation of input buffers of a plurality of sets are synchronized with internal clocks of a slower speed than a supplied clock, thus enabling the reliable receive of input signals.
    • 本发明的一个方面的特征在于,输入缓冲电路构成2组或相对于1个输入信号的多组,一对互补的内部时钟或多个内部时钟通过分频产生 集成电路器件内的提供的时钟和输入信号可以与一对互补时钟同步地接收和锁存,或者根据两组或多组的输入缓冲器与多个时钟同步地被接收和锁存。 2组或多组的输入缓冲器的输出由组合电路组合,并在内部提供。 为内部产生的内部时钟设置一个H电平或一个L电平周期,使得各种输入缓冲器的输出不会相互竞争。 根据本发明,多个组的输入缓冲器的操作与比所提供的时钟慢的内部时钟同步,因此能够可靠地接收输入信号。
    • 3. 发明授权
    • Semiconductor device with current mirror circuit having two transistors of identical characteristics
    • 具有电流镜电路的半导体器件具有两个相同特性的晶体管
    • US07723796B2
    • 2010-05-25
    • US11902568
    • 2007-09-24
    • Hiroyoshi Tomita
    • Hiroyoshi Tomita
    • H01L23/62
    • G05F3/262H01L29/4238
    • A semiconductor device includes a current-mirror circuit including a first ring-shape gate, a second ring-shape gate, a first diffusion layer formed around the first ring-shape gate and the second ring-shape gate, a second diffusion layer formed inside the first ring-shape gate, a third diffusion layer formed inside the second ring-shape gate, an interconnect line electrically connecting the first ring-shape gate and the second ring-shape gate to a same potential, and an STI area formed around the first diffusion layer, wherein a first transistor corresponding to the first ring-shape gate and a second transistor corresponding to the second ring-shape gate constitute the current-mirror circuit, wherein gates of dummy transistors that do not function as transistors are situated between the STI area and the first and second ring-shape gates, and are arranged both in a first direction and in a second direction substantially perpendicular to the first direction.
    • 一种半导体器件包括:电流镜电路,包括第一环形栅极,第二环形栅极,形成在第一环状栅极和第二环形栅极周围的第一扩散层,第二扩散层, 第一环形栅极,形成在第二环形栅极内部的第三扩散层,将第一环形栅极和第二环形栅极电连接到相同电位的互连线,以及形成在第二环形栅极周围的STI区域 第一扩散层,其中对应于第一环形栅极的第一晶体管和对应于第二环形栅极的第二晶体管构成电流镜电路,其中不用作晶体管的虚拟晶体管的栅极位于 STI区域和第​​一和第二环形门,并且布置在基本上垂直于第一方向的第一方向和第二方向上。
    • 4. 发明授权
    • Semiconductor device and fabrication method thereof
    • 半导体器件及其制造方法
    • US07539042B2
    • 2009-05-26
    • US11783318
    • 2007-04-09
    • Hiroyoshi Tomita
    • Hiroyoshi Tomita
    • G11C11/24G11C7/00G11C8/00
    • G11C11/4074G11C11/401G11C29/50G11C2029/0403G11C2207/2254H01L27/0207H01L27/10829
    • The present invention suppresses the refresh failure of a DRAM due to the dispersion of a threshold of a MOSFET. The DRAM has a first unit for recording a set value of a back bias potential to be applied to a back gate of a cell transistor and a second unit for generating a back bias potential based on the set value of the back bias potential recorded in the first unit and supplying the generated back bias potential to the back gate, wherein when a threshold of a MOSFET which has a structure identical to the cell transistor and which has been fabricated in the same process as the cell transistor is greater than a target value which the cell transistor should have, a value shallower than the back bias potential for the target value is recorded in the second unit.
    • 本发明抑制由于MOSFET的阈值的偏差引起的DRAM的刷新故障。 DRAM具有第一单元,用于记录要施加到单元晶体管的背栅的背偏置电位的设定值,以及用于产生背偏电位的第二单元,其基于记录在所述单元晶体管中的背偏电位的设定值 第一单元并将所产生的反向偏置电位提供给所述后栅极,其中当具有与所述单元晶体管相同的并且已经以与所述单元晶体管相同的工艺制造的结构的MOSFET的阈值大于目标值时, 单元晶体管应当具有比目标值的背偏电位浅的值被记录在第二单元中。
    • 10. 发明授权
    • Semiconductor integrated circuit, and method of controlling same
    • 半导体集成电路及其控制方法
    • US06252804B1
    • 2001-06-26
    • US09629619
    • 2000-07-31
    • Hiroyoshi Tomita
    • Hiroyoshi Tomita
    • G11C1140
    • G11C7/109G11C7/1006G11C7/1072G11C7/1078
    • A semiconductor integrated circuit comprising memory cells and a holding unit. The holding unit holds write data to the memory cell and mask information for masking a predetermined bit or bits of the write data, both supplied corresponding to a write command, as held write data and held mask information. On receiving a next write command, the semiconductor integrated circuit masks held write data in accordance with held mask information and writes the resultant to the memory cell. The holding unit holds next write data and next mask information supplied corresponding to this write command as held write data and held mask information. That is, the held write data and the held mask information are rewritten. Thereby, the semiconductor integrated circuit which writes write data previously accepted upon the reception of a next write command can mask the write data.
    • 一种包括存储单元和保持单元的半导体集成电路。 保持单元将写入数据保存到存储单元,并且掩蔽信息,用于屏蔽对应于写入命令的写入数据的预定位或位,作为保持写入数据和保持的掩码信息。 在接收到下一个写入命令时,半导体集成电路根据所保持的掩码信息掩蔽保持写入数据,并将结果写入存储单元。 保持单元保持与该写入命令相对应的下一个写入数据和下一个掩模信息作为保持的写入数据和保持的掩码信息。 也就是说,保持的写入数据和保持的掩码信息被重写。 由此,在接收下一个写入命令时写入预先接受的写入数据的半导体集成电路可以掩蔽写入数据。