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    • 4. 发明授权
    • Adhesive application apparatus
    • 粘合剂涂布装置
    • US08662009B2
    • 2014-03-04
    • US12881710
    • 2010-09-14
    • Takashi AndoEijiro FurutaAkira Honma
    • Takashi AndoEijiro FurutaAkira Honma
    • B05C5/00B05D7/24B05D7/00B05D1/26B05D1/00
    • B05C17/00573B05B12/084B05B13/0431B05B15/80
    • An adhesive application apparatus for applying a liquid adhesive to an object includes a regular application stage against which the object is placed for a regular application of the liquid adhesive to the object, a trial application stage to which a trial application of the liquid adhesive is carried out, an application unit relatively movable with respect to the regular application stage and trial application stage to carry out the regular application and trial application of the liquid adhesive, and a suction unit carrying out a suction operation of the liquid adhesive used in the trial application. The adhesive application apparatus smoothly carries out the trial application of the liquid adhesive without bothering the operation of an adhesive application line.
    • 用于将液体粘合剂施加到物体上的粘合剂施加装置包括常规施加阶段,用于将物体定期施加到物体上的物体被放置在其上,用于粘贴液体粘合剂的试用阶段 可以相对于常规应用阶段和试用阶段相对移动的应用单元来执行液体粘合剂的定期应用和试用;以及抽吸单元,其用于试用中使用的液体粘合剂的抽吸操作 。 粘合剂涂布装置平滑地进行液体粘合剂的试验,而不会影响粘合剂施加线的操作。
    • 7. 发明授权
    • Gate-last fabrication of quarter-gap MGHK FET
    • 最后制造四分之一MGHK FET
    • US08786030B2
    • 2014-07-22
    • US13570388
    • 2012-08-09
    • Takashi AndoKisik ChoiVijay NarayananTenko YamashitaJunli Wang
    • Takashi AndoKisik ChoiVijay NarayananTenko YamashitaJunli Wang
    • H01L21/02
    • H01L29/517H01L21/28079H01L21/28088H01L29/4958H01L29/4966H01L29/66545
    • A quarter-gap p-type field effect transistor (PFET) formed by gate-last fabrication includes a gate stack formed on a silicon substrate, the gate stack including: a high-k dielectric layer located on the silicon substrate; and a gate metal layer located over the high-k dielectric layer, the gate metal layer including titanium nitride and having a thickness of about 20 angstroms; and a metal contact formed over the gate stack. A quarter-gap n-type field effect transistor (NFET) formed by gate-last fabrication includes a gate stack formed on a silicon substrate, the gate stack including: a high-k dielectric layer located on the silicon substrate; and a first gate metal layer located over the high-k dielectric layer, the first gate metal layer including titanium nitride; and a metal contact formed over the gate stack.
    • 通过栅极最终制造形成的四分之一间隙p型场效应晶体管(PFET)包括形成在硅衬底上的栅极堆叠,所述栅极堆叠包括:位于硅衬底上的高k电介质层; 以及位于高k电介质层上方的栅极金属层,所述栅极金属层包括氮化钛并且具有约20埃的厚度; 以及形成在栅极堆叠上的金属接触。 通过栅极最后制造形成的四分之一间隙n型场效应晶体管(NFET)包括形成在硅衬底上的栅极堆叠,该栅极堆叠包括:位于硅衬底上的高k电介质层; 以及位于所述高k电介质层上方的第一栅极金属层,所述第一栅极金属层包括氮化钛; 以及形成在栅极堆叠上的金属接触。
    • 8. 发明授权
    • Positioning apparatus
    • 定位装置
    • US08740506B2
    • 2014-06-03
    • US13033253
    • 2011-02-23
    • Shogo OgakiTakashi AndoMasaru InoueTakeshi Shimoda
    • Shogo OgakiTakashi AndoMasaru InoueTakeshi Shimoda
    • B65G51/20
    • B65G51/03B65G47/525H01L41/25
    • A positioning apparatus includes a stage on which a piezoelectric element is set, a stop unit having a stop face to which the piezoelectric element set on the stage is pushed so that the piezoelectric element is positioned at a target position corresponding to an attaching part of, for example, a head suspension to which the piezoelectric element is attached, and a pushing unit to push the piezoelectric element toward the stop face, the pushing unit blowing a gas to push the piezoelectric element. The positioning apparatus is capable of correctly positioning the piezoelectric element to the target position without damaging the piezoelectric element.
    • 一种定位装置,包括设置有压电元件的台,具有止动面的停止单元,所述停止面被压入到设置在所述台上的所述压电元件,使得所述压电元件位于对应于所述平台的安装部的目标位置, 例如,安装有压电元件的磁头悬架以及将压电元件朝向止动面推压的推压单元,推压单元吹出气体来推压压电元件。 定位装置能够将压电元件正确地定位到目标位置而不损坏压电元件。