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    • 2. 发明申请
    • Bottom lighting type backlight module having illumination and heat dissipation spaces and plurality of through-holes therein
    • 具有照明和散热空间的底部照明型背光模块和其中的多个通孔
    • US20080285277A1
    • 2008-11-20
    • US12220380
    • 2008-07-24
    • Shao-Han ChangFen Chen
    • Shao-Han ChangFen Chen
    • F21V7/04
    • G02F1/133608G02F2001/133628
    • An exemplary bottom lighting type backlight module includes a frame, a plurality of light sources, a reflecting sheet and at least one optical sheet. The frame includes a base and a plurality of sidewalls extending from the peripheral of the base to define an opening. The base defines a plurality of guide holes. Each optical sheet is disposed on the opening of the frame. The at least one optical sheet and the frame collectively define a chamber. The reflecting sheet is supported by the sidewalls, for partitioning the chamber into an illumination space and a heat dissipation space. The reflecting sheet defines a plurality of through holes therein. The light sources are arranged on the base of the frame under the reflecting sheet according to the through holes, illuminating light through the through holes towards the at least one optical sheet.
    • 示例性的底部照明型背光模块包括框架,多个光源,反射片和至少一个光学片。 框架包括从基部的周边延伸以限定开口的基部和多个侧壁。 基部限定多个引导孔。 每个光学片设置在框架的开口上。 所述至少一个光学片和所述框共同地限定一个室。 反射片由侧壁支撑,用于将室分隔成照明空间和散热空间。 反射片在其中限定多个通孔。 光源根据通孔布置在反射片下方的框架底部,通过通孔朝向至少一个光学片照射光。
    • 4. 发明申请
    • Light source module and backlight system using the same
    • 光源模块和背光系统使用相同
    • US20070189015A1
    • 2007-08-16
    • US11508369
    • 2006-08-23
    • Shao-Han ChangFen Chen
    • Shao-Han ChangFen Chen
    • F21V7/00
    • F21V29/74F21V29/004F21V29/76F21Y2115/10G02F1/133603G02F1/133611
    • A light source module includes at least a light source and a housing. The housing includes a base having a slanted reflective surface, a plurality of sidewalls extending out of a peripheral of the base cooperatively defining an opening with the base, the sidewall aligned with a trough of the slanted reflective surface having an inner surface and an outer surface opposite to the inner surface, and a plurality of fin structures formed on the outer surface of the sidewall. The light source is fixed on the inner surface of the sidewall. Light rays emitted from the light source being reflected at the slanted reflective surface toward the opening. A backlight system using the light source module is also provided. The present backlight system has a good heat dissipation capability due to an employment of the present light source module, and can be configured to be a thin body.
    • 光源模块至少包括光源和壳体。 壳体包括具有倾斜反射表面的底座,从基座的周边延伸出的多个侧壁协同地限定具有基部的开口,与倾斜反射表面的槽对准的侧壁具有内表面和外表面 与内表面相对,以及形成在侧壁的外表面上的多个翅片结构。 光源固定在侧壁的内表面上。 从光源发射的光线在倾斜的反射面朝向开口反射。 还提供了使用光源模块的背光系统。 由于使用本发明的光源模块,本背光系统具有良好的散热能力,并且可以被配置为薄体。
    • 6. 发明授权
    • Analyzing EM performance during IC manufacturing
    • 分析IC制造过程中的EM性能
    • US08917104B2
    • 2014-12-23
    • US13222306
    • 2011-08-31
    • Fen ChenRoger A. DufresneKai D. FengRichard J. St-Pierre
    • Fen ChenRoger A. DufresneKai D. FengRichard J. St-Pierre
    • G01R31/3187G01R31/28
    • G01R31/2858
    • A testing structure, system and method for monitoring electro-migration (EM) performance. A system is described that includes an array of testing structures, wherein each testing structure includes: an EM resistor having four point resistive measurement, wherein a first and second terminals provide current input and a third and fourth terminals provide a voltage measurement; a first transistor coupled to a first terminal of the EM resistor for supplying a test current; the voltage measurement obtained from a pair of switching transistors whose gates are controlled by a selection switch and whose drains are utilized to provide a voltage measurement across the third and fourth terminals. Also included is a decoder for selectively activating the selection switch for one of the array of testing structures; and a pair of outputs for outputting the voltage measurement of a selected testing structure.
    • 用于监测电迁移(EM)性能的测试结构,系统和方法。 描述了包括测试结构阵列的系统,其中每个测试结构包括:具有四点电阻测量的EM电阻器,其中第一和第二端子提供电流输入,第三和第四端子提供电压测量; 耦合到所述EM电阻器的第一端子以提供测试电流的第一晶体管; 由一对开关晶体管获得的电压测量,其栅极由选择开关控制,并且其漏极用于在第三和第四端子处提供电压测量。 还包括用于选择性地激活测试结构阵列之一的选择开关的解码器; 以及用于输出所选择的测试结构的电压测量的一对输出。