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1. 发明申请

US20200242865A1 ACCESS CONTROL SYSTEM AND METHOD THEREOF 审中-公开
公开(公告)号：US20200242865A1
公开(公告)日：2020-07-30
申请号：US16083966
申请日：2017-03-21
申请人： SOREQ NUCLEAR RESEARCH CENTER , SECURITY MATTERS LTD.
发明人： Yair GROF , Tzemah KISLEV , Nadav YORAN , Haggai ALON
IPC分类号： G07C9/00
摘要： The present invention relates to an access control system, an access object and a method for access control. The access control system comprises an access request receiving device being configured and operable for receiving an access object; the access request receiving device comprising an emitter configured and operable for irradiating the access object with a radiation having a wavelength in the range of about 10″12 and 10″9 m and a detector configured and operable for detecting a response signal from the irradiated access object; a control circuit being configured and operable to receive the response signal from the access request receiving device and process the response signal to identify spectral features indicative of an XRF signature of the access object; wherein the control circuit is adapted to generate an unlocking signal for switching a module device between a locked state and an unlocked state upon identification of the XRF signature.

2. 发明申请

US20190193119A1 AN XRF ANALYZER FOR IDENTIFYING A PLURALITY OF SOLID OBJECTS, A SORTING SYSTEM AND A SORTING METHOD THEREOF 审中-公开
公开(公告)号：US20190193119A1
公开(公告)日：2019-06-27
申请号：US16311290
申请日：2017-06-21
申请人： SOREQ NUCLEAR RESEARCH CENTER , SECURITY MATTERS LTD.
发明人： Yair GROF , Tzemah KISLEV , Nadav YORAN , Haggai ALON , Mor KAPLINSKY
IPC分类号： B07C5/34 , G01N23/223
CPC分类号： B07C5/3412 , B07C5/3427 , G01N23/223 , G01N2223/643
摘要： The present invention discloses a novel XRF analyzer capable of simultaneously identifying the presence of a marking composition in a plurality of objects by modulating/varying the intensity of the excitation beam on the different objects and measuring the secondary radiation thereof. The XRF analyzer comprises a radiation emitter assembly adapted for emitting at least one X-Ray or Gamma-Ray excitation radiation beam having a spatial intensity distribution for simultaneously irradiating the plurality of objects; a radiation detector for detecting secondary radiation X-Ray signals arriving from a plurality of objects in response to irradiation of the objects by X-Ray or Gamma-Ray radiation, and providing data indicative of spatial intensity distribution of the detected data X-Ray signals on the plurality of objects; and a signal reading processor in communication with the detector, the processor being adapted for receiving and processing the detected response X-Ray signals to verify presence of the marking composition included at least one surface of each object of the plurality objects.

3. 发明申请

US20190187063A1 METHOD FOR MARKING AND AUTHENTICATING DIAMONDS AND PRECIOUS STONES 审中-公开
公开(公告)号：US20190187063A1
公开(公告)日：2019-06-20
申请号：US16328526
申请日：2017-08-29
申请人： SOREQ NUCLEAR RESEARCH CENTER , SECURITY MATTERS LTD.
发明人： Yair GROF , Tzemah KISLEV , Nadav YORAN , Haggai ALON , Mor KAPLINSKY
IPC分类号： G01N21/87 , G01N23/223 , G06K19/06
CPC分类号： G01N21/87 , B28D5/00 , C01B32/28 , C23C16/28 , C23C16/45525 , G01B11/02 , G01N23/223 , G01N33/381 , G01N2021/6439 , G06K19/06 , G06K19/06009 , G06K2207/1012
摘要： Method and systems are presented for authentication of precious stones, according to their natural ID and/or predetermined markings created in the stones, based on unique characteristic radiation response of the stone to predetermined primary radiation.

4. 发明申请

US20190156075A1 METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS 审中-公开
公开(公告)号：US20190156075A1
公开(公告)日：2019-05-23
申请号：US16091222
申请日：2017-04-04
申请人： SOREQ NUCLEAR RESEARCH CENTER , SECURITY MATTERS LTD.
发明人： Yair GROF , Tzemah KISLEV , Nadav YORAN , Haggai ALON
IPC分类号： G06K7/10 , G01N23/223
摘要： Methods and systems for verifying compatibility of components (e.g. parts or devices) of an electronic system are disclosed. In certain embodiments the method includes: irradiating a first and second components presumably associated with the electronic system, with XRF exciting radiation, and detecting one or more XRF response signals indicative of a first and a second XRF signatures, emitted from the first and second components in response to the irradiation. Then the first and second XRF signatures are processed to determine whether they are associated with respectively a first and second XRF marking compositions on the first and second components, and the compatibility of the first and second components to the electronic system is determined/verified based on the correspondence between the first and a second XRF signatures/marking. Certain embodiments also disclose electronic systems including at least a first and a second electronic components/devices respectively having the first and second XRF marking compositions that enable verification of compatibility of the components. Certain embodiments disclose techniques for pairing the first and second components (e.g. devices) based a correspondence between the first and second XRF signatures/markings thereof. Certain embodiments disclose various calibration techniques for calibrating the XRF measurements of XRF markings applied to different substrate materials of the electronic components.

5. 发明申请

US20230116817A1 DEVICE AND METHOD FOR DETECTION OF VIRUSES BY XRF 有权
公开(公告)号：US20230116817A1
公开(公告)日：2023-04-13
申请号：US17907334
申请日：2021-03-24
申请人： SECURITY MATTERS LTD.
发明人： Yifat BAREKET , Tehila NAHUM , Michal FIRSTENBERG , Nataly TAL , Mor KAPINSKY , Hagit SADE , Dana GASPER , Haggai ALON , Ron DAFNI , Chen NACHMIAS , Gal SHMUELI , Avital TRACHTMAN , Yonatan MUSNIKOW , Maria CHUCHAEV , Nadav YORAN
IPC分类号： G01N33/569 , G01N33/543
摘要： The invention provides methods and tools for the directed and indirect detection of infection with microorganisms pathogens in biological and non- biological samples, and specifically applications of XRF (X-ray fluorescence) methodology for the detection of infections with viral and bacterial pathogens responsible for the widespread epidemics in mammals and humans, including the current pandemic of COVID-19.

6. 发明申请

US20220163456A1 METHOD FOR MARKING AND AUTHENTICATING DIAMONDS AND PRECIOUS STONES 有权
公开(公告)号：US20220163456A1
公开(公告)日：2022-05-26
申请号：US17666866
申请日：2022-02-08
申请人： SOREQ NUCLEAR RESEARCH CENTER , SECURITY MATTERS LTD. , YAHLOMA TECHNOLOGIES INC.
发明人： Yair GROF , Tzemah KISLEV , Nadav YORAN , Haggai ALON , Mor KAPLINSKY
IPC分类号： G01N21/87 , G01N23/223 , G01N33/38 , B28D5/00 , G06K19/06
摘要： Method and systems are presented for authentication of precious stones, according to their natural ID and/or predetermined markings created in the stones, based on unique characteristic radiation response of the stone to predetermined primary radiation.

7. 发明申请

US20190284377A1 XRF-IDENTIFIABLE TRANSPARENT POLYMERS 审中-公开
公开(公告)号：US20190284377A1
公开(公告)日：2019-09-19
申请号：US16340913
申请日：2017-10-01
申请人： SECURITY MATTERS LTD. , SOREQ NUCLEAR RESEARCH CENTER
发明人： Nadav YORAN , Tzemah KISLEV , Yair GROF , Haggai ALON , Mor KAPLINSKY
IPC分类号： C08L23/06 , C08K3/105 , C08K3/11 , C08K3/01 , C08J5/18 , G01N23/223 , C08L23/12 , C08K3/08
摘要： The invention provides formulations and masterbatches of a polymeric material and XRF-identifiable markers, for producing transparent elements including a polymer and at least one XRF-identifiable marker for a variety of industrial uses.

8. 发明申请

US20220312711A1 TRACEABLE COMPOSITE FOR MARKING SEEDS AND PLANTS 有权
公开(公告)号：US20220312711A1
公开(公告)日：2022-10-06
申请号：US17639397
申请日：2020-09-02
申请人： SECURITY MATTERS LTD.
发明人： Yair GROF , Nataly TAL , Mor KAPLINSKY , Ron DAFNI , Yifat BAREKET , Michal FIRSTENBERG , Tehila NAHUM , Hagit SADE , Nadav YORAN , Haggai ALON
IPC分类号： A01H4/00
摘要： The invention concerns compositions and methods for authenticating an agricultural product.

9. 发明申请

US20210321649A1 METHOD FOR DETECTING MISHANDLING AND MISUSE OF FOOD PRODUCTS 有权
公开(公告)号：US20210321649A1
公开(公告)日：2021-10-21
申请号：US16336712
申请日：2017-09-25
申请人： SECURITY MATTERS LTD. , SOREQ NUCLEAR RESEARCH CENTER
发明人： Nadav YORAN , Tzemah KISLEV , Yair GROF , Haggai ALON , Mor KAPLINSKY
IPC分类号： A23L5/30 , A23L13/00 , A23L15/00 , A23L29/00 , A23L29/30 , B41M3/06 , A01K43/10 , G01N33/08 , G01N33/12 , G01N23/223
摘要： Provided is a method for marking a product for human or animal use with an XRF identifiable mark, the method including forming on at least a region of the product a pattern of at least one FDA-grade material identifiable by XRF, the pattern being optionally at least partially invisible to the naked human eye and having a predefined identifiable characteristic, wherein the product is selected from food products, therapeutics and cosmetics.

10. 发明申请

US20200225174A1 METHOD AND A SYSTEM FOR XRF MARKING AND READING XRF MARKS OF ELECTRONIC SYSTEMS 审中-公开
公开(公告)号：US20200225174A1
公开(公告)日：2020-07-16
申请号：US16834732
申请日：2020-03-30
申请人： SECURITY MATTERS LTD.
发明人： Nataly TAL , Mor KAPLINSKY , Tehila NAHUM , Hagit SADE , Dana GASPER , Ron DAFNI , Chen NACHMIAS , Michal FIRSTENBERG , Avital TRACHTMAN , Haggai ALON , Nadav YORAN , Tzemah KISLEV
IPC分类号： G01N23/223 , C23C16/48
摘要： Methods and systems for verifying compatibility of components (e.g. parts or devices) of an electronic system are disclosed. In certain embodiments the method includes: irradiating a first and second components presumably associated with the electronic system, with XRF exciting radiation, and detecting one or more XRF response signals indicative of a first and a second XRF signatures, emitted from the first and second components in response to the irradiation. Then the first and second XRF signatures are processed to determine whether they are associated with respectively a first and second XRF marking compositions on the first and second components, and the compatibility of the first and second components to the electronic system is determined/verified based on the correspondence between the first and a second XRF signatures/marking. Certain embodiments also disclose electronic systems including at least a first and a second electronic components/devices respectively having the first and second XRF marking compositions that enable verification of compatibility of the components. Certain embodiments disclose techniques for pairing the first and second components (e.g. devices) based a correspondence between the first and second XRF signatures/markings thereof. Certain embodiments disclose various calibration techniques for calibrating the XRF measurements of XRF markings applied to different substrate materials of the electronic components.

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