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    • 4. 发明授权
    • Methods of transmission mode X-ray diffraction analysis and apparatuses therefor
    • 透射模式X射线衍射分析方法及其设备
    • US07409041B2
    • 2008-08-05
    • US11416220
    • 2006-05-02
    • Olaf GrassmannMichael HennigRemo Anton HochstrasserUrs Schwitter
    • Olaf GrassmannMichael HennigRemo Anton HochstrasserUrs Schwitter
    • G01N23/20
    • G01N23/20
    • Methods for transmission mode X-ray diffraction analysis of a sample by means of apparatuses comprising an X-ray radiation source that provides X-ray radiation for irradiating the sample and a detector for detecting X-ray radiation transmitted through and diffracted by the sample. The methods include: (a) placing a sample to be analyzed on a substrate, (b) generating X-ray radiation by means of an X-ray radiation source, (c) positioning the substrate and the sample in an initial position, (d) rotating the substrate and the sample with respect to the initial position around a rotation axis over a predetermined rotation angle, (e) tilting the substrate and the sample with respect to the initial position around a tilting axis over a tilting angle, (f) detecting with a detector the X-ray radiation transmitted through and diffracted by the sample during a time interval, and (g) analyzing the X-ray radiation that is detected.
    • 透射模式X射线衍射分析方法的方法是通过包含X射线辐射源的X射线辐射源,用于照射样品的检测器和用于检测被样品透射并衍射的X射线辐射的检测器的样品。 所述方法包括:(a)将待分析的样品放置在基底上,(b)通过X射线辐射源产生X射线辐射,(c)将基底和样品定位在初始位置( (d)使基板和样品相对于围绕旋转轴线的初始位置旋转预定旋转角度,(e)相对于围绕倾斜轴线的倾斜角度的初始位置倾斜基板和样品,(f )用检测器检测在时间间隔期间由样品透射并衍射的X射线辐射,以及(g)分析检测到的X射线辐射。