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1. 发明申请

US20050059216A1 METHOD OF MAKING DIRECT CONTACT ON GATE BY USING DIELECTRIC STOP LAYER 失效
标题翻译：通过使用介质停止层在门上制造直接接触的方法
公开(公告)号：US20050059216A1
公开(公告)日：2005-03-17
申请号：US10664211
申请日：2003-09-17
申请人： Purakh Verma , Sanford Chu , Lap Chan , Yelehanka Ramachandramurthy Pradeep , Kai Shao , Jia Zheng
发明人： Purakh Verma , Sanford Chu , Lap Chan , Yelehanka Ramachandramurthy Pradeep , Kai Shao , Jia Zheng
IPC分类号： H01L21/00 , H01L21/3205 , H01L21/336 , H01L21/4763 , H01L21/768 , H01L21/84 , H01L29/76 , H01L29/94 , H01L31/062 , H01L31/113 , H01L31/119
CPC分类号： H01L21/76802 , H01L21/76829
摘要： A CMOS RF device and a method to fabricate said device with low gate contact resistance are described. Conventional MOS transistor is first formed with isolation regions, poly-silicon gate structure, sidewall spacers around poly gate, and implanted source/drain with lightly and heavily doped regions. A silicon dioxide layer such as TEOS is deposited, planarized with chemical mechanical polishing (CMP) to expose the gate and treated with dilute HF etchant to recess the silicon dioxide layer below the surface of the gate. Silicon nitride is then deposited and planarized with CMP and then etched except around the gates, using a oversize poly-silicon gate mask. Inter-level dielectric mask is then deposited, contact holes etched, and contact metal is deposited to form the transistor. During contact hole etch over poly-silicon gate, silicon nitride around the poly gate acts as an etch stop. Resulting structure with direct gate contact achieves significantly reduced gate resistance and thereby improved noise performance at high frequency operation, increased unit power gain frequency (f.,), and reduced gate delay.
摘要翻译：描述CMOS RF器件和制造具有低栅极接触电阻的所述器件的方法。传统的MOS晶体管首先形成有隔离区域，多晶硅栅极结构，围绕多晶硅栅极的侧壁隔离物以及具有轻掺杂和重掺杂区域的注入源极/漏极。沉积诸如TEOS的二氧化硅层，通过化学机械抛光（CMP）平坦化以暴露栅极，并用稀的HF蚀刻剂处理以使位于栅极表面下方的二氧化硅层凹陷。然后将氮化硅沉积并用CMP平坦化，然后使用超大型多晶硅栅极掩模在栅极周围进行蚀刻。然后沉积层间电介质掩模，蚀刻接触孔，并沉积接触金属以形成晶体管。在多晶硅栅极的接触孔蚀刻期间，多晶硅周围的氮化硅作为蚀刻停止。具有直接栅极接触的所得结构实现了显着降低的栅极电阻，从而改善了高频操作时的噪声性能，增加的单位功率增益频率（f。）和减小的栅极延迟。

2. 发明申请

US20050136573A1 Method of making direct contact on gate by using dielectric stop layer 有权
标题翻译：通过使用介电阻挡层在栅极上直接接触的方法
公开(公告)号：US20050136573A1
公开(公告)日：2005-06-23
申请号：US11045958
申请日：2005-01-28
申请人： Purakh Rajverma , Sanford Chu , Lap Chan , Yelehanka Ramachandramurthy Pradeep , Kai Shao , Jia Zheng
发明人： Purakh Rajverma , Sanford Chu , Lap Chan , Yelehanka Ramachandramurthy Pradeep , Kai Shao , Jia Zheng
IPC分类号： H01L21/00 , H01L21/3205 , H01L21/336 , H01L21/4763 , H01L21/768 , H01L21/84 , H01L29/76 , H01L29/94 , H01L31/062 , H01L31/113 , H01L31/119
CPC分类号： H01L21/76802 , H01L21/76829
摘要： A CMOS RF device and a method to fabricate said device with low gate contact resistance are described. Conventional MOS transistor is first formed with isolation regions, poly-silicon gate structure, sidewall spacers around poly gate, and implanted source/drain with lightly and heavily doped regions. A silicon dioxide layer such as TEOS is deposited, planarized with chemical mechanical polishing (CMP) to expose the gate and treated with dilute HF etchant to recess the silicon dioxide layer below the surface of the gate. Silicon nitride is then deposited and planarized with CMP and then etched except around the gates, using a oversize poly-silicon gate mask. Inter-level dielectric mask is then deposited, contact holes etched, and contact metal is deposited to form the transistor. During contact hole etch over poly-silicon gate, silicon nitride around the poly gate acts as an etch stop. Resulting structure with direct gate contact achieves significantly reduced gate resistance and thereby improved noise performance at high frequency operation, increased unit power gain frequency (fmax), and reduced gate delay.
摘要翻译：描述CMOS RF器件和制造具有低栅极接触电阻的所述器件的方法。传统的MOS晶体管首先形成有隔离区域，多晶硅栅极结构，围绕多晶硅栅极的侧壁隔离物以及具有轻掺杂和重掺杂区域的注入源极/漏极。沉积诸如TEOS的二氧化硅层，通过化学机械抛光（CMP）平坦化以暴露栅极，并用稀的HF蚀刻剂处理以使位于栅极表面下方的二氧化硅层凹陷。然后将氮化硅沉积并用CMP平坦化，然后使用超大型多晶硅栅极掩模在栅极周围进行蚀刻。然后沉积层间电介质掩模，蚀刻接触孔，并沉积接触金属以形成晶体管。在多晶硅栅极的接触孔蚀刻期间，多晶硅周围的氮化硅作为蚀刻停止。具有直接栅极接触的所得结构实现了显着降低的栅极电阻，从而改善了高频操作下的噪声性能，增加的单位功率增益频率（f max）和减小的栅极延迟。

3. 发明授权

US06852605B2 Method of forming an inductor with continuous metal deposition 有权
公开(公告)号：US06852605B2
公开(公告)日：2005-02-08
申请号：US10427287
申请日：2003-05-01
申请人： Chit Hwei Ng , Lap Chan , Purakh Verma , Yelehanka Ramachandramurthy Pradeep , Sanford Chu
发明人： Chit Hwei Ng , Lap Chan , Purakh Verma , Yelehanka Ramachandramurthy Pradeep , Sanford Chu
IPC分类号： H01F17/00 , H01L21/02 , H01L23/522 , H01L21/20
CPC分类号： H01L28/10 , H01F17/0006 , H01L23/5227 , H01L2924/0002 , H01L2924/00
摘要： A method is described to fabricate RF inductor devices on a silicon substrate. Low-k or other dielectric material is deposited and patterned to form inductor lower plate trenches. Trenches are lined with barrier film such as TaN, filled with copper, and excess metal planarized using chemical mechanical polishing (CMP). Second layer of a dielectric material is deposited and patterned to form via-hole/trenches. Via-hole/trench patterns are filled with barrier material, and the dielectric film in between the via-hole/trenches is etched to form a second set of trenches. These trenches are filled with copper and planarized. A third layer of a dielectric film is deposited and patterned to form via-hole/trenches. Via-hole/trenches are then filled with barrier material, and the dielectric film between via-hole/trench patterns etched to form a third set of trenches. These trenches are filled with copper metal and excess metal removed by CMP to form said RF inductor.

4. 发明申请

US20050124131A1 Method of forming an inductor with continuous metal deposition 审中-公开
标题翻译：形成具有连续金属沉积的电感器的方法
公开(公告)号：US20050124131A1
公开(公告)日：2005-06-09
申请号：US11034932
申请日：2005-01-13
申请人： Chit Hweing , Lap Chan , Purakh Verma , Yelehanka Ramachandramurthy Pradeep , Sanford Chu
发明人： Chit Hweing , Lap Chan , Purakh Verma , Yelehanka Ramachandramurthy Pradeep , Sanford Chu
IPC分类号： H01F17/00 , H01L21/02 , H01L23/522 , H01L21/20 , H01L29/00
CPC分类号： H01L28/10 , H01F17/0006 , H01L23/5227 , H01L2924/0002 , H01L2924/00
摘要： A method is described to fabricate RF inductor devices on a silicon substrate. Low-k or other dielectric material is deposited and patterned to form inductor lower plate trenches. Trenches are lined with barrier film such as TaN, filled with copper, and excess metal planarized using chemical mechanical polishing (CMP). Second layer of a dielectric material is deposited and patterned to form via-hole/trenches. Via-hole/trench patterns are filled with barrier material, and the dielectric film in between the via-hole/trenches is etched to form a second set of trenches. These trenches are filled with copper and planarized. A third layer of a dielectric film is deposited and patterned to form via-hole/trenches. Via-hole/trenches are then filled with barrier material, and the dielectric film between via-hole/trench patterns etched to form a third set of trenches. These trenches are filled with copper metal and excess metal removed by CMP to form said RF inductor.
摘要翻译：描述了在硅衬底上制造RF电感器件的方法。沉积低k或其他电介质材料并图案化以形成电感器下板沟槽。沟槽衬有阻挡膜，如填充有铜的TaN和使用化学机械抛光（CMP）平坦化的多余金属。介电材料的第二层被沉积并图案化以形成通孔/沟槽。通孔/沟槽图案填充有阻挡材料，蚀刻通孔/沟槽之间的电介质膜以形成第二组沟槽。这些沟槽用铜填充并平坦化。电介质膜的第三层被沉积并图案化以形成通孔/沟槽。然后用阻挡材料填充通孔/沟槽，蚀刻通孔/沟槽图案之间的电介质膜以形成第三组沟槽。这些沟槽填充有铜金属，并通过CMP去除多余的金属以形成所述RF电感器。

5. 发明申请

US20050009357A1 Process to reduce substrate effects by forming channels under inductor devices and around analog blocks 有权
标题翻译：通过在电感器件和模拟块周围形成沟道来减少衬底效应的过程
公开(公告)号：US20050009357A1
公开(公告)日：2005-01-13
申请号：US10909523
申请日：2004-08-02
申请人： Lap Chan , Sanford Chu , Chit Ng , Purakh Verma , Jia Zheng , Johnny Chew , Choon Sia
发明人： Lap Chan , Sanford Chu , Chit Ng , Purakh Verma , Jia Zheng , Johnny Chew , Choon Sia
IPC分类号： H01L21/20 , H01L21/265 , H01L21/302 , H01L21/461 , H01L21/764
CPC分类号： H01L21/764 , H01L21/26506
摘要： A first method of reducing semiconductor device substrate effects comprising the following steps. O+or O2+are selectively implanted into a silicon substrate to form a silicon-damaged silicon oxide region. One or more devices are formed over the silicon substrate proximate the silicon-damaged silicon oxide region within at least one upper dielectric layer. A passivation layer is formed over the at least one upper dielectric layer. The passivation layer and the at least one upper dielectric layer are patterned to form a trench exposing a portion of the silicon substrate over the silicon-damaged silicon oxide region. The silicon-damaged silicon oxide region is selectively etched to form a channel continuous and contiguous with the trench whereby the channel reduces the substrate effects of the one or more semiconductor devices. A second method of reducing substrate effects under analog devices includes forming an analog device on a SOI substrate and then selectively etching the silicon oxide layer of the SOI substrate to form a channel at least partially underlying the analog device.
摘要翻译：降低半导体器件衬底效应的第一种方法包括以下步骤。 O +或O 2 +被选择性地注入到硅衬底中以形成硅损坏的氧化硅区域。在硅衬底附近，在至少一个上部电介质层内的硅损坏的氧化硅区域附近形成一个或多个器件。在所述至少一个上介电层上形成钝化层。图案化钝化层和至少一个上电介质层以形成在硅损坏的氧化硅区域上暴露硅衬底的一部分的沟槽。选择性地蚀刻硅损坏的氧化硅区域以形成与沟槽连续且邻接的沟道，由此沟道减小了一个或多个半导体器件的衬底效应。减少模拟器件下的衬底效应的第二种方法包括在SOI衬底上形成模拟器件，然后选择性地蚀刻SOI衬底的氧化硅层，以形成至少部分在模拟器件下面的沟道。

6. 发明授权

US06716693B1 Method of forming a surface coating layer within an opening within a body by atomic layer deposition 有权
标题翻译：通过原子层沉积在体内的开口内形成表面涂层的方法
公开(公告)号：US06716693B1
公开(公告)日：2004-04-06
申请号：US10400511
申请日：2003-03-27
申请人： Lap Chan , Sanford Chu , Chit Hwei Ng , Yelehanka Ramachandramurthy Pradeep , Jia Zhen Zheng
发明人： Lap Chan , Sanford Chu , Chit Hwei Ng , Yelehanka Ramachandramurthy Pradeep , Jia Zhen Zheng
IPC分类号： H01L218234
CPC分类号： H01L28/10 , H01F17/0033 , H01F41/042 , H01L21/76838 , H01L23/522 , H01L23/5227 , H01L23/53238 , H01L27/08 , H01L2924/0002 , H01L2924/00
摘要： An improved new process for fabricating multilevel interconnected vertical channels and horizontal channels or tunnels. The method has broad applications in semiconductors, for copper interconnects and inductors, as well as, in the field of bio-sensors for mini- or micro-columns in gas or liquid separation, gas/liquid chromatography, and in capillary separation techniques. In addition, special techniques are described to deposit by atomic layer deposition, ALD, a copper barrier layer and seed layer for electroless copper plating, filling trench and channel or tunnel openings in a type of damascene process, to form copper interconnects and inductors.
摘要翻译：一种用于制造多层互连垂直通道和水平通道或隧道的改进的新工艺。该方法在半导体，铜互连和电感器以及在气体或液体分离中的微型或微型柱的生物传感器领域，气/液相色谱和毛细管分离技术领域具有广泛的应用。此外，描述了通过原子层沉积，ALD，铜阻挡层和用于化学镀铜的种子层，一种镶嵌工艺中的填充沟槽和沟道或隧道开口来沉积特殊技术以形成铜互连和电感器。

7. 发明申请

US20050196931A1 Self-aligned lateral heterojunction bipolar transistor 有权
标题翻译：自对准横向异质结双极晶体管
公开(公告)号：US20050196931A1
公开(公告)日：2005-09-08
申请号：US11123748
申请日：2005-05-04
申请人： Jian Li , Lap Chan , Purakh Verma , Jia Zheng , Shao-fu Chu
发明人： Jian Li , Lap Chan , Purakh Verma , Jia Zheng , Shao-fu Chu
IPC分类号： H01L21/331 , H01L29/737
CPC分类号： H01L29/66242 , H01L29/737
摘要： A lateral heterojunction bipolar transistor (HBT), comprising a semiconductor substrate having having a first insulating layer over the semiconductor substrate. A base trench is formed in a first silicon layer over the first insulating layer to form a collector layer over an exposed portion of the semiconductor substrate and an emitter layer over the first insulating layer. A semiconductive layer is formed on the sidewalls of the base trench to form a collector structure in contact with the collector layer and an emitter structure in contact with the emitter layer. A base structure is formed in the base trench. A plurality of connections is formed through an interlevel dielectric layer to the collector layer, the emitter layer, and the base structure. The base structure preferably is a compound semiconductive material of silicon and at least one of silicon-germanium, silicon-germanium-carbon, and combinations thereof.
摘要翻译：一种横向异质结双极晶体管（HBT），包括在半导体衬底上具有第一绝缘层的半导体衬底。基底沟槽形成在第一绝缘层上的第一硅层中，以在半导体衬底的暴露部分和第一绝缘层上的发射极层之上形成集电极层。半导体层形成在基底沟槽的侧壁上，以形成与集电极层接触的集电极结构和与发射极层接触的发射极结构。基底结构形成在基底沟槽中。通过层间电介质层到集电极层，发射极层和基底结构形成多个连接。基底结构优选是硅的化合物半导体材料和硅 - 锗，硅 - 锗 - 碳及其组合中的至少一种。

8. 发明申请

US20050145953A1 Heterojunction BiCMOS integrated circuits and method therefor 审中-公开
标题翻译：异质结BiCMOS集成电路及其方法
公开(公告)号：US20050145953A1
公开(公告)日：2005-07-07
申请号：US10752454
申请日：2004-01-05
申请人： Lap Chan , Jia Zheng , Purakh Verma , Jian Li , Shao-fu Chu
发明人： Lap Chan , Jia Zheng , Purakh Verma , Jian Li , Shao-fu Chu
IPC分类号： H01L21/331 , H01L21/8249 , H01L27/06 , H01L31/113
CPC分类号： H01L29/66242 , H01L21/8249 , H01L27/0623
摘要： A method of manufacturing a BiCMOS integrated circuit including a CMOS transistor having a gate structure, and a heterojunction bipolar transistor having an extrinsic base structure. A substrate is provided, and a polysilicon layer is formed over the substrate. The gate structure and the extrinsic base structure are formed in the polysilicon layer. A plurality of contacts is formed through the interlevel dielectric layer to the CMOS transistor and the heterojunction bipolar transistor.
摘要翻译：一种制造包括具有栅极结构的CMOS晶体管的BiCMOS集成电路的方法和具有外在基极结构的异质结双极晶体管。提供衬底，并且在衬底上形成多晶硅层。栅极结构和非本征基极结构形成在多晶硅层中。多个触点通过层间介质层形成到CMOS晶体管和异质结双极晶体管。

9. 发明申请

US20050101096A1 SELF-ALIGNED LATERAL HETEROJUNCTION BIPOLAR TRANSISTOR 有权
标题翻译：自对准侧向异相双极晶体管
公开(公告)号：US20050101096A1
公开(公告)日：2005-05-12
申请号：US10703284
申请日：2003-11-06
申请人： Jian Li , Lap Chan , Purakh Verma , Jia Zheng , Shao-Fu Chu
发明人： Jian Li , Lap Chan , Purakh Verma , Jia Zheng , Shao-Fu Chu
IPC分类号： H01L21/331 , H01L29/737 , H01L21/8222
CPC分类号： H01L29/66242 , H01L29/737
摘要： A method for manufacturing a lateral heterojunction bipolar transistor (HBT) is provided comprising a semiconductor substrate having a first insulating layer over the semiconductor substrate. A base trench is formed in a first silicon layer over the first insulating layer to form a collector layer over an exposed portion of the semiconductor substrate and an emitter layer over the first insulating layer. A semiconductive layer is formed on the sidewalls of the base trench to form a collector structure in contact with the collector layer and an emitter structure in contact with the emitter layer. A base structure is formed in the base trench. A plurality of connections is formed through an interlevel dielectric layer to the collector layer, the emitter layer, and the base structure. The base structure preferably is a compound semiconductive material of silicon and at least one of silicon-germanium, silicon-germanium-carbon, and combinations thereof.
摘要翻译：提供一种用于制造横向异质结双极晶体管（HBT）的方法，包括半导体衬底上的第一绝缘层的半导体衬底。基底沟槽形成在第一绝缘层上的第一硅层中，以在半导体衬底的暴露部分和第一绝缘层上的发射极层之上形成集电极层。半导体层形成在基底沟槽的侧壁上，以形成与集电极层接触的集电极结构和与发射极层接触的发射极结构。基底结构形成在基底沟槽中。通过层间电介质层到集电极层，发射极层和基底结构形成多个连接。基底结构优选是硅的化合物半导体材料和硅 - 锗，硅 - 锗 - 碳及其组合中的至少一种。

10. 发明授权

US07250669B2 Process to reduce substrate effects by forming channels under inductor devices and around analog blocks 有权
标题翻译：通过在电感器件和模拟块周围形成沟道来减少衬底效应的过程
公开(公告)号：US07250669B2
公开(公告)日：2007-07-31
申请号：US10909523
申请日：2004-08-02
申请人： Lap Chan , Sanford Chu , Chit Hwei Ng , Purakh Verma , Jia Zhen Zheng , Johnny Chew , Choon Beng Sia
发明人： Lap Chan , Sanford Chu , Chit Hwei Ng , Purakh Verma , Jia Zhen Zheng , Johnny Chew , Choon Beng Sia
IPC分类号： H01L29/00
CPC分类号： H01L21/764 , H01L21/26506
摘要： A first method of reducing semiconductor device substrate effects comprising the following steps. O+or O2+are selectively implanted into a silicon substrate to form a silicon-damaged silicon oxide region. One or more devices are formed over the silicon substrate proximate the silicon-damaged silicon oxide region within at least one upper dielectric layer. A passivation layer is formed over the at least one upper dielectric layer. The passivation layer and the at least one upper dielectric layer are patterned to form a trench exposing a portion of the silicon substrate over the silicon-damaged silicon oxide region. The silicon-damaged silicon oxide region is selectively etched to form a channel continuous and contiguous with the trench whereby the channel reduces the substrate effects of the one or more semiconductor devices. A second method of reducing substrate effects under analog devices includes forming an analog device on a SOI substrate and then selectively etching the silicon oxide layer of the SOI substrate to form a channel at least partially underlying the analog device.
摘要翻译：降低半导体器件衬底效应的第一种方法包括以下步骤。选择性地注入到硅衬底中以形成硅损坏的氧化硅区域。在硅衬底附近，在至少一个上部电介质层内的硅损坏的氧化硅区域附近形成一个或多个器件。在所述至少一个上介电层上形成钝化层。图案化钝化层和至少一个上电介质层以形成在硅损坏的氧化硅区域上暴露硅衬底的一部分的沟槽。选择性地蚀刻硅损坏的氧化硅区域以形成与沟槽连续且邻接的沟道，由此沟道减小了一个或多个半导体器件的衬底效应。减少模拟器件下的衬底效应的第二种方法包括在SOI衬底上形成模拟器件，然后选择性地蚀刻SOI衬底的氧化硅层，以形成至少部分在模拟器件下面的沟道。

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