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    • 3. 发明申请
    • Self-aligned vertical PNP transistor for high performance SiGe CBiCMOS process
    • 用于高性能SiGe CBiCMOS工艺的自对准垂直PNP晶体管
    • US20070134854A1
    • 2007-06-14
    • US11302479
    • 2005-12-13
    • Shaoqiang ZhangPurakh VermaSanford Chu
    • Shaoqiang ZhangPurakh VermaSanford Chu
    • H01L21/8232H01L21/335
    • H01L21/82285H01L21/8249H01L27/0623H01L27/0826H01L29/7378
    • A structure and a process for a self-aligned vertical PNP transistor for high performance SiGe CBiCMOS process. Embodiments include SiGe CBiCMOS with high-performance SiGe NPN transistors and PNP transistors. As the PNP transistors and NPN transistors contained different types of impurity profile, they need separate lithography and doping step for each transistor. The process is easy to integrate with existing CMOS process to save manufacturing time and cost. As plug-in module, fully integration with SiGe BiCMOS processes. High doping Polysilicon Emitter can increase hole injection efficiency from emitter to base, reduce emitter resistor, and form very shallow EB junction. Self-aligned N+ base implant can reduce base resistor and parasitical EB capacitor. Very low collector resistor benefits from BP layer. PNP transistor can be Isolated from other CMOS and NPN devices by BNwell, Nwell and BN+ junction.
    • 用于高性能SiGe CBiCMOS工艺的自对准垂直PNP晶体管的结构和工艺。 实施例包括具有高性能SiGe NPN晶体管和PNP晶体管的SiGe CBiCMOS。 由于PNP晶体管和NPN晶体管包含不同类型的杂质分布,因此每个晶体管需要单独的光刻和掺杂步骤。 该过程易于与现有的CMOS工艺集成,以节省制造时间和成本。 作为插件模块,与SiGe BiCMOS工艺完全集成。 高掺杂多晶硅发射器可以增加从发射极到基极的空穴注入效率,减少发射极电阻,并形成非常浅的EB结。 自对准N +基极植入可以减少基极电阻和寄生EB电容。 极低的集电极电阻受益于BP层。 PNP晶体管可以通过BNwell,Nwell和BN +结与其他CMOS和NPN器件隔离。
    • 9. 发明申请
    • Self-aligned lateral heterojunction bipolar transistor
    • 自对准横向异质结双极晶体管
    • US20050196931A1
    • 2005-09-08
    • US11123748
    • 2005-05-04
    • Jian LiLap ChanPurakh VermaJia ZhengShao-fu Chu
    • Jian LiLap ChanPurakh VermaJia ZhengShao-fu Chu
    • H01L21/331H01L29/737
    • H01L29/66242H01L29/737
    • A lateral heterojunction bipolar transistor (HBT), comprising a semiconductor substrate having having a first insulating layer over the semiconductor substrate. A base trench is formed in a first silicon layer over the first insulating layer to form a collector layer over an exposed portion of the semiconductor substrate and an emitter layer over the first insulating layer. A semiconductive layer is formed on the sidewalls of the base trench to form a collector structure in contact with the collector layer and an emitter structure in contact with the emitter layer. A base structure is formed in the base trench. A plurality of connections is formed through an interlevel dielectric layer to the collector layer, the emitter layer, and the base structure. The base structure preferably is a compound semiconductive material of silicon and at least one of silicon-germanium, silicon-germanium-carbon, and combinations thereof.
    • 一种横向异质结双极晶体管(HBT),包括在半导体衬底上具有第一绝缘层的半导体衬底。 基底沟槽形成在第一绝缘层上的第一硅层中,以在半导体衬底的暴露部分和第一绝缘层上的发射极层之上形成集电极层。 半导体层形成在基底沟槽的侧壁上,以形成与集电极层接触的集电极结构和与发射极层接触的发射极结构。 基底结构形成在基底沟槽中。 通过层间电介质层到集电极层,发射极层和基底结构形成多个连接。 基底结构优选是硅的化合物半导体材料和硅 - 锗,硅 - 锗 - 碳及其组合中的至少一种。