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    • 6. 发明申请
    • Method for making an optical system with coated optical components and optical system made by the method
    • 用该方法制造具有涂层光学部件和光学系统的光学系统的方法
    • US20060132917A1
    • 2006-06-22
    • US11274152
    • 2005-11-16
    • Christoph ZaczekThomas MueldersToralf Gruner
    • Christoph ZaczekThomas MueldersToralf Gruner
    • G02B27/28
    • G03F7/70958G02B27/0012G02B27/283G03F7/705
    • In a method for making an optical system for imaging a radiation distribution from an input surface of the optical system into an output surface of the optical system, the optical system has a multiplicity of optical components which determine an imaging quality of the optical system, which are arranged along an optical axis of the optical system and comprise at least one optical component which has a substrate with a substrate surface which is provided for carrying an interference layer system having a layer construction that determines the optical properties of the optical component covered with the interference layer system. The method includes: predefining an optimization target for at least one imaging quality parameter that represents the imaging quality of the system; determining the imaging quality of the optical system while taking account of the layer construction of the interference layer system; and varying the layer construction for approximating the imaging quality parameter to the optimization target. In accordance with the method, the determination of the optimum layer construction is coupled directly with an assessment and of the imaging quality of the total system including the interference layer system to be optimized.
    • 在制造用于将从光学系统的输入表面的辐射分布成像到光学系统的输出表面的光学系统的方法中,光学系统具有多个光学部件,其确定光学系统的成像质量, 沿着光学系统的光轴布置并且包括至少一个光学部件,该光学部件具有衬底,该衬底具有衬底表面,衬底表面被提供用于承载具有层结构的干涉层系统,所述层结构决定了被覆盖的光学部件的光学特性 干涉层系统。 该方法包括:为表示系统的成像质量的至少一个成像质量参数预定义优化目标; 在考虑到干涉层系统的层结构的同时确定光学系统的成像质量; 并且改变用于将成像质量参数近似到优化目标的层结构。 根据该方法,最佳层结构的确定直接与包括要优化的干涉层系统的总体系统的评估和成像质量相耦合。
    • 10. 发明申请
    • Projection objective for microlithography
    • 微光刻的投影目标
    • US20050264884A1
    • 2005-12-01
    • US11059364
    • 2005-02-17
    • Christoph ZaczekDavid ShaferWilhelm Ulrich
    • Christoph ZaczekDavid ShaferWilhelm Ulrich
    • G02B5/30G02B17/08G02B27/28G03F7/20
    • G02B17/0892G02B17/045G02B27/283G03F7/70225
    • A projection objective (5) for microlithography for projecting a pattern arranged in an object plane (8) of the projection objective (5) has in the light path between the object plane (8) and the image plane (11) at least one beam deflecting device (19) with at least one totally reflective surface (17) that is inclined to an incidence direction of the radiation incident on the totally reflective surface (17) in such a way that substantially all the radiation coming from the object plane (8) and striking the totally reflective surface (17) is totally reflected at the totally reflective surface (17). A high reflectivity in conjunction with high angle of incidence with respect to the surface normal to the totally reflective surface (17) can be achieved with the aid of the beam deflecting device (19). In the case of catadioptric projection objectives, in particular, it is possible thereby to fashion designs that without the use of total reflection for beam deflection can be implemented only with a substantially greater outlay on construction.
    • 用于突出布置在投影物镜(5)的物平面(8)中的图案的用于微光刻的投影物镜(5)在物平面(8)和像平面(11)之间的光路中具有至少一个光束 偏转装置(19)具有与入射在全反射表面(17)上的辐射的入射方向倾斜的至少一个全反射表面(17),使得基本上所有来自物平面(8)的辐射 )和撞击全反射表面(17)在全反射表面(17)处被全反射。 借助于光束偏转装置(19),可以实现高反射率和高入射角相对于垂直于全反射表面(17)的表面。 在反射折射投影物镜的情况下,特别地,可以设计出不需要使用用于光束偏转的全反射的设计,只能在施工上实现更大的花费。