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    • 2. 发明授权
    • Ferroelectric memory and method of operating same
    • 铁电存储器和操作方法相同
    • US06924997B2
    • 2005-08-02
    • US10381235
    • 2001-09-25
    • Zheng ChenVikram JoshiMyoungho LimCarlos A. Paz de AraujoLarry D. McMillanYoshihisa KatoTatsuo OtsukiYasuhiro Shimada
    • Zheng ChenVikram JoshiMyoungho LimCarlos A. Paz de AraujoLarry D. McMillanYoshihisa KatoTatsuo OtsukiYasuhiro Shimada
    • G11C11/22
    • G11C11/22
    • A ferroelectric memory 636 includes a group of memory cells (645, 12, 201, 301, 401, 501), each cell having a ferroelectric memory element (44, 218, etc.), a drive line (122, 322, 422, 522 etc.) on which a voltage for writing information to the group of memory cells is placed, a bit line (25, 49, 125, 325, 425, 525, etc.) on which information to be read out of the group of memory cells is placed, a preamplifier (20, 42, 120, 320, 420, etc.) between the memory cells and the bit line, a set switch (14, 114, 314, 414, 514, etc.) connected between the drive line and the memory cells, and a reset switch (16, 116, 316, 416, 516, etc.) connected to the memory cells in parallel with the preamplifier. The memory is read by placing a voltage less than the coercive voltage of the ferroelectric memory element across a memory element. Prior to reading, noise from the group of cells is discharged by grounding both electrodes of the ferroelectric memory element.
    • 铁电存储器636包括一组存储单元(645,12,21,301,401,501),每个单元具有铁电存储元件(44,218等),驱动线(122,322,422, 522等),在其上放置用于将信息写入到存储器单元组的电压,位线(25,49,125,325,425,525等),其中要从该组存储器单元读出的信息 放置存储器单元,在存储器单元和位线之间的前置放大器(20,42,120,320,420等),连接在存储器单元之间的设定开关(14,114,314,414,514等) 驱动线和存储器单元,以及与前置放大器并联连接到存储器单元的复位开关(16,116,316,416,516等)。 通过将小于铁电存储元件的矫顽电压的电压放置在存储元件上来读取存储器。 在读取之前,通过使铁电存储元件的两个电极接地来放电来自该组电池的噪声。
    • 5. 发明授权
    • Method and apparatus for fabrication of thin films by chemical vapor deposition
    • 通过化学气相沉积制造薄膜的方法和装置
    • US06511718B1
    • 2003-01-28
    • US09446226
    • 1999-12-17
    • Carlos A. Paz de AraujoLarry D. McMillanNarayan SolayappanJeffrey W. Bacon
    • Carlos A. Paz de AraujoLarry D. McMillanNarayan SolayappanJeffrey W. Bacon
    • H05H124
    • C23C16/45565B05D1/007B05D1/04C23C16/40C23C16/448C23C16/45561C23C18/12H01L21/31691H01L28/55
    • A venturi mist generator creates a mist comprising droplets having a mean diameter less than one micron from liquid precursors containing multi-metal polyalkoxide compounds. The mist is mixed and then passed into a gasifier where the mist droplets are gasified at a temperature of between 100° C. and 250° C., which is lower than the temperature at which the precursor compounds decompose. The gasified precursor compounds are transported by carrier gas through insulated tubing at ambient temperature to prevent both condensation and premature decomposition. The gasified precursors are mixed with oxidant gas, and the gaseous reactant mixture is injected through a showerhead inlet into a deposition reactor in which a substrate is heated at a temperature of from 300° C. to 600 ° C. The gasified precursors decompose at the substrate and form a thin film of solid material on the substrate. The thin film is treated at elevated temperatures of from 500° C. to 900° C. to form polycrystalline metal oxide material, in particular, ferroelectric layered superlattice material.
    • 文丘里雾发生器产生包含具有小于1微米的平均直径的液滴的雾,所述液体前体含有多金属聚烷氧化物。 将雾混合,然后进入气化器,在气化器中雾滴在100℃和250℃之间的温度下气化,该温度低于前体化合物分解的温度。 气化的前体化​​合物通过载气在环境温度下通过绝缘管输送,以防止冷凝和过早分解。 将气化的前体与氧化剂气体混合,并将气态反应物混合物通过喷头入口注入沉积反应器中,在沉积反应器中将基底在300℃至600℃的温度下加热。气化的前体在 衬底并在衬底上形成固体材料的薄膜。 该薄膜在500℃至900℃的高温下进行处理以形成多晶金属氧化物材料,特别是铁电层状超晶格材料。
    • 8. 发明授权
    • Ferroelectric memory and method of operating same
    • 铁电存储器和操作方法相同
    • US06370056B1
    • 2002-04-09
    • US09523492
    • 2000-03-10
    • Zheng ChenVikram JoshiMyoungho LimCarlos A. Paz de AraujoLarry D. McMillan
    • Zheng ChenVikram JoshiMyoungho LimCarlos A. Paz de AraujoLarry D. McMillan
    • G11C1122
    • G11C11/22
    • A ferroelectric non-volatile memory comprising: a plurality of memory cells, each containing an FeFET and a MOSFET, each of said FeFETs having a source, a drain, a substrate, and a gate, and each MOSFET having a pair of source/drains and a gate. The cells are arranged in an array comprising a plurality of rows and a plurality of columns. A gate line and a bit line are associated with each column, and a word line, a drain line, and a substrate line are associated with each row. One source/drain of each MOSFET is connected to its corresponding gate line; the other source/drain is connected to the gate of the FeFET in the cell. The gate of the MOSFET is connected to its corresponding word line which provides a write and erase enable signal. The drain of the FeFET is connected to its corresponding drain line, and the source of the FeFET is connected to its corresponding bit line. The substrate of each FeFET is connected to its corresponding substrate line. A read MOSFET is connected between a drain input and the drain line associated with each row. The gate of the read MOSFET is connected to an input for the read enable signal.
    • 一种铁电非易失性存储器,包括:多个存储单元,每个存储单元包含FeFET和MOSFET,每个所述FeFET具有源极,漏极,衬底和栅极,并且每个MOSFET具有一对源极/漏极 和一个门。 单元被布置成包括多行和多列的阵列。 栅极线和位线与每列相关联,并且字线,漏极线和衬底线与每一行相关联。 每个MOSFET的一个源极/漏极连接到其对应的栅极线; 另一个源极/漏极连接到电池中的FeFET的栅极。 MOSFET的栅极连接到提供写和擦除使能信号的相应字线。 FeFET的漏极连接到其对应的漏极线,并且FeFET的源极连接到其对应的位线。 每个FeFET的衬底连接到其相应的衬底线。 读取MOSFET连接在与每行相关联的漏极输入和漏极线之间。 读取MOSFET的栅极连接到读使能信号的输入端。