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    • 1. 发明授权
    • Sputtering apparatus
    • 溅射装置
    • US08377269B2
    • 2013-02-19
    • US12991961
    • 2009-06-04
    • Naoki MorimotoTomoyasu KondoHideto NagashimaDaisuke MoriAkifumi Sano
    • Naoki MorimotoTomoyasu KondoHideto NagashimaDaisuke MoriAkifumi Sano
    • C23C14/35
    • C23C14/35C23C14/3457C23C14/358H01J37/32633H01J37/3266H01J37/3408H01J37/3458H01L21/2855
    • There is provided an inexpensive sputtering apparatus in which self-sputtering can be stably performed by accelerating the ionization of the atoms scattered from a target. The sputtering apparatus has: a target which is disposed inside a vacuum chamber so as to lie opposite to the substrate W to be processed; a magnet assembly which forms a magnetic field in front of the sputtering surface of the target; and a DC power supply which charges the target with a negative DC potential. A first coil is disposed in a central portion of a rear surface of the sputtering surface of the target. The first coil is electrically connected between the first power supply and the output to the target. When a negative potential is charged to the target by the sputtering power supply, the electric power is charged to the first coil, whereby a magnetic field is generated in front of the sputtering surface.
    • 提供了一种廉价的溅射装置,其中通过加速从靶分散的原子的电离可以稳定地进行自溅射。 溅射装置具有:设置在真空室内的靶,以与待加工的基板W相对; 在靶的溅射表面前面形成磁场的磁体组件; 以及对具有负DC电位的目标进行充电的DC电源。 第一线圈设置在靶的溅射表面的后表面的中心部分中。 第一线圈电连接到第一电源和与目标的输出之间。 当通过溅射电源将负电位充电到目标电极时,电力被充电到第一线圈,由此在溅射表面的前面产生磁场。
    • 3. 发明授权
    • Sputtering apparatus and film manufacturing method
    • 溅射装置和膜制造方法
    • US06706155B2
    • 2004-03-16
    • US09939715
    • 2001-08-28
    • Naoki MorimotoTomoyasu KondoHideto Nagashima
    • Naoki MorimotoTomoyasu KondoHideto Nagashima
    • C23C1434
    • H01J37/3438H01J37/3405
    • In order to form a thin film having a high aspect ratio, a space between a target within a vacuum chamber and a substrate table is enclosed by an anode electrode and earth electrodes. The anode electrode is positioned on the side of the target, and a positive voltage is applied. The earth electrodes are positioned on the side of the substrate table and are connected to earth potential. A trajectory of sputtering particles curved in the direction of flying off by the anode electrode is corrected and is made incident in a perpendicular manner to a surface of the substrate on the substrate table. The amount of sputtering particles incident to the surface of the substrate can therefore be increased and made perpendicularly incident; and a thin film of a high aspect ratio can be formed.
    • 为了形成高纵横比的薄膜,真空室内的靶与衬底台之间的空间被阳极电极和接地电极包围。 阳极位于靶的侧面,施加正电压。 接地电极位于衬底台的侧面并与地电位连接。 对由阳极电极飞出的方向进行弯曲的溅射粒子的轨迹进行校正,并使其垂直于衬底台上的衬底的表面入射。 因此,能够使入射到基板表面的溅射粒子的量增加并垂直入射; 并且可以形成高纵横比的薄膜。
    • 7. 发明授权
    • Method for forming tantalum nitride film
    • 形成氮化钽膜的方法
    • US08158198B2
    • 2012-04-17
    • US11885399
    • 2006-03-03
    • Narishi GonoheSatoru ToyodaHarunori UshikawaTomoyasu KondoKyuzo Nakamura
    • Narishi GonoheSatoru ToyodaHarunori UshikawaTomoyasu KondoKyuzo Nakamura
    • C23C16/00
    • H01L21/76843C23C16/34C23C16/45525C23C16/45534C23C16/45536C23C16/4554C23C16/45553H01L21/28562
    • A tantalum nitride film-forming method comprises the steps of introducing a raw gas consisting of a coordination compound constituted by an elemental tantalum (Ta) having a coordinated ligand represented by the general formula: N═(R,R′) (in the formula, R and R′ may be the same or different and each represents an alkyl group having 1 to 6 carbon atoms), and a halogen gas into a vacuum chamber; and reacting these components with one another on a substrate to thus form a surface adsorption film comprising a mono-atomic or multi (several)-atomic layer and composed of a compound represented by the following general formula: TaNx(Hal)y(R, R′)z (in the formula, Hal represents a halogen atom), then introducing radicals generated from an H atom-containing compound to thus remove Ta—N bonds present in the resulting compound through breakage thereof and remove, at the same time, the remaining R(R′) groups bonded to the N atoms present in the compound through the cleavage thereof and to thus form a tantalum nitride film rich in tantalum atoms. The resulting tantalum nitride film has a low resistance, low contents of C and N atoms, and a high compositional ratio: Ta/N, can ensure sufficiently high adherence to the distributing wire-forming film and can thus be useful as a barrier film. Moreover, tantalum particles are implanted in the resulting film according to the sputtering technique to thus further enrich the film with tantalum.
    • 氮化钽膜形成方法包括以下步骤:引入由具有由以下通式表示的配位配体的元素钽(Ta)构成的配位化合物构成的原料气体:N =(R,R')(式 R和R'可以相同或不同,各自表示碳原子数1〜6的烷基),卤素气体进入真空室; 并将这些组分彼此反应在基底上,从而形成包含单原子或多(多个)原子层的表面吸附膜,并由以下通式表示的化合物组成:TaNx(Hal)y(R, R')z(式中,Hal表示卤素原子),然后引入由含H原子的化合物产生的自由基,从而通过其残留除去所得化合物中存在的Ta-N键,同时除去 剩余的R(R')基团通过其切割而与化合物中存在的N原子键合,从而形成富含钽原子的氮化钽膜。 所得到的氮化钽膜具有低电阻,C原子和N原子含量低,组成比高:Ta / N可以确保足够高的附着线分布线形成膜,因此可用作阻挡膜。 此外,根据溅射技术将钽颗粒注入到所得的膜中,从而进一步用钽富集膜。
    • 8. 发明授权
    • Method for forming tantalum nitride film
    • 形成氮化钽膜的方法
    • US08796142B2
    • 2014-08-05
    • US11885345
    • 2006-03-03
    • Narishi GonoheSatoru ToyodaHarunori UshikawaTomoyasu KondoKyuzo Nakamura
    • Narishi GonoheSatoru ToyodaHarunori UshikawaTomoyasu KondoKyuzo Nakamura
    • H01L21/44
    • H01L21/76843C23C16/34H01L21/28556H01L21/76859H01L23/53238H01L2924/0002H01L2924/00
    • A tantalum nitride film rich in tantalum atoms is formed by simultaneously introducing a raw gas consisting of a coordination compound of elemental tantalum (Ta) having a coordinated ligand of formula: N═(R, R′) (wherein, R and R′ each represents an alkyl group having 1 to 6 carbon atoms) and NH3 gas into a film-forming chamber; reacting the raw gas with the NH3 gas; forming a reduced compound having Ta—NH3 on a substrate; and introducing a hydrogen atom-containing gas into the chamber to form a tantalum nitride film rich in tantalum atoms. The resulting tantalum nitride film has a low resistance, low contents of C and N atoms, and a high compositional ratio: Ta/N, show sufficiently high adherence to Cu film and can thus be useful as a barrier film. Moreover, tantalum particles are implanted in the resulting film according to the sputtering technique to further enrich the film with tantalum.
    • 通过同时引入由具有以下结构的配位配体的元素钽(Ta)的配位化合物组成的原料气体,形成富含钽原子的氮化钽膜:N =(R,R')(其中,R和R'各自 代表具有1至6个碳原子的烷基)和NH 3气体进入成膜室; 使原料气与NH 3气反应; 在基材上形成具有Ta-NH 3的还原化合物; 并将含氢原子的气体引入到室中以形成富含钽原子的氮化钽膜。 所得到的氮化钽膜具有低电阻,C和N原子含量低,组成比高:Ta / N对Cu膜具有足够高的粘附性,因此可用作阻挡膜。 此外,根据溅射技术将钽颗粒注入到所得膜中,以进一步用钽来富集膜。
    • 9. 发明申请
    • Method for Forming Tantalum Nitride Film
    • 形成钽氮化物膜的方法
    • US20090162565A1
    • 2009-06-25
    • US11885350
    • 2006-03-03
    • Narishi GonoheSatoru ToyodaHarunori UshikawaTomoyasu KondoKyuzo Nakamura
    • Narishi GonoheSatoru ToyodaHarunori UshikawaTomoyasu KondoKyuzo Nakamura
    • C23C14/14C23C16/34
    • C23C16/34C23C14/18C23C14/48H01L23/53238H01L2924/0002H01L2924/3011H01L2924/00
    • A tantalum nitride film is formed by introducing a raw gas consisting of a coordination compound constituted by an elemental tantalum (Ta) having a coordinated ligand represented by the general formula: N═(R, R′) (in the formula, R and R′ may be the same or different and each represents an alkyl group having 1 to 6 carbon atoms) and an oxygen atom-containing gas into a film-forming chamber to make them react with one another on a substrate and to thus form a compound represented by the formula: TaOxNy(R,R′)z according to the CVD technique; and then introducing an H atom-containing gas into the chamber to thus form a tantalum nitride film rich in tantalum atoms. The resulting tantalum nitride film has a low resistance, low contents of C and N atoms, and a high compositional ratio: Ta/N, can ensure sufficiently high adherence to the electrical connection-forming film and can thus be useful as a barrier film. Moreover, tantalum particles can be implanted in the resulting film according to the sputtering technique to thus further enrich the film with tantalum.
    • 通过引入由具有由以下通式表示的配位配体的元素钽(Ta)构成的配位化合物构成的原料气体形成氮化钽膜:N-(R,R')(在式中,R和R '可以相同或不同,并且各自表示具有1至6个碳原子的烷基)和含氧原子的气体进入成膜室,以使它们在基材上彼此反应,从而形成表示的化合物 根据CVD技术,通式为TaOxNy(R,R')z; 然后将含H原子的气体引入到室中,从而形成富含钽原子的氮化钽膜。 所得到的氮化钽膜具有低电阻,C原子和N原子含量低,组成比高的Ta / N可以确保对连接形成膜的粘附性足够高,因此可用作阻挡膜。 此外,可以根据溅射技术将钽颗粒注入到所得膜中,从而进一步用钽富集膜。
    • 10. 发明授权
    • Inductively coupled RF plasma source
    • 电感耦合射频等离子体源
    • US06469448B2
    • 2002-10-22
    • US09768236
    • 2001-01-25
    • Youji TaguchiTomoyasu Kondo
    • Youji TaguchiTomoyasu Kondo
    • H01J724
    • H01J37/321
    • The present invention provides an inductively coupled RF plasma source that can improve the nonuniformity in substrate treatment by canceling out the radial electric fields generated between a plasma and an antenna coil. The inductively coupled RF plasma source comprises a plurality of one-turn antenna coils, each having one end connected to a RF supply along a circumferential side wall of a plasma generating chamber and the other end connected to a grounding potential, arranged at intervals in the longitudinal axial direction of the plasma generating chamber. One end of each one-turn antenna coil displaced at equal angles from each other in a circumferential direction.
    • 本发明提供一种电感耦合RF等离子体源,其可以通过消除在等离子体和天线线圈之间产生的径向电场来改善衬底处理中的不均匀性。 电感耦合射频等离子体源包括多个单匝天线线圈,每个单匝天线线圈的一端沿着等离子体发生室的周向侧壁连接到RF电源,另一端连接到接地电位,间隔设置在 等离子体发生室的纵向轴向。 每个单匝天线线圈的一端在圆周方向上以相等的角度相移。