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    • 1. 发明申请
    • RESIST PROCESSING METHOD
    • 电阻加工方法
    • US20100279226A1
    • 2010-11-04
    • US12810793
    • 2008-12-22
    • Mitsuhiro HataYoshiyuki TakataSatoshi YamaguchiIchiki TakemotoTakayuki MiyagawaYusuke Fuji
    • Mitsuhiro HataYoshiyuki TakataSatoshi YamaguchiIchiki TakemotoTakayuki MiyagawaYusuke Fuji
    • G03F7/004G03F7/20
    • H01L21/0275G03F7/0035G03F7/0045G03F7/0046G03F7/0397G03F7/40
    • The present invention has the object of providing a method of manufacturing a resist pattern in which an extremely fine and highly accurate resist pattern can be formed which is obtained using the resist composition for forming a first resist pattern in a multi-patterning method such as a double patterning method. The resist processing method comprising; forming a first resist film by applying a first resist composition onto a substrate and drying, the first resist composition comprising a resin (A), a photo acid generator (B) and a cross-linking agent (C), the resin (A) having an acid-labile group, being insoluble or poorly soluble in alkali aqueous solution but of being rendered soluble in alkali aqueous solution through the action of an acid; prebaking; exposure processing; post-exposure baking; developing; hard-baking the first resist pattern; and obtaining a second resist film; pre-baking; exposure processing; post-exposure baking; developing to obtain a second resist pattern.
    • 本发明的目的是提供一种制造抗蚀剂图案的方法,其中可以形成极细和高精度的抗蚀剂图案,该抗蚀剂图案是使用多图案化方法中形成第一抗蚀剂图案的抗蚀剂组合物获得的, 双重图案化方法 抗蚀剂处理方法包括: 通过将第一抗蚀剂组合物施加到基材上并干燥来形成第一抗蚀剂膜,所述第一抗蚀剂组合物包含树脂(A),光酸产生剂(B)和交联剂(C),树脂(A) 具有酸不稳定基团,在碱性水溶液中不溶或难溶,但通过酸的作用使其溶于碱水溶液中; 预烘烤 曝光处理; 曝光后烘烤; 发展; 硬烘烤第一抗蚀剂图案; 得到第二抗蚀膜; 预烘烤; 曝光处理; 曝光后烘烤; 显影以获得第二抗蚀剂图案。
    • 6. 发明授权
    • Chemically amplified resist composition and chemically amplified resist composition for immersion lithography
    • 用于浸没光刻的化学放大抗蚀剂组合物和化学放大抗蚀剂组合物
    • US08062829B2
    • 2011-11-22
    • US12395963
    • 2009-03-02
    • Mitsuhiro HataYusuke FujiTakayuki Miyagawa
    • Mitsuhiro HataYusuke FujiTakayuki Miyagawa
    • G03F7/004G03F7/30
    • G03F7/0397G03F7/0045G03F7/2041Y10S430/106Y10S430/111Y10S430/122
    • A chemically amplified resist composition, comprising: a resin which includes a structural unit having an acid-labile group in a side chain, a structural unit represented by the formula (I) and a structural unit having a polycyclic lactone structure, and which is soluble in an organic solvent and insoluble or poorly soluble in an alkali aqueous solution but rendered soluble in an alkali aqueous solution by the action of an acid; and an acid generator represented by the formula (II). wherein X1 represents a hydrogen atom, a C1 to C4 alkyl group, etc., Y in each occurrence independently represent a hydrogen atom or an alkyl group, and n is an integer of 1 to 14, R1 to R4 independently represent a hydrogen atom, an alkyl group, etc., and A+ represents an organic counterion, E− represents CF3SO3—, C2F5SO3—, C4F9SO3—, etc., Y1 and Y2 independently represent a fluorine atom or a C1 to C6 perfluoroalkyl group.
    • 一种化学放大抗蚀剂组合物,其包含:树脂,其包含在侧链中具有酸不稳定基团的结构单元,由式(I)表示的结构单元和具有多环内酯结构的结构单元,并且其是可溶的 在有机溶剂中,不溶于或难溶于碱水溶液,但通过酸的作用可溶于碱水溶液; 和由式(II)表示的酸发生剂。 其中X 1表示氢原子,C 1〜C 4烷基等,Y各自独立地表示氢原子或烷基,n表示1〜14的整数,R 1〜R 4分别表示氢原子, 烷基等,A +表示有机抗衡离子,E表示CF 3 SO 3 - ,C 2 F 5 SO 3 - ,C 4 F 9 SO 3 - 等,Y 1和Y 2分别表示氟原子或C 1〜C 6全氟烷基。