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    • 3. 发明授权
    • Bipolar transistor and manufacting method thereof
    • 双极晶体管及其制造方法
    • US06482710B2
    • 2002-11-19
    • US09811559
    • 2001-03-20
    • Katsuya OdaEiji OhueMasao KondoKatsuyoshi WashioMasamichi TanabeHiromi Shimamoto
    • Katsuya OdaEiji OhueMasao KondoKatsuyoshi WashioMasamichi TanabeHiromi Shimamoto
    • H01L21331
    • H01L29/66287H01L29/66242H01L29/732H01L29/7378
    • A bipolar transistor according to the invention is provided with structure that an intrinsic base made of single crystal Si—Ge and a base leading-out electrode are connected via a link base made of polycrystal Si—Ge by doping at high concentration, further, a part immediately under the intrinsic base has the same conductive type as that of a collector and in a peripheral part, a single crystal Si—Ge layer having the same conductive type as that of a base is provided between the intrinsic base and a collector layer. Hereby, the reduction of the resistance of the link base between the intrinsic base and the base leading-out electrode and the reduction of capacitance between the collector and the base are simultaneously realized, and a self-aligned bipolar transistor wherein capacitance between an emitter and the base and capacitance between the collector and the base are respectively small, power consumption is small and high speed operation is enabled is acquired.
    • 根据本发明的双极晶体管具有以下结构:由单晶Si-Ge构成的本征基极和基极引出电极通过高浓度掺杂的由多晶Si-Ge制成的连接基底连接,此外, 在本征基底之下的部分具有与集电体相同的导电类型,并且在外围部分中,在本征基极和集电极层之间设置具有与基底相同的导电类型的单晶Si-Ge层。 因此,同时实现本征基极与基极引出电极之间的基极的电阻的降低和集电极与基极之间的电容的减小,以及自对准双极晶体管,其中发射极和 集电极和基极之间的基极和电容分别小,功耗小,获得高速运行。
    • 6. 发明授权
    • Bipolar transistor and manufacturing method thereof
    • 双极晶体管及其制造方法
    • US06521974B1
    • 2003-02-18
    • US09689800
    • 2000-10-13
    • Katsuya OdaEiji OhueMasao KondoKatsuyoshi WashioMasamichi TanabeHiromi Shimamoto
    • Katsuya OdaEiji OhueMasao KondoKatsuyoshi WashioMasamichi TanabeHiromi Shimamoto
    • H01L2970
    • H01L29/66287H01L29/66242H01L29/732H01L29/7378
    • A bipolar transistor according to the invention is provided with structure that an intrinsic base made of single crystal Si—Ge and a base leading-out electrode are connected via a link base made of polycrystal Si—Ge by doping at high concentration, further, a part immediately under the intrinsic base has the same conductive type as that of a collector and in a peripheral part, a single crystal Si—Ge layer having the same conductive type as that of a base is provided between the intrinsic base and a collector layer. Hereby, the reduction of the resistance of the link base between the intrinsic base and the base leading-out electrode and the reduction of capacitance between the collector and the base are simultaneously realized, and a self-aligned bipolar transistor wherein capacitance between an emitter and the base and capacitance between the collector and the base are respectively small, power consumption is small and high speed operation is enabled is acquired.
    • 根据本发明的双极晶体管具有以下结构:由单晶Si-Ge构成的本征基极和基极引出电极通过高浓度掺杂的由多晶Si-Ge制成的连接基底连接,此外, 在本征基底之下的部分具有与集电体相同的导电类型,并且在外围部分中,在本征基极和集电极层之间设置具有与基底相同的导电类型的单晶Si-Ge层。 因此,同时实现本征基极与基极引出电极之间的基极的电阻的降低和集电极与基极之间的电容的减小,以及自对准双极晶体管,其中发射极和 集电极和基极之间的基极和电容分别小,功耗小,获得高速运行。
    • 9. 发明授权
    • Heterojunction bipolar transistor and method for production thereof
    • 异质结双极晶体管及其制造方法
    • US06667489B2
    • 2003-12-23
    • US10299837
    • 2002-11-20
    • Isao SuzumuraKatsuya OdaKatsuyoshi Washio
    • Isao SuzumuraKatsuya OdaKatsuyoshi Washio
    • H01L2906
    • H01L29/66242H01L29/7378
    • A high-speed heterojunction bipolar transistor in a large injection of electrons from the emitter and a method for production thereof. In a typical example of the SiGeC heterojunction bipolar transistor, the collector has a layer of n-type single-crystal Si and a layer of n-type single-crystal SiGe, the base is a layer of heavily doped p-type single-crystal SiGeC, and the emitter is a layer of n-type single-crystal Si. At the heterointerface between the layer of n-type single-crystal SiGe and the layer of p-type single-crystal SiGeC, the bandgap of the p-type single-crystal SiGeC is larger than that of the layer of n-type single-crystal SiGe. Even though the effective neutral base expands due to an increase in electrons injected from the emitter, no energy barrier occurs in the conduction band at the heterointerface between the layer of n-type single-crystal SiGe and the layer of p-type single-crystal SiGeC. Thus, the diffusion of electrons is not inhibited and it is possible to realize high-speed heterojunction bipolar transistors even in the high injection state.
    • 从发射极大量注入电子的高速异质结双极晶体管及其制造方法。 在SiGeC异质结双极晶体管的典型实例中,集电体具有n型单晶Si层和n型单晶SiGe层,基极是重掺杂p型单晶层 SiGeC,发射极是n型单晶Si层。 在n型单晶SiGe层和p型单晶SiGeC层之间的异质界面处,p型单晶SiGeC的带隙大于n型单晶SiGeC层的带隙, 水晶SiGe。 即使有效的中性碱基由于从发射体注入的电子的增加而扩大,在n型单晶SiGe层与p型单晶层之间的异质界面的导带中也不发生能量势垒 SiGeC。 因此,电子的扩散不被抑制,即使在高注入状态下也可以实现高速异质结双极晶体管。