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1. 发明授权

US07243274B2 Semiconductor device 有权
标题翻译：半导体器件
公开(公告)号：US07243274B2
公开(公告)日：2007-07-10
申请号：US11206170
申请日：2005-08-18
申请人： Masafumi Yamazaki , Takaaki Suzuki , Toshikazu Nakamura , Satoshi Eto , Toshiya Miyo , Ayako Sato , Takayuki Yoneda , Noriko Kawamura
发明人： Masafumi Yamazaki , Takaaki Suzuki , Toshikazu Nakamura , Satoshi Eto , Toshiya Miyo , Ayako Sato , Takayuki Yoneda , Noriko Kawamura
IPC分类号： G11C29/00
CPC分类号： G11C29/48 , G11C29/36
摘要： An external terminal receives an external signal so as to access the first and second memory chips. The test starting terminal receives a test starting signal activated when the first or second memory chip is tested and inactivated when the first and second memory chips are normally operated. The access signal generator converts the external signal to a memory access signal of the first memory chip. The first selector selects the external signal, which is a test signal, during activation of the test starting signal, selects the memory access signal during the inactivation of the test starting signal. That is, during the test modes, the first memory chip can be directly accessed from the exterior. For this reason, the test program for testing the first memory chip alone can be diverted as the test program following an assembly of the semiconductor device.
摘要翻译：外部终端接收外部信号以访问第一和第二存储器芯片。当第一和第二存储器芯片正常工作时，测试启动终端接收到测试启动信号，当第一或第二存储器芯片被测试和非激活时激活。访问信号发生器将外部信号转换为第一存储器芯片的存储器访问信号。第一选择器在激活测试启动信号期间选择作为测试信号的外部信号，在测试启动信号失效期间选择存储器访问信号。也就是说，在测试模式期间，可以从外部直接访问第一存储器芯片。因此，在半导体器件的组装之后，用于单独测试第一存储器芯片的测试程序可以作为测试程序转移。

2. 发明申请

US20060015788A1 Semiconductor device 有权
公开(公告)号：US20060015788A1
公开(公告)日：2006-01-19
申请号：US11206170
申请日：2005-08-18
申请人： Masafumi Yamazaki , Takaaki Suzuki , Toshikazu Nakamura , Satoshi Eto , Toshiya Miyo , Ayako Sato , Takayuki Yoneda , Noriko Kawamura
发明人： Masafumi Yamazaki , Takaaki Suzuki , Toshikazu Nakamura , Satoshi Eto , Toshiya Miyo , Ayako Sato , Takayuki Yoneda , Noriko Kawamura
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G11C29/48 , G11C29/36
摘要： A logic chip and a memory chip to be accessed by the logic chip are mounted in a single package. A pattern generator of the logic chip operates during a first test mode to generate internal test pattern(s) for the memory chip. A pattern selector selects, during the first test mode, the internal test pattern(s) outputted from the pattern generator, selects, during a second test mode, an external test pattern supplied via a test terminal, and outputs the selected test pattern to the memory chip. The memory chip mounted in the package is tested by use of, in accordance with a mode selecting signal, either the internal test pattern(s) (the first test mode) generated within the logic chip or the external test pattern (the second test mode) supplied from the exterior.

3. 发明授权

US06961881B2 Semiconductor device 失效
标题翻译：半导体器件
公开(公告)号：US06961881B2
公开(公告)日：2005-11-01
申请号：US10122181
申请日：2002-04-16
申请人： Masafumi Yamazaki , Takaaki Suzuki , Toshikazu Nakamura , Satoshi Eto , Toshiya Miyo , Ayako Sato , Takayuki Yoneda , Noriko Kawamura
发明人： Masafumi Yamazaki , Takaaki Suzuki , Toshikazu Nakamura , Satoshi Eto , Toshiya Miyo , Ayako Sato , Takayuki Yoneda , Noriko Kawamura
IPC分类号： G11C29/00 , G11C29/36 , G11C29/48
CPC分类号： G11C29/48 , G11C29/36
摘要： A logic chip and a memory chip to be accessed by the logic chip are mounted in a single package. A pattern generator of the logic chip operates during a first test mode to generate internal test pattern for the memory chip. A pattern selector selects, during the first test mode, the internal test pattern outputted from the pattern generator, selects, during a second test mode, an external test pattern supplied via a test terminal, and outputs the selected test pattern to the memory chip. The memory chip mounted in the package is tested by use of, in accordance with a mode selecting signal, either the internal test pattern in the first test mode, generated within the logic chip, or the external test pattern in the second test mode, supplied from the exterior.
摘要翻译：由逻辑芯片访问的逻辑芯片和存储器芯片安装在单个封装中。逻辑芯片的模式发生器在第一测试模式下操作以产生用于存储器芯片的内部测试模式。模式选择器在第一测试模式期间选择从模式发生器输出的内部测试模式，在第二测试模式期间，选择通过测试终端提供的外部测试模式，并将所选择的测试模式输出到存储芯片。通过使用模式选择信号，在第二测试模式中使用在逻辑芯片内产生的第一测试模式中的内部测试模式或外部测试模式来测试安装在封装中的存储芯片，从外部。

4. 发明申请

US20060294322A1 Multi-port memory based on DRAM core 有权
公开(公告)号：US20060294322A1
公开(公告)日：2006-12-28
申请号：US11512319
申请日：2006-08-30
申请人： Yasurou Matsuzaki , Takaaki Suzuki , Masafumi Yamazaki , Kenichi Kawasaki , Shinnosuke Kamata , Ayako Sato , Masato Matsumiya
发明人： Yasurou Matsuzaki , Takaaki Suzuki , Masafumi Yamazaki , Kenichi Kawasaki , Shinnosuke Kamata , Ayako Sato , Masato Matsumiya
IPC分类号： G06F13/28
CPC分类号： G11C8/16 , G06F13/1605 , G11C7/1039 , G11C7/1075 , G11C7/1078 , G11C7/22 , G11C8/18 , G11C11/24 , G11C11/406 , G11C11/40603 , G11C11/40615 , G11C11/409 , G11C11/4093 , G11C2207/107 , G11C2207/108
摘要： A semiconductor memory device includes a plurality of N external ports, each of which receives commands, and an internal circuit which performs at least N access operations during a minimum interval of the commands that are input into one of the external ports.

5. 发明授权

US07120761B2 Multi-port memory based on DRAM core 有权
公开(公告)号：US07120761B2
公开(公告)日：2006-10-10
申请号：US10284092
申请日：2002-10-31
申请人： Yasurou Matsuzaki , Takaaki Suzuki , Masafumi Yamazaki , Kenichi Kawasaki , Shinnosuke Kamata , Ayako Sato , Masato Matsumiya
发明人： Yasurou Matsuzaki , Takaaki Suzuki , Masafumi Yamazaki , Kenichi Kawasaki , Shinnosuke Kamata , Ayako Sato , Masato Matsumiya
IPC分类号： G06F12/00
CPC分类号： G11C8/16 , G06F13/1605 , G11C7/1039 , G11C7/1075 , G11C7/1078 , G11C7/22 , G11C8/18 , G11C11/24 , G11C11/406 , G11C11/40603 , G11C11/40615 , G11C11/409 , G11C11/4093 , G11C2207/107 , G11C2207/108
摘要： A semiconductor memory device includes a plurality of N external ports, each of which receives commands, and an internal circuit which performs at least N access operations during a minimum interval of the commands that are input into one of the external ports.

6. 发明授权

US07911825B2 Multi-port memory based on DRAM core 有权
标题翻译：基于DRAM内核的多端口存储器
公开(公告)号：US07911825B2
公开(公告)日：2011-03-22
申请号：US11512319
申请日：2006-08-30
申请人： Yasurou Matsuzaki , Takaaki Suzuki , Masafumi Yamazaki , Kenichi Kawasaki , Shinnosuke Kamata , Ayako Sato , Masato Matsumiya
发明人： Yasurou Matsuzaki , Takaaki Suzuki , Masafumi Yamazaki , Kenichi Kawasaki , Shinnosuke Kamata , Ayako Sato , Masato Matsumiya
IPC分类号： G11C11/24
CPC分类号： G11C8/16 , G06F13/1605 , G11C7/1039 , G11C7/1075 , G11C7/1078 , G11C7/22 , G11C8/18 , G11C11/24 , G11C11/406 , G11C11/40603 , G11C11/40615 , G11C11/409 , G11C11/4093 , G11C2207/107 , G11C2207/108
摘要： A semiconductor memory device includes a plurality of N external ports, each of which receives commands, and an internal circuit which performs at least N access operations during a minimum interval of the commands that are input into one of the external ports.
摘要翻译：半导体存储器件包括多个N个外部端口，每个N个外部端口接收命令;以及内部电路，其在输入到一个外部端口的命令的最小间隔期间执行至少N次访问操作。

7. 发明授权

US07808806B2 Semiconductor apparatus having a large-size bus connection 有权
公开(公告)号：US07808806B2
公开(公告)日：2010-10-05
申请号：US11984932
申请日：2007-11-26
申请人： Yasurou Matsuzaki , Yasuharu Sato , Tadao Aikawa , Masafumi Yamazaki , Takaaki Suzuki
发明人： Yasurou Matsuzaki , Yasuharu Sato , Tadao Aikawa , Masafumi Yamazaki , Takaaki Suzuki
IPC分类号： G11C5/06
摘要： In a semiconductor apparatus of the present invention, a plurality of circuit components are provided. A first bus interconnects the circuit components. A second bus interconnects the circuit components. A switching unit outputs a select signal that causes each circuit component to select one of the first bus and the second bus when transmitting a signal from one of the circuit components to another. The second bus has a size larger than a size of the first bus.

8. 发明授权

US07907434B2 Semiconductor apparatus having a large-size bus connection 有权
标题翻译：具有大尺寸总线连接的半导体装置
公开(公告)号：US07907434B2
公开(公告)日：2011-03-15
申请号：US11984932
申请日：2007-11-26
申请人： Yasurou Matsuzaki , Yasuharu Sato , Tadao Aikawa , Masafumi Yamazaki , Takaaki Suzuki
发明人： Yasurou Matsuzaki , Yasuharu Sato , Tadao Aikawa , Masafumi Yamazaki , Takaaki Suzuki
IPC分类号： G11C5/06
CPC分类号： G11C5/06 , G11C5/00 , G11C5/04 , G11C5/063 , H01L25/0652 , H01L25/0657 , H01L27/105 , H01L2224/48091 , H01L2225/0651 , H01L2225/06513 , H01L2225/06562 , H01L2924/13091 , H04L12/40 , H04L12/4625 , H01L2924/00014 , H01L2924/00
摘要： In a semiconductor apparatus of the present invention, a plurality of circuit components are provided. A first bus interconnects the circuit components. A second bus interconnects the circuit components. A switching unit outputs a select signal that causes each circuit component to select one of the first bus and the second bus when transmitting a signal from one of the circuit components to another. The second bus has a size larger than a size of the first bus.
摘要翻译：在本发明的半导体装置中，设置有多个电路部件。第一条总线将电路组件互连。第二总线将电路组件互连。当从一个电路部件发送信号到另一个电路部件时，切换单元输出使每个电路部件选择第一总线和第二总线中的一个的选择信号。第二个总线的大小大于第一个总线的大小。

9. 发明申请

US20080142847A1 Semiconductor apparatus having a large-size bus connection 有权
标题翻译：具有大尺寸总线连接的半导体装置
公开(公告)号：US20080142847A1
公开(公告)日：2008-06-19
申请号：US11984932
申请日：2007-11-26
申请人： Yasurou Matsuzaki , Yasuharu Sato , Tadao Aikawa , Masafumi Yamazaki , Takaaki Suzuki
发明人： Yasurou Matsuzaki , Yasuharu Sato , Tadao Aikawa , Masafumi Yamazaki , Takaaki Suzuki
IPC分类号： H01L23/50
CPC分类号： G11C5/06 , G11C5/00 , G11C5/04 , G11C5/063 , H01L25/0652 , H01L25/0657 , H01L27/105 , H01L2224/48091 , H01L2225/0651 , H01L2225/06513 , H01L2225/06562 , H01L2924/13091 , H04L12/40 , H04L12/4625 , H01L2924/00014 , H01L2924/00
摘要： In a semiconductor apparatus of the present invention, a plurality of circuit components are provided. A first bus interconnects the circuit components. A second bus interconnects the circuit components. A switching unit outputs a select signal that causes each circuit component to select one of the first bus and the second bus when transmitting a signal from one of the circuit components to another. The second bus has a size larger than a size of the first bus.
摘要翻译：在本发明的半导体装置中，设置有多个电路部件。第一条总线将电路组件互连。第二总线将电路组件互连。当从一个电路部件发送信号到另一个电路部件时，切换单元输出使每个电路部件选择第一总线和第二总线中的一个的选择信号。第二个总线的大小大于第一个总线的大小。

10. 发明授权

US06727533B2 Semiconductor apparatus having a large-size bus connection 有权
公开(公告)号：US06727533B2
公开(公告)日：2004-04-27
申请号：US09956973
申请日：2001-09-21
申请人： Yasurou Matsuzaki , Yasuharu Sato , Tadao Aikawa , Masafumi Yamazaki , Takaaki Suzuki
发明人： Yasurou Matsuzaki , Yasuharu Sato , Tadao Aikawa , Masafumi Yamazaki , Takaaki Suzuki
IPC分类号： H01L31112
CPC分类号： G11C5/06 , G11C5/00 , G11C5/04 , G11C5/063 , H01L25/0652 , H01L25/0657 , H01L27/105 , H01L2224/48091 , H01L2225/0651 , H01L2225/06513 , H01L2225/06562 , H01L2924/13091 , H04L12/40 , H04L12/4625 , H01L2924/00014 , H01L2924/00
摘要： In a semiconductor apparatus of the present invention, a plurality of circuit components are provided. A first bus interconnects the circuit components. A second bus interconnects the circuit components. A switching unit outputs a select signal that causes each circuit component to select one of the first bus and the second bus when transmitting a signal from one of the circuit components to another. The second bus has a size larger than a size of the first bus.

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