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1. 发明授权

US07243274B2 Semiconductor device 有权
标题翻译：半导体器件
公开(公告)号：US07243274B2
公开(公告)日：2007-07-10
申请号：US11206170
申请日：2005-08-18
申请人： Masafumi Yamazaki , Takaaki Suzuki , Toshikazu Nakamura , Satoshi Eto , Toshiya Miyo , Ayako Sato , Takayuki Yoneda , Noriko Kawamura
发明人： Masafumi Yamazaki , Takaaki Suzuki , Toshikazu Nakamura , Satoshi Eto , Toshiya Miyo , Ayako Sato , Takayuki Yoneda , Noriko Kawamura
IPC分类号： G11C29/00
CPC分类号： G11C29/48 , G11C29/36
摘要： An external terminal receives an external signal so as to access the first and second memory chips. The test starting terminal receives a test starting signal activated when the first or second memory chip is tested and inactivated when the first and second memory chips are normally operated. The access signal generator converts the external signal to a memory access signal of the first memory chip. The first selector selects the external signal, which is a test signal, during activation of the test starting signal, selects the memory access signal during the inactivation of the test starting signal. That is, during the test modes, the first memory chip can be directly accessed from the exterior. For this reason, the test program for testing the first memory chip alone can be diverted as the test program following an assembly of the semiconductor device.
摘要翻译：外部终端接收外部信号以访问第一和第二存储器芯片。当第一和第二存储器芯片正常工作时，测试启动终端接收到测试启动信号，当第一或第二存储器芯片被测试和非激活时激活。访问信号发生器将外部信号转换为第一存储器芯片的存储器访问信号。第一选择器在激活测试启动信号期间选择作为测试信号的外部信号，在测试启动信号失效期间选择存储器访问信号。也就是说，在测试模式期间，可以从外部直接访问第一存储器芯片。因此，在半导体器件的组装之后，用于单独测试第一存储器芯片的测试程序可以作为测试程序转移。

2. 发明申请

US20060015788A1 Semiconductor device 有权
公开(公告)号：US20060015788A1
公开(公告)日：2006-01-19
申请号：US11206170
申请日：2005-08-18
申请人： Masafumi Yamazaki , Takaaki Suzuki , Toshikazu Nakamura , Satoshi Eto , Toshiya Miyo , Ayako Sato , Takayuki Yoneda , Noriko Kawamura
发明人： Masafumi Yamazaki , Takaaki Suzuki , Toshikazu Nakamura , Satoshi Eto , Toshiya Miyo , Ayako Sato , Takayuki Yoneda , Noriko Kawamura
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G11C29/48 , G11C29/36
摘要： A logic chip and a memory chip to be accessed by the logic chip are mounted in a single package. A pattern generator of the logic chip operates during a first test mode to generate internal test pattern(s) for the memory chip. A pattern selector selects, during the first test mode, the internal test pattern(s) outputted from the pattern generator, selects, during a second test mode, an external test pattern supplied via a test terminal, and outputs the selected test pattern to the memory chip. The memory chip mounted in the package is tested by use of, in accordance with a mode selecting signal, either the internal test pattern(s) (the first test mode) generated within the logic chip or the external test pattern (the second test mode) supplied from the exterior.

3. 发明授权

US06961881B2 Semiconductor device 失效
标题翻译：半导体器件
公开(公告)号：US06961881B2
公开(公告)日：2005-11-01
申请号：US10122181
申请日：2002-04-16
申请人： Masafumi Yamazaki , Takaaki Suzuki , Toshikazu Nakamura , Satoshi Eto , Toshiya Miyo , Ayako Sato , Takayuki Yoneda , Noriko Kawamura
发明人： Masafumi Yamazaki , Takaaki Suzuki , Toshikazu Nakamura , Satoshi Eto , Toshiya Miyo , Ayako Sato , Takayuki Yoneda , Noriko Kawamura
IPC分类号： G11C29/00 , G11C29/36 , G11C29/48
CPC分类号： G11C29/48 , G11C29/36
摘要： A logic chip and a memory chip to be accessed by the logic chip are mounted in a single package. A pattern generator of the logic chip operates during a first test mode to generate internal test pattern for the memory chip. A pattern selector selects, during the first test mode, the internal test pattern outputted from the pattern generator, selects, during a second test mode, an external test pattern supplied via a test terminal, and outputs the selected test pattern to the memory chip. The memory chip mounted in the package is tested by use of, in accordance with a mode selecting signal, either the internal test pattern in the first test mode, generated within the logic chip, or the external test pattern in the second test mode, supplied from the exterior.
摘要翻译：由逻辑芯片访问的逻辑芯片和存储器芯片安装在单个封装中。逻辑芯片的模式发生器在第一测试模式下操作以产生用于存储器芯片的内部测试模式。模式选择器在第一测试模式期间选择从模式发生器输出的内部测试模式，在第二测试模式期间，选择通过测试终端提供的外部测试模式，并将所选择的测试模式输出到存储芯片。通过使用模式选择信号，在第二测试模式中使用在逻辑芯片内产生的第一测试模式中的内部测试模式或外部测试模式来测试安装在封装中的存储芯片，从外部。

4. 发明授权

US4500714A 3-Substituted-ureido-N-pyridyl benzamides 失效
标题翻译： 3-取代的脲基-N-吡啶基苯甲酰胺
公开(公告)号：US4500714A
公开(公告)日：1985-02-19
申请号：US435541
申请日：1982-10-07
申请人： Masamitsu Honda , Hideaki Nagai , Shoko Takishima , Akinori Kawamura , Noriko Kawamura , Takashi Dan , Masuo Koizumi , Yasushi Murakami , Yoshikazu Hinohara , Hideki Nakano , Yoshio Takagaki
发明人： Masamitsu Honda , Hideaki Nagai , Shoko Takishima , Akinori Kawamura , Noriko Kawamura , Takashi Dan , Masuo Koizumi , Yasushi Murakami , Yoshikazu Hinohara , Hideki Nakano , Yoshio Takagaki
IPC分类号： C07D213/40 , C07D213/75
CPC分类号： C07D213/40 , C07D213/75
摘要： Benzamide derivatives of the formula: ##STR1## wherein R.sub.1 is a hydrogen atom, a methyl group or a methoxy group; R.sub.2 is a straight-chain or branched-chain alkyl group having 2 to 8 carbon atoms, a substituted phenyl group, or group --NHR.sub.4, R.sub.4 being a hydrogen atom, a straight-chain or branched-chain or cyclic alkyl group having 1 to 6 carbon atoms, or a phenyl group that may have a substituent on the nucleus; R.sub.3 is a hydrogen atom or one or two alkyl groups having 1 to 4 carbon atoms and n is 0 or 1, a process for preparing these derivatives, and pharmaceutical compositions containing the same are provided.The compounds of the above formula have the action to reduce the blood glucose level and, therefore, are useful as medicines.
摘要翻译：下式的苯甲酰胺衍生物：其中R1是氢原子，甲基或甲氧基; R2是具有2-8个碳原子的直链或支链烷基，取代的苯基或-NHR4基，R4是氢原子，直链或支链或环状烷基具有1〜 6个碳原子，或在核上可以具有取代基的苯基; R3是氢原子或一个或两个具有1至4个碳原子的烷基，n是0或1，提供这些衍生物的制备方法和含有它们的药物组合物。上述化合物具有降低血糖水平的作用，因此可用作药物。

5. 发明授权

US08462234B2 Image pickup apparatus and dark current correction method therefor 有权
标题翻译：摄像装置及其暗电流校正方法
公开(公告)号：US08462234B2
公开(公告)日：2013-06-11
申请号：US13639458
申请日：2011-10-27
申请人： Noriko Kawamura , Yoshinori Furuta
发明人： Noriko Kawamura , Yoshinori Furuta
IPC分类号： H04N9/64
CPC分类号： H04N5/361
摘要： Disclosed are an image pickup apparatus and a dark current correction method that make it possible to correct the dark current at high precision without using a driving pattern of a peripheral circuit or a layout on an image pickup device chip. The image pickup apparatus includes an image pickup device provided with an effective pixel area, an OB part and a drive circuit of the image pickup device. In the dark current correction method, a black level (hereinafter, referred to as “second black level”) included in the detected signal of the effective pixels of the effective pixel area is obtained (steps S3, S6, S7) based on a black level detected from the pixel of the OB pixels by performing a correction computation in accordance with an operation pattern (steps S1, S2, S5) of the drive circuit in which the temperature difference between the light receiving pixel part and the optical black part is occurred, and the second black level as a clamp level is subtracted from the level of the output signal of the effective pixels in accordance with the operation pattern of the drive circuit.
摘要翻译：公开了一种能够在不使用外围电路的驱动图案或图像拾取器件芯片上的布局的情况下以高精度校正暗电流的图像拾取装置和暗电流校正方法。图像拾取装置包括设置有图像拾取装置的有效像素区域，OB部分和驱动电路的图像拾取装置。在暗电流校正方法中，基于黑色电平校正方法获得包括在有效像素区域的有效像素的检测信号中的黑电平（以下称为“第二黑电平”）（步骤S3，S6，S7）通过根据其中发生受光像素部分和光学黑色部分之间的温度差的驱动电路的操作模式（步骤S1，S2，S5）执行校正计算，从OB像素的像素检测到的电平并且根据驱动电路的操作模式从有效像素的输出信号的电平中减去作为钳位电平的第二黑电平。

6. 发明申请

US20130021497A1 IMAGE PICKUP APPARATUS AND DARK CURRENT CORRECTION METHOD THEREFOR 有权
标题翻译：图像拾取装置和深电流校正方法
公开(公告)号：US20130021497A1
公开(公告)日：2013-01-24
申请号：US13639458
申请日：2011-10-27
申请人： Noriko Kawamura , Yoshinori Furuta
发明人： Noriko Kawamura , Yoshinori Furuta
IPC分类号： H04N5/357
CPC分类号： H04N5/361
摘要： Disclosed are an image pickup apparatus and a dark current correction method that make it possible to correct the dark current at high precision without using a driving pattern of a peripheral circuit or a layout on an image pickup device chip. The image pickup apparatus includes an image pickup device provided with an effective pixel area, an OB part and a drive circuit of the image pickup device. In the dark current correction method, a black level (hereinafter, referred to as “second black level”) included in the detected signal of the effective pixels of the effective pixel area is obtained (steps S3, S6, S7) based on a black level detected from the pixel of the OB pixels by performing a correction computation in accordance with an operation pattern (steps S1, S2, S5) of the drive circuit in which the temperature difference between the light receiving pixel part and the optical black part is occurred, and the second black level as a clamp level is subtracted from the level of the output signal of the effective pixels in accordance with the operation pattern of the drive circuit.
摘要翻译：公开了一种能够在不使用外围电路的驱动图案或图像拾取器件芯片上的布局的情况下以高精度校正暗电流的图像拾取装置和暗电流校正方法。图像拾取装置包括设置有图像拾取装置的有效像素区域，OB部分和驱动电路的图像拾取装置。在暗电流校正方法中，基于检测到的黑电平，获得包括在有效像素区域的有效像素的检测信号中的黑电平（以下称为第二黑电平）（步骤S3，S6，S7）根据发生受光像素部分和光学黑色部分之间的温度差的驱动电路的操作模式（步骤S1，S2，S5），通过执行校正计算，从OB像素的像素执行校正计算，以及根据驱动电路的操作模式，从有效像素的输出信号的电平中减去作为钳位电平的第二黑电平。

7. 发明授权

US5898763A Equipment for facsimile call service of telephone exchange 失效
标题翻译：电话交换传真呼叫服务设备
公开(公告)号：US5898763A
公开(公告)日：1999-04-27
申请号：US887665
申请日：1997-07-03
申请人： Fusao Azuma , Noriko Kawamura , Teruo Ohno , Makoto Hibara
发明人： Fusao Azuma , Noriko Kawamura , Teruo Ohno , Makoto Hibara
IPC分类号： H04M15/00 , H04M15/12 , H04N1/32 , H04N1/327 , H04N1/34 , H04M11/00
CPC分类号： H04M15/44 , H04M15/00 , H04M15/12 , H04N1/00408 , H04N1/32614 , H04N1/32662 , H04N1/32704 , H04N1/32708 , H04N1/32719 , H04N1/32723 , H04N1/32745 , H04N1/34 , H04M2215/0104
摘要： An equipment for facsimile call service of a telephone exchange which can apply an unique charging system to a facsimile call by distinguishing the facsimile call from ordinary speech calls, notify a caller of cause when occurring a failure in transmitting the facsimile call, and advise the caller on the way to eliminate the cause.
摘要翻译：一种电话交换机的传真呼叫服务设备，其可以通过将传真呼叫与普通语音呼叫区分开来将独特的收费系统应用于传真呼叫，在发送传真呼叫时发生故障时通知呼叫者原因，并通知呼叫者在消除原因的途中。

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