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    • 1. 发明授权
    • Viable memory cell formed using rapid thermal annealing
    • 使用快速热退火形成的可行存储单元
    • US06251717B1
    • 2001-06-26
    • US09163315
    • 1998-09-30
    • Mark RamsbeyDaniel SobekNicholas H. Trispas
    • Mark RamsbeyDaniel SobekNicholas H. Trispas
    • H01L218242
    • H01L27/11521H01L27/115
    • A method for forming viable floating gate memory cells in a semiconductor substrate. At various points within the memory cell manufacturing process rapid thermal annealing is used to repair any damage that may be caused to the crystals in the substrate by various processing steps. By quickly repairing any damage to the crystals of the substrate, the rate and amount of overall transient enhanced diffusion of the various dopants within the substrate can be greatly reduced, thereby allowing the production of a viable memory cell. Specifically, the present invention uses rapid thermal annealing during and following the formation of the source and drain regions and the interconnection regions effecting electrical connection between the source regions. This desensitizes the erase rates of the semiconductor device to the etching conditions employed to form the connections.
    • 一种用于在半导体衬底中形成可行浮栅存储器单元的方法。 在存储单元制造过程中的各个点,使用快速热退火来通过各种处理步骤修复可能对基板中的晶体造成的任何损坏。 通过快速修复对基板的晶体的任何损坏,可以大大降低衬底内的各种掺杂剂的总体瞬态增强扩散的速率和量,从而允许生产可行的存储单元。 具体地说,本发明在形成源极区和漏极区之间和之后使用快速热退火以及实现源区之间的电连接的互连区。 这使得半导体器件的擦除速率与用于形成连接的蚀刻条件脱敏。
    • 5. 发明授权
    • Ion source frequency feedback device and method
    • 离子源频率反馈装置及方法
    • US07022982B2
    • 2006-04-04
    • US10896981
    • 2004-07-23
    • Daniel SobekJing CaiKevin KilleenHongfeng Yin
    • Daniel SobekJing CaiKevin KilleenHongfeng Yin
    • H01J49/10
    • H01J49/165
    • An ion source for an analytical instrument is described. The ion source comprises a capillary tip and counter-electrode interface and a feedback loop control device connected to the capillary tip and counter-electrode interface. The feedback loop control device comprises a transimpedance amplifier, a DC de-coupler, a frequency to voltage converter, a controller, and a voltage-controlled high-voltage power supply that provides a tip to counter-electrode voltage to the capillary tip and counter-electrode interface. The feedback loop control device measures the modulation frequency of ionization currents and provides a feedback adjustment of the tip-to-counter-electrode voltage to maintain ionization efficiency.
    • 描述了用于分析仪器的离子源。 离子源包括毛细管尖端和对电极界面以及连接到毛细管尖端和对电极界面的反馈回路控制装置。 反馈回路控制装置包括跨阻抗放大器,直流去耦合器,频率 - 电压转换器,控制器和电压控制的高压电源,其提供针对毛细管尖端和计数器的对电极电压的尖端 电极接口。 反馈回路控制装置测量电离电流的调制频率,并提供端对电极电压的反馈调整,以维持电离效率。
    • 9. 发明授权
    • Method and system for using a spacer to offset implant damage and reduce lateral diffusion in flash memory devices
    • 使用间隔物补偿植入物损伤并减少闪存装置中的横向扩散的方法和系统
    • US06410956B1
    • 2002-06-25
    • US09478864
    • 2000-01-07
    • Vei-Han ChanScott D. LuningMark RandolphNicholas H. TripsasDaniel SobekJanet WangTimothy J. ThurgateSameer Haddad
    • Vei-Han ChanScott D. LuningMark RandolphNicholas H. TripsasDaniel SobekJanet WangTimothy J. ThurgateSameer Haddad
    • H01L2976
    • H01L29/66825
    • A system and method for providing a memory cell on a semiconductor is disclosed. In one aspect, the method and system include providing at least one gate stack on the semiconductor, depositing at least one spacer, and providing at least one source implant in the semiconductor. The at least one gate stack has an edge. A portion of the at least one spacer is disposed along the edge of the at least one gate stack. In another aspect, the method and system include providing at least one gate stack on the semiconductor, providing a first junction implant in the semiconductor, depositing at least one spacer, and providing a second junction implant in the semiconductor after the at least one spacer is deposited. The at least one gate stack has an edge. A portion of the at least one spacer is disposed at the edge of the at least one gate stack. In a third aspect, the method and system include providing at least one gate stack on the semiconductor, providing at least one source implant in the semiconductor, depositing at least one spacer after the at least one source implant is provided, and providing at least one drain implant in the semiconductor after the spacer is deposited. The at least one gate has an edge. A portion of the at least one spacer is disposed along the edge of the at least one gate.
    • 公开了一种在半导体上提供存储单元的系统和方法。 在一个方面,所述方法和系统包括在半导体上提供至少一个栅极堆叠,沉积至少一个间隔物,以及在半导体中提供至少一个源极注入。 至少一个栅极堆叠具有边缘。 所述至少一个间隔物的一部分沿着所述至少一个栅极叠层的边缘设置。 在另一方面,该方法和系统包括在半导体上提供至少一个栅极叠层,在半导体中提供第一结注入,沉积至少一个间隔物,以及在至少一个间隔物之后在半导体中提供第二结注入 存放 至少一个栅极堆叠具有边缘。 所述至少一个间隔件的一部分设置在所述至少一个栅极叠层的边缘处。 在第三方面,所述方法和系统包括在半导体上提供至少一个栅极堆叠,在半导体中提供至少一个源极注入,在提供至少一个源极植入之后沉积至少一个间隔物,并且提供至少一个 在间隔物沉积之后在半导体中的漏极注入。 至少一个门具有边缘。 所述至少一个间隔物的一部分沿着所述至少一个栅极的边缘设置。