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    • 3. 发明授权
    • Structure for an apparatus for monitoring and controlling heat generation in a multi-core processor
    • 用于在多核处理器中监测和控制发热的装置的结构
    • US08214660B2
    • 2012-07-03
    • US12347947
    • 2008-12-31
    • Louis Bennie Capps, Jr.Warren D. DyckmanMichael Jay Shapiro
    • Louis Bennie Capps, Jr.Warren D. DyckmanMichael Jay Shapiro
    • G06F1/00G06F15/00G01R15/00G01K1/00G06G7/54
    • G06F1/206
    • A design structure for a processor may be embodied in a machine readable medium for designing, manufacturing or testing a processor integrated circuit. The design structure may control heat generation in a multi-core processor. The design structure may specify that each processor core includes a temperature sensor that reports temperature information to a processor controller. The design structure may also specify that if a particular processor core exceeds a predetermined temperature, the processor controller disables that processor core to allow that processor core to cool. The design structure may also specify that the processor controller enables the previously disabled processor core when the previously disabled processor core cools sufficiently to a normal operating temperature. In this manner, a multi-core processor may avoid undesirable hot spots that impact processor life.
    • 用于处理器的设计结构可以体现在用于设计,制造或测试处理器集成电路的机器可读介质中。 该设计结构可以控制多核处理器中的发热。 设计结构可以指定每个处理器核心包括向处理器控制器报告温度信息的温度传感器。 该设计结构还可以指定如果特定处理器核心超过预定温度,则处理器控制器禁止该处理器核心使该处理器核心冷却。 设计结构还可以指定当先前禁用的处理器核心充分冷却至正常工作温度时,处理器控制器启用先前禁用的处理器核心。 以这种方式,多核处理器可以避免影响处理器寿命的不期望的热点。
    • 7. 发明授权
    • Integrated circuit environment initialization according to information stored within the integrated circuit
    • 根据存储在集成电路内的信息,集成电路环境初始化
    • US07996693B2
    • 2011-08-09
    • US12277365
    • 2008-11-25
    • Louis Bennie Capps, Jr.Mark Elliott HackSteven Paul HartmanMichael Jay Shapiro
    • Louis Bennie Capps, Jr.Mark Elliott HackSteven Paul HartmanMichael Jay Shapiro
    • G06F1/26
    • G06F1/206
    • A method for automatically initializing the operational settings of a system from information stored within a non-volatile storage of an integrated circuit so that the operational requirements of the integrated circuit, which may be a microprocessor, are met by the system when the system is operating. During manufacturing test, environmental requirements of the integrated circuit are determined and stored within the non-volatile storage of the integrated circuit. During system initialization, environmental control values such as required operating voltage and frequency and cooling requirements are determined from the test values, which are read from the integrated circuit. The values are read by an interface of the system from an interface of the integrated circuit. System settings are controlled by the values to provide the required operating environment and the values may be captured within the system for subsequent operations and initialization sequences.
    • 一种用于根据存储在集成电路的非易失性存储器中的信息自动初始化系统的操作设置的方法,使得当系统运行时系统满足可能是微处理器的集成电路的操作要求 。 在制造测试期间,集成电路的环境要求被确定并存储在集成电路的非易失性存储器中。 在系统初始化期间,从集成电路读取的测试值确定所需的工作电压,频率和冷却要求等环境控制值。 这些值由系统的接口从集成电路的接口读取。 系统设置由值控制以提供所需的操作环境,并且可以在系统内捕获值以用于后续操作和初始化序列。