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    • 1. 发明授权
    • Non-volatile memory device with burst mode reading and corresponding reading method
    • 具有突发模式读取的非易失性存储器件和相应的读取方法
    • US06854040B1
    • 2005-02-08
    • US09717938
    • 2000-11-21
    • Simone BartoliAntonino GeraciMauro SaliLorenzo Bedarida
    • Simone BartoliAntonino GeraciMauro SaliLorenzo Bedarida
    • G11C7/10G06F12/00G06F13/28G11C8/04
    • G11C7/1072G11C7/1033G11C7/1045
    • A read control circuit and a reading method for an electronic memory device integrated on a semiconductor includes a non-volatile memory matrix with associated row and column decoders connected to respective outputs of an address counter. An address transition detect (ATD) circuit detects an input transition as the memory device is being accessed, and read amplifiers and attendant registers transfer the data read from the memory matrix to the output. The read control circuit includes a detection circuit to which is input a clock signal and a logic signal to enable reading in the burst mode. A burst read mode control logic circuit is connected downstream of the detection circuit. The method includes accessing the memory matrix in a random read mode, detecting a request for access in the burst read mode, and executing the parallel reading of a plurality of memory words during a single period of time clocked by the clock signal.
    • 集成在半导体上的电子存储装置的读取控制电路和读取方法包括具有连接到地址计数器的相应输出的相关联的行和列解码器的非易失性存储器矩阵。 地址转换检测(ATD)电路在正在访问存储器件时检测输入转换,并且读取放大​​器和伴随寄存器将从存储器矩阵读取的数据传送到输出。 读取控制电路包括检测电路,在该检测电路中输入时钟信号和逻辑信号,使得能够以突发模式进行读取。 突发读模式控制逻辑电路连接在检测电路的下游。 该方法包括以随机读取模式访问存储器矩阵,以突发读取模式检测访问请求,以及在由时钟信号计时的单个时间段内执行多个存储器字的并行读取。
    • 3. 发明授权
    • Non-volatile memory with a charge pump with regulated voltage
    • 具有调节电压的电荷泵的非易失性存储器
    • US06480436B2
    • 2002-11-12
    • US09909467
    • 2001-07-19
    • Emanuele ConfalonieriLorenzo BedaridaMauro SaliSimone Bartoli
    • Emanuele ConfalonieriLorenzo BedaridaMauro SaliSimone Bartoli
    • G11C700
    • G11C16/30
    • A semiconductor memory includes a plurality of memory cells connected to one another to form a matrix of memory cells. A charge pump is connected to the matrix of memory cells. A plurality of controllable connection elements are provided, with each controllable connection element connected between an output terminal of the charge pump and a respective column line. Connected to the output of the charge pump is the series connection of a first element equivalent to a controllable connection element, and a second element equivalent to a memory cell in a predetermined biasing condition. A voltage regulator is connected between the second equivalent element and the input terminal of the charge pump for regulating the output voltage therefrom based upon a voltage present between terminals of the second equivalent element.
    • 半导体存储器包括彼此连接以形成存储器单元矩阵的多个存储单元。 电荷泵连接到存储器单元的矩阵。 提供多个可控制的连接元件,每个可控制的连接元件连接在电荷泵的输出端和相应的列线之间。 连接到电荷泵的输出端是等效于可控制连接元件的第一元件和等同于预定偏压状态下的存储器单元的第二元件的串联连接。 电压调节器连接在第二等效元件和电荷泵的输入端之间,用于基于第二等效元件的端子之间存在的电压来调节其输出电压。
    • 9. 发明授权
    • Negative word line voltage regulation circuit for electrically erasable
semiconductor memory devices
    • 用于电可擦除半导体存储器件的负字线电压调节电路
    • US5659502A
    • 1997-08-19
    • US665862
    • 1996-06-19
    • Mauro SaliCorrado VillaMarcello Carrera
    • Mauro SaliCorrado VillaMarcello Carrera
    • G11C17/00G11C16/06G11C16/30G11C13/00
    • G11C16/30
    • A negative word line voltage regulation circuit integratable in an electrically erasable semiconductor memory device. The circuit regulates a negative word line voltage to be supplied to word lines of the memory device during an electrical erasure of the memory device. The circuit includes an operational amplifier with a first input coupled to a reference voltage, a second input coupled to the negative word line voltage, and an output controlling a voltage regulation branch connected between an external power supply and the negative word line voltage, to provide a regulation current for regulating the negative word line voltage. The output of the operational amplifier also controls a voltage sensing branch, connected between the external power supply and the negative word line voltage, to provide a sensing signal coupled to the second input of the operational amplifier.
    • 可在电可擦除半导体存储器件中集成的负字线电压调节电路。 电路在存储器件的电擦除期间调节要提供给存储器件的字线的负字线电压。 电路包括具有耦合到参考电压的第一输入的运算放大器,耦合到负字线电压的第二输入,以及控制连接在外部电源和负字线电压之间的电压调节支路的输出,以提供 用于调节负字线电压的调节电流。 运算放大器的输出还控制连接在外部电源和负字线电压之间的电压感测支路,以提供耦合到运算放大器的第二输入端的感测信号。
    • 10. 发明授权
    • Row decoding circuit for a semiconductor non-volatile electrically programmable memory and corresponding method
    • 半导体非易失性电可编程存储器的行解码电路及相应的方法
    • US06320792B1
    • 2001-11-20
    • US09633334
    • 2000-08-07
    • Fabio Tassan CaserMauro SaliMarcello Cane
    • Fabio Tassan CaserMauro SaliMarcello Cane
    • G11C1606
    • G11C8/10G11C16/08
    • The invention relates to a row decoding circuit for an electrically programmable and erasable semiconductor non-volatile storage device of the type which includes a matrix of memory cells laid out as cell rows and columns and is divided into sectors, said circuit being input row decode signals and supply voltages in order to drive an output stage incorporating a complementary pair of high-voltage MOS transistors of the pull-up and pull-down type, respectively, which are connected to form an output terminal connected to the rows of one sector of the matrix, characterized in that a MOS transistor of the P-channel depletion type with enhanced gate oxide is provided between the output terminal and the pull-down transistor. The control terminal of the depletion transistor forms a further input of the circuit.
    • 本发明涉及一种用于电可编程和可擦除的半导体非易失性存储装置的行解码电路,该电路可编程和可擦除半导体非易失性存储装置包括布置为单元行和列的存储单元的矩阵,并被划分为扇区,所述电路是输入行解码信号 和电源电压,以分别驱动并入一对互补的上拉和下拉型高压MOS晶体管的输出级,所述高压MOS晶体管被连接以形成连接到所述上拉和下拉的一个扇区的行的输出端子 矩阵,其特征在于,在输出端和下拉晶体管之间提供具有增强的栅极氧化物的P沟道耗尽型的MOS晶体管。 耗尽晶体管的控制端构成电路的另一输入。