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    • 1. 发明申请
    • TWO-BIT READ-ONLY MEMORY CELL
    • 两位只读存储器单元
    • US20140241028A1
    • 2014-08-28
    • US13778258
    • 2013-02-27
    • LSI CORPORATION
    • Rajiv Kumar RoyVikash
    • G11C5/06
    • G11C17/146G11C11/4097G11C11/5692
    • A read-only memory (ROM) cell has first and second transistors connected in series between a true bit line and a voltage reference (e.g., ground), and third and fourth transistors connected in series between a complement bit line and the voltage reference. The gates of the first and third transistors are connected to a first word line, and the gates of the second and fourth transistors are connected to a second word line. The ROM cell is programmed to store any possible combination of two bits of information by appropriately (i) connecting the node between the first and second transistors to either the true bit line, the complement bit line, or the voltage reference and (ii) connecting the node between the third and fourth transistors to either the true bit line, the complement bit line, or the voltage reference.
    • 只读存储器(ROM)单元具有串联在真位线和电压基准(例如,接地)之间的第一和第二晶体管,以及串联连接在补码位线和电压基准之间的第三和第四晶体管。 第一和第三晶体管的栅极连接到第一字线,第二和第四晶体管的栅极连接到第二字线。 ROM单元被编程为通过适当地(i)将第一和第二晶体管之间的节点连接到真位线,补码位线或电压基准来存储两位信息的任何可能的组合,以及(ii)连接 第三和第四晶体管之间的节点到真位线,补码位线或电压基准。
    • 3. 发明授权
    • Fast access with low leakage and low power technique for read only memory devices
    • 以低泄漏和低功耗技术快速访问只读存储器件
    • US09064583B2
    • 2015-06-23
    • US13775942
    • 2013-02-25
    • LSI Corporation
    • Rajiv Kumar RoyDisha SinghSahilpreet Singh
    • G11C11/34G11C17/12
    • G11C17/12
    • A Read Only Memory (ROM) and method for providing a high operational speed with reduced leakage, no core cell standby leakage, and low power consumption. The source of the ROM cell (NMOS) is connected to a virtual ground line (VNGD) instead of VSS. Thus, the ROM cell can be operatively coupled to the bit-line, the word-line, and the virtual ground, which also acts as a column select signal. The arrangement of the ROM is such that the virtual ground of the selected column is pulled down to a ground voltage. Non-selected columns virtual ground can be maintained at a supply voltage to ensure that unwanted columns will not have any sub-threshold current (as Vds=0). Since no pre-charging of bit-line comes in the access time path, the ROM achieves a high operational speed with reduced leakage and low power consumption.
    • 一种只读存储器(ROM)和方法,用于提供较高的运行速度,减少泄漏,无核心单元备用泄漏和低功耗。 ROM单元(NMOS)的源极连接到虚拟接地线(VNGD)而不是VSS。 因此,ROM单元可以可操作地耦合到位线,字线和虚拟地,其也用作列选择信号。 ROM的布置使得所选列的虚拟地被下拉到接地电压。 未选择的列虚拟接地可以保持在电源电压,以确保不需要的列不会有任何子阈值电流(如Vds = 0)。 由于在访问时间路径中不进行位线预充电,所以ROM实现了高的运行速度,同时减少了泄漏和低功耗。
    • 6. 发明申请
    • BIT LINE WRITE ASSIST FOR STATIC RANDOM ACCESS MEMORY ARCHITECTURES
    • 用于静态随机访问存储器架构的位线写入辅助
    • US20150255148A1
    • 2015-09-10
    • US14197552
    • 2014-03-05
    • LSI Corporation
    • Rajiv Kumar RoyRasoju Veerabadra CharyRahul Sahu
    • G11C11/4096
    • G11C11/4096G11C7/1096G11C7/12G11C11/413G11C11/419
    • SRAM devices are disclosed that utilize write assist circuits to improve the logical transitions of bit lines. In one embodiment, an SRAM device includes a pair of complimentary bit lines traversing a memory cell array for writing data to memory cells. The bit lines have a first end and a second end. A pair of complimentary write drivers is proximate to the first end of the bit lines that writes to the bit lines. A write assist circuit is proximate to the second end of the bit lines that receives a pre-charge signal to assist the write drivers in transitioning the bit lines from a logical zero state to a logical one state. The write assist circuit also receives a boost signal to assist the write drivers in transitioning the bit lines from a logical one state to a logical zero state.
    • 公开了利用写辅助电路来改进位线的逻辑转换的SRAM器件。 在一个实施例中,SRAM器件包括穿过用于将数据写入存储器单元的存储单元阵列的一对补充位线。 位线具有第一端和第二端。 一对补码写驱动器靠近写入位线的位线的第一端。 写辅助电路接近位线的第二端,其接收预充电信号以辅助写驱动器将位线从逻辑零状态转换到逻辑1状态。 写辅助电路还接收升压信号以帮助写驱动器将位线从逻辑1状态转换到逻辑零状态。
    • 7. 发明授权
    • Differential latch word line assist for SRAM
    • SRAM的差分锁存字线协助
    • US09111637B1
    • 2015-08-18
    • US14274965
    • 2014-05-12
    • LSI Corporation
    • Rahul SahuRajiv Kumar RoyRasoju Veerabadra CharyDharmendra Kumar Rai
    • G11C11/00G11C11/417G11C5/06
    • G11C11/417G11C8/08G11C8/16G11C11/418
    • Word line assist circuits are disclosed for high performance sub-micron SRAM designs. One embodiment is an SRAM device that includes a memory cell array and a pair of word lines that traverse the memory cell array for selecting memory cells. The SRAM device further includes a pair of word line drivers, each coupled to one of the word lines. The SRAM device further includes a word line assist circuit coupled to the pair of word lines that receives an enable signal. Responsive to receiving the enable signal, the word line assist circuit assists the first word line driver and the second word line driver in transitioning their respective word lines from a logic level zero to a logic level one in response to a voltage differential between the word lines.
    • 公开了用于高性能亚微米SRAM设计的字线辅助电路。 一个实施例是一种SRAM器件,其包括存储单元阵列和穿过存储单元阵列的一对字线,用于选择存储单元。 SRAM器件还包括一对字线驱动器,每个字线驱动器耦合到一条字线。 该SRAM器件还包括一个字线辅助电路,它耦合到一对接收使能信号的字线。 响应于接收使能信号,字线辅助电路协助第一字线驱动器和第二字线驱动器响应于字线之间的电压差将它们各自的字线从逻辑电平0转换到逻辑电平1 。
    • 9. 发明授权
    • Two-bit read-only memory cell
    • 两位只读存储单元
    • US09147495B2
    • 2015-09-29
    • US13778258
    • 2013-02-27
    • LSI Corporation
    • Rajiv Kumar RoyVikash
    • G11C11/4097G11C17/14G11C11/56
    • G11C17/146G11C11/4097G11C11/5692
    • A read-only memory (ROM) cell has first and second transistors connected in series between a true bit line and a voltage reference (e.g., ground), and third and fourth transistors connected in series between a complement bit line and the voltage reference. The gates of the first and third transistors are connected to a first word line, and the gates of the second and fourth transistors are connected to a second word line. The ROM cell is programmed to store any possible combination of two bits of information by appropriately (i) connecting the node between the first and second transistors to either the true bit line, the complement bit line, or the voltage reference and (ii) connecting the node between the third and fourth transistors to either the true bit line, the complement bit line, or the voltage reference.
    • 只读存储器(ROM)单元具有串联在真位线和电压基准(例如,接地)之间的第一和第二晶体管,以及串联连接在补码位线和电压基准之间的第三和第四晶体管。 第一和第三晶体管的栅极连接到第一字线,第二和第四晶体管的栅极连接到第二字线。 ROM单元被编程为通过适当地(i)将第一和第二晶体管之间的节点连接到真位线,补码位线或电压基准来存储两位信息的任何可能的组合,以及(ii)连接 第三和第四晶体管之间的节点到真位线,补码位线或电压基准。
    • 10. 发明申请
    • GLOBAL BITLINE WRITE ASSIST FOR SRAM ARCHITECTURES
    • 用于SRAM架构的全球双引号写入协助
    • US20150138876A1
    • 2015-05-21
    • US14153560
    • 2014-01-13
    • LSI Corporation
    • Rajiv Kumar RoyRasoju Veerabadra Chary
    • G11C11/419
    • G11C11/419G11C7/18G11C11/418
    • An SRAM device includes a segmented memory cell array with a plurality of memory cells. Each segment of memory cells includes a bitline coupled to the memory cells in the segment. The SRAM device further includes a global bitline traversing the segmented memory cell array and communicatively coupled to the memory cell segments via the local bitlines for writing to the memory cells. The SRAM device further includes a global input/output module operable to hold the global bitline at logical zero, to toggle the global bitline to logical one when data is to be written, to select one of the segments of memory cells for writing after the global bitline has been toggled, and to toggle the global bitline to logical zero when data is written to the selected memory cell segment to provide a negative boost voltage to the local bitline of the selected memory cell segment.
    • SRAM器件包括具有多个存储器单元的分段存储单元阵列。 存储器单元的每个段包括耦合到段中的存储器单元的位线。 SRAM器件还包括遍历分段存储单元阵列的全局位线,并且经由本地位线通信地耦合到存储器单元段以写入存储单元。 SRAM器件还包括全局输入/输出模块,可操作以将全局位线保持在逻辑0,以便在要写入数据时将全局位线切换为逻辑位线,以在全局位置之后选择存储器单元的一段以进行写入 位线被切换,并且当数据被写入所选择的存储器单元段以将全局位线切换到逻辑0以向所选存储器单元段的本地位线提供负升压电压时。