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    • 3. 发明申请
    • CYCLICAL DEPOSITION OF REFRACTORY METAL SILICON NITRIDE
    • REFRACTORY金属硅化合物的循环沉积
    • US20060216928A1
    • 2006-09-28
    • US11422826
    • 2006-06-07
    • HUA CHUNGLING CHENBARRY CHIN
    • HUA CHUNGLING CHENBARRY CHIN
    • H01L21/4763
    • C23C16/45531C23C16/34H01L21/28562H01L21/76843
    • Embodiments of the invention relate to methods for depositing a metal silicon nitride layer on a substrate during an atomic layer deposition (ALD) process. In one embodiment, the method provides positioning a substrate within a process chamber containing a centralized expanding channel that conically tapers towards and substantially covers the substrate, flowing a process gas into the centralized expanding channel to form a circular flow pattern, exposing the substrate to the process gas having the circular flow pattern, and exposing the substrate sequentially to chemical precursors during an ALD process to form a metal silicon nitride material. In one example, the ALD process provides sequentially pulsing a metal precursor, a nitrogen precursor, and a silicon precursor into the process gas having the circular flow pattern. The metal silicon nitride material may contain tantalum or titanium. In other examples, the process gas or the substrate may be exposed to a plasma.
    • 本发明的实施例涉及在原子层沉积(ALD)过程中在衬底上沉积金属氮化硅层的方法。 在一个实施例中,该方法提供将衬底定位在处理室内,该处理室包含集中扩展通道,该中心膨胀通道朝向并基本上覆盖衬底的锥形渐缩,将工艺气体流入集中扩展通道以形成圆形流动图案,将衬底暴露于 具有圆形流动图案的工艺气体,并且在ALD工艺期间将衬底依次暴露于化学前体以形成金属氮化硅材料。 在一个实例中,ALD工艺顺序地将金属前体,氮前体和硅前体顺序地引入到具有圆形流动图案的工艺气体中。 金属氮化硅材料可以包含钽或钛。 在其它实例中,工艺气体或衬底可以暴露于等离子体。
    • 4. 发明申请
    • APPARATUS AND METHOD FOR HYBRID CHEMICAL PROCESSING
    • 混合化学处理装置和方法
    • US20080274299A1
    • 2008-11-06
    • US12172092
    • 2008-07-11
    • LING CHENVincent W. KuMei ChangDien-Yeh WuHua Chung
    • LING CHENVincent W. KuMei ChangDien-Yeh WuHua Chung
    • H05H1/24C23C16/00
    • C23C16/45544C23C16/45502C23C16/45504C23C16/45508C23C16/45512C23C16/45561C23C16/45582C23C16/54
    • In one embodiment, an apparatus for performing an atomic layer deposition (ALD) process is provided which includes a chamber body containing a substrate support, a lid assembly attached to the chamber body, a remote plasma system (RPS) in fluid communication with the reaction zone, a centralized expanding conduit extending through the lid assembly and expanding radially outwards, a first gas delivery sub-assembly configured to deliver a first process gas, and a second gas delivery sub-assembly configured to deliver a second process gas into the centralized expanding conduit. The first gas delivery sub-assembly contains an annular channel encircling and in fluid communication with the centralized expanding conduit, wherein the annular channel is adapted to deliver the first process gas through a plurality of passageways and nozzles and into the centralized expanding conduit. The second gas delivery sub-assembly contains a gas inlet in fluid communication to the centralized expanding conduit.
    • 在一个实施例中,提供了一种用于执行原子层沉积(ALD)工艺的装置,其包括容纳衬底支撑件的室主体,附接到室主体的盖组件,与反应流体连通的远程等离子体系统(RPS) 区域,延伸穿过盖组件并径向向外扩张的集中扩展管道,构造成输送第一工艺气体的第一气体输送子组件和构造成将第二工艺气体输送到集中扩展中的第二气体输送子组件 导管。 第一气体输送子组件包含环形通道,环形通道与中央膨胀管道流体连通,其中环形通道适于将第一工艺气体通过多个通道和喷嘴输送到集中扩展管道中。 第二气体输送子组件包含与集中扩张导管流体连通的气体入口。
    • 8. 发明申请
    • APPARATUS AND METHOD FOR HYBRID CHEMICAL PROCESSING
    • 混合化学处理装置和方法
    • US20070151514A1
    • 2007-07-05
    • US11680995
    • 2007-03-01
    • LING CHENVincent KuMei ChangDien-Yeh WuHua Chung
    • LING CHENVincent KuMei ChangDien-Yeh WuHua Chung
    • C23C16/00
    • C23C16/45544C23C16/45502C23C16/45504C23C16/45508C23C16/45512C23C16/45561C23C16/45582C23C16/54
    • In one embodiment, an apparatus for performing an atomic layer deposition process is provided which includes a chamber body having a substrate support, a lid assembly attached to the chamber body, and delivery sub-assemblies coupled to the lid assembly and configured to deliver process gases into a centralized expanding conduit, which extends through the lid assembly and expands radially outward. The first gas delivery sub-assembly contains an annular mixing channel encircling and in fluid communication with the centralized expanding conduit, wherein the annular mixing channel is adapted to deliver a first process gas through a plurality of passageways and nozzles and into the centralized expanding conduit. A first gas inlet may be coupled to the annular mixing channel and positioned to provide the first process gas to the annular mixing channel. The second gas delivery sub-assembly contains a second gas inlet in fluid communication to the centralized expanding conduit.
    • 在一个实施例中,提供了一种用于执行原子层沉积工艺的装置,其包括具有基板支撑件的室主体,附接到室主体的盖组件和联接到盖组件的输送子组件,并且构造成输送工艺气体 进入集中扩展的管道,其延伸穿过盖组件并径向向外扩张。 第一气体输送子组件包含环形混合通道,环形混合通道环绕并与中央膨胀导管流体连通,其中环形混合通道适于将第一工艺气体通过多个通道和喷嘴输送到集中扩展管道中。 第一气体入口可以联接到环形混合通道并且定位成将第一工艺气体提供给环形混合通道。 第二气体输送子组件包含与集中扩张导管流体连通的第二气体入口。
    • 9. 发明申请
    • RATE CONTROL PROCESS FOR A PRECURSOR DELIVERY SYSTEM
    • 前置递送系统的速率控制过程
    • US20080044573A1
    • 2008-02-21
    • US11877503
    • 2007-10-23
    • LING CHENPhillip KangSeshadri Ganguli
    • LING CHENPhillip KangSeshadri Ganguli
    • C23C16/44
    • C23C16/52C23C16/4481H01L21/28556
    • Embodiments of the invention provide a method for monitoring and controlling delivery of a precursor from an ampoule in a process chamber. In one embodiment, the method provides flowing a first carrier gas at a first flow rate through a vessel containing a chemical precursor to form a first precursor gas, combining a second carrier gas at a second flow rate and the first precursor gas to form a second precursor gas, measuring a concentration of the chemical precursor within the second precursor gas, and calculating a mass flow rate of the chemical precursor. In one example, a tantalum-containing film is deposited on a substrate during an atomic layer deposition process by heating an ampoule containing pentakis(dimethylamido) tantalum to a temperature within a range from about 60° C. to about 75° C., and forming a precursor gas by flowing a carrier gas through the ampoule.
    • 本发明的实施方案提供了一种用于监测和控制来自处理室中的安瓿的前体递送的方法。 在一个实施方案中,该方法提供了使第一载气以第一流速流过包含化学前体的容器以形成第一前体气体,将第二载气与第一前体气体组合,形成第二载气 前体气体,测量第二前体气体内的化学前体的浓度,以及计算化学前体的质量流量。 在一个实例中,在原子层沉积工艺期间,通过将含有五(二甲基氨基)钽的安瓿加热至约60℃至约75℃的温度,将含钽的膜沉积在基板上,以及 通过使载气流过安瓿来形成前体气体。
    • 10. 发明申请
    • DEPOSITION PROCESSES FOR TUNGSTEN-CONTAINING BARRIER LAYERS
    • 用于含铁包层的沉积工艺
    • US20080008823A1
    • 2008-01-10
    • US11844125
    • 2007-08-23
    • LING CHENMei Chang
    • LING CHENMei Chang
    • C23C16/00
    • H01L21/76849C23C16/34C23C16/45525H01L21/28562Y10T29/49124Y10T29/49126Y10T29/49155
    • In one embodiment, a method for forming a barrier material on a substrate is provided which includes exposing a dielectric layer on the substrate to a plasma during a preclean process, wherein the dielectric layer contains a feature having sidewalls and a bottom surface, and depositing a tungsten-containing barrier material containing tungsten nitride on the sidewalls and the bottom surface of the feature during a cyclic layer deposition process. The method further provides depositing a metal-containing seed layer on the tungsten-containing barrier material and depositing a metal-containing layer over the metal-containing seed layer to fill the feature. In another embodiment, the method provides conducting the cyclic layer deposition process within a process chamber having an expanding channel centralized above a substrate support and having a bottom surface sized and shaped to substantially cover the substrate, and sequentially exposing the substrate to precursor gases flowing from the expanding channel during the cyclic layer deposition process.
    • 在一个实施例中,提供了一种在衬底上形成阻挡材料的方法,其包括在预清洗工艺期间将衬底上的电介质层暴露于等离子体,其中介电层包含具有侧壁和底表面的特征, 在循环层沉积工艺期间在该特征的侧壁和底表面上含有氮化钨的含钨阻挡材料。 该方法进一步提供在含钨屏障材料上沉积含金属种子层并在含金属种子层上沉积含金属层以填充该特征。 在另一个实施方案中,该方法提供了在处理室内进行循环层沉积工艺,其具有集中在衬底支撑件上方的扩展通道,并具有大小和形状以基本上覆盖衬底的底表面,并且将衬底依次暴露于从 在循环层沉积过程中的扩展通道。