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    • 4. 发明授权
    • Heat insulating container
    • 隔热容器
    • US5335809A
    • 1994-08-09
    • US187261
    • 1994-01-27
    • Shoji ToidaSeiichi ItoHidetoshi OhtaIsao Ishikawa
    • Shoji ToidaSeiichi ItoHidetoshi OhtaIsao Ishikawa
    • A47J41/00A47J41/02B65D81/38
    • B65D81/3881A47J41/0011A47J41/028Y10S220/903
    • A heat-insulating container comprising a cylindrical container having a heat-insulating layer disposed between a metal inner cylinder and a metal outer cylinder; a synthetic resin inner case with a wide mouth, in the straight cylindrical container; and a cap for closing the upper opening of the straight cylindrical container. The cap has a heat-insulating plug member fitted in the mouth of the inner case, with a plug member having an inner surface provided with an engagement portion for abutting the upper peripheral edge of a large-diameter container placed in inner case and a recess of a small-diameter storage container placed in the inner case, the inner case having a bottom provided with an engagement portion, which abuts the lower peripheral edge of the large-diameter storage container and a recess for receiving the lower portion of the small-diameter storage container.
    • 1.一种隔热容器,其特征在于,具有:设置在金属内筒和金属外筒之间的隔热层的筒状容器; 在直圆柱形容器中具有宽口的合成树脂内壳; 以及用于封闭直圆柱形容器的上开口的盖。 盖具有装配在内壳的口部中的隔热塞构件,插塞构件具有设置有用于抵接放置在内壳中的大直径容器的上周边的接合部的内表面和凹部 设置在内壳体中的小直径存储容器的内壳体具有设置有接合部的底部,该接合部邻接大直径存储容器的下周缘,以及用于容纳小直径存储容器的下部的凹部, 直径存储容器。
    • 5. 发明授权
    • Acoustic microscope
    • 声学显微镜
    • US4577504A
    • 1986-03-25
    • US601960
    • 1984-04-19
    • Hiroshi KandaIsao Ishikawa
    • Hiroshi KandaIsao Ishikawa
    • G01N29/06G01H3/12G01S15/89G01N29/00
    • G01S15/8906G01H3/125
    • An acoustic microscope of the type of mechanical scanning in which a single transducer works to generate an acoustic beam as well as to detect echoes reflected from the specimen. An echo reflected from an interface between an acoustic lens and an acoustic propagation medium is detected, and the detected intensity is used as a reference to display the distribution of attenuation factors of the specimen in a two-dimensional manner. Among the signals representing the distribution of attenuation factors of the specimen, furthermore, only those signals having intensities that lie within a predetermined range are displayed to obtain a picture of the specimen that represents the distribution of attenuation factors of a predetermined range only.
    • 机械扫描类型的声学显微镜,其中单个换能器工作以产生声束以及检测从样本反射的回波。 检测从声透镜和声传播介质之间的界面反射的回波,并且将检测的强度用作参考,以二维方式显示样品的衰减因子的分布。 在表示试样的衰减因子分布的信号中,仅显示具有处于预定范围内的强度的信号,以获得仅表示预定范围的衰减因子分布的样本的图像。
    • 6. 发明授权
    • Acoustic microscope
    • 声学显微镜
    • US4563898A
    • 1986-01-14
    • US586806
    • 1984-03-06
    • Hiroshi KandaKageyoshi KatakuraIsao Ishikawa
    • Hiroshi KandaKageyoshi KatakuraIsao Ishikawa
    • G01H3/12G01N29/06G01N29/00
    • G01H3/125G01N29/06
    • An acoustic microscope comprising an acoustic transducer which performs both generation and detection of acoustic wave beams, and a sample holding member which opposes to an acoustic wave transmitting and receiving surface of the transducer, to hold an object sample through an acoustic wave propagating medium and to offer behind the sample a layer of an acoustic impedance unequal to that of the sample, so that the sample holding member is moved in parallel, thereby to detect acoustic waves reflected from front and rear surfaces of the sample and acoustic waves reflected from a surface of the sample holding member without reaching the sample and to measure amplitudes and returning periods of time of the reflected acoustic waves, so as to measure the velocity of sound through the sample of unknown thickness, the acoustic impedance of the sample, etc. from the measured values.
    • 一种声学显微镜,包括执行声波波束的产生和检测的声换能器,以及与所述换能器的声波发射和接收表面相对的样本保持构件,以通过声波传播介质保持对象样本,并且 在样品后面提供与样品不同的声阻抗层,使得样品保持构件平行移动,从而检测从样品的前表面和后表面反射的声波以及从样品的表面反射的声波 样品保持构件未到达样品并测量反射声波的振幅和返回时间段,以便测量来自测量的未知厚度样品的声音速度,样品的声阻抗等 价值观。
    • 9. 发明授权
    • Charged-particle analyzer
    • 充电粒子分析仪
    • US4135088A
    • 1979-01-16
    • US810970
    • 1977-06-28
    • Isao IshikawaMichiyasu ItohKatsuhisa Usami
    • Isao IshikawaMichiyasu ItohKatsuhisa Usami
    • G01N23/227G01N23/225G05B7/02H01J49/44H01J49/48H01J39/00
    • G01N23/225H01J49/482H01J2237/05
    • A charged-particle beam correction arrangement for a charged-particle analyzer having deflecting electrodes which focus charged particles emitted from a sample onto a center axis, an extension thereof, or onto an identical circumference with its center on the axis, a slit which is disposed at the focus point, and an energy analyzer whose object point lies at the focus point. The charged-particle beam correction arrangement is disposed axially symmetrically in the vicinity of the path of the charged particles between the sample and the slit to correct a deformation in the focusing of the charged-particle beam. BACKGROUND OF THE INVENTIONThe present invention relates to a charged-particle analyzer.For the analysis of a feeble electron beam of low energy, such as Auger electrons and photoelectrons in the surface analysis, it is important to efficiently utilize the electrons emitted from a sample. Accordingly, it is necessary that the accepted solid angle (= the solid angle of electron rays entering an analyzing system/the entire solid angle of electron rays emitted from a sample) be wide.As an optimum structure based on such requirement, an analyzing equipment shown in FIG. 1 has been proposed (Japanese Patent Application No. 12283/76). The feature of this equipment is that a deflecting system consisting of two inner and outer electrodes is arranged axially symmetrically around a sample and that signals emitted from the sample and entering the deflecting system are caused to depict a greatly curved track, whereupon they are focused on the center axis of the equipment or a circumference with its center on the axis again. Further, at a stage succeeding the deflecting system, an analyzing system is arranged in such electrooptical relation that the point of the above focusing is considered as the emission point of the signals. Thus, an energy analysis of photo-electrons, Auger electrons, etc. is carried out.FIG. 1 is a constructional view showing the prior art equipment described above including an electron gun. An electron beam 2 produced from the electron gun is focused by a focusing lens 3, and irradiates a sample 4. Charged particles 5, such as Auger electrons, are emitted from the irradiated point P of the sample 4 in substantially the COS-Law spacial distribution. Among the charged particles, rays of electrons are surrounded by two cones whose vertexes are the point P and whose half vertical angles are .theta. + a and .theta. - a, which rays enter between deflecting electrodes 6 and 7. The deflecting electrodes 6 and 7 are disposed axially symmetrically and are L-shaped in section so as to form a double electrode system.Within the deflecting electrode system, the rays of electrons depict greatly curved tracks owing to a deflecting electric field. Further, the rays of electrons have the tracks corrected by an auxiliary electrode 8 and are converged in the first order of the angle a onto a slit 9 situated at a stage succeeding the auxiliary electrode 8. After passing through the slit 9, the rays travel so as to cross on the axis of the equipment. They are subjected then to the energy analysis by a cylindrical mirror type analyzer 10 arranged after the slit 9 with only electrons having certain specific energy being converged onto a detection slit 9' which is placed on the axis, signals being detected by a detector 11 which is disposed behind the detecting slit 9'.The energy analysis of the charged particles 5 emitted from the sample becomes possible in such a way that voltages to be applied to the deflecting electrodes 6, 7, the auxiliary electrode 8, and the electrode of the cylindrical mirror type analyzer 10 are appropriately selected with divider resistances 12, 13 and 14 connected to a power source 20 and then scanned at a fixed ratio.When it is desired to have a high sensitivity of analysis utilizing the aforedescribed analyzing system, the signal obtained from the sample must of course be received at the widest possible accepted solid angle as stated above. Additionally, the loss of signal between the deflecting system and the slit must be confined to a minimum. To this end, it is necessary that the rays of electrons at the time when they pass through the slit 9 have the best possible circularity so as to reduce the amount to which the rays are intercepted by the end face of the slit 9.In this respect, a glass plate coated with a phosphor was placed at the position of the slit 9 in the aforedescribed equipment, and the shape of the rays of electrons focused on this point was directly observed. It was determined that the rays of electrons were not truly circular, but rather often presented a ring shape deformed in one direction or a shape having a long tail at a certain part.The cause therefor was studied, and has been revealed to be a kind of electrooptical astigmatism attributed to the fact that the electrodes were not fixed coaxially or that the parallelism of each electrode was not maintained. Therefore, in constructing the equipment, careful attention was pair to the finish precision of the electrodes and the assembling was carefully executed. While considerable improvements were thus effected, it has been determined that a satisfactory result has not been attained.SUMMARY OF THE INVENTIONAn object of the present invention is to provide an improved charged-particle analyzer.Another object of the present invention is to provide a charged-particle analyzer which makes it possible to set a wide accepted solid angle for signals and to attach a sample of large area without greatly decreasing the accepted solid angle.These and other objects are attained by a charged-particle analyzer having an irradiation device for irradiating a sample with a primary beam, a deflecting electrode system for focusing charged particles emitted from the sample onto the center axis of the primary beam or an extension thereof or onto an identical circumference with its center located on the axis or the extension, a slit which is disposed at the focus point of the charged particles, an energy analyzing system whose object point lies at the focus point, a detector for detecting the charged particles analyzed by the energy analyzing system, and a charged-particle beam correction arrangement disposed axially symmetrically in the vicinity of the path of the charged particles between the sample and the slit.