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    • 1. 发明授权
    • Overmold integrated circuit package
    • 封装集成电路封装
    • US06519844B1
    • 2003-02-18
    • US09940130
    • 2001-08-27
    • Kumar NagarajanSeng Sooi LimChok J. Chia
    • Kumar NagarajanSeng Sooi LimChok J. Chia
    • H05K330
    • H01L24/32H01L23/13H01L23/3128H01L2224/16225H01L2224/27013H01L2224/32225H01L2224/73204H01L2224/83051H01L2224/83385H01L2924/01005H01L2924/01006H01L2924/01033H01L2924/01075H01L2924/01082H01L2924/14H01L2924/15151H01L2924/15311H01L2924/181H01L2924/1815Y10T29/49144Y10T29/49146H01L2924/00
    • An integrated circuit package manufacturing process is described which reduces or eliminates the formation of voids in a molding compound between a die and an underlying substrate. The process includes providing the substrate, which has an upper surface and an air space above the upper surface. Electrically conductive vias are formed through the upper surface of the substrate which extend at least partially through the substrate, and fluid communication is provided between the vias and the overlying air space. The process includes attaching the integrated circuit die to the upper surface of the substrate over at least a portion of the vias, while leaving a gap between the die and the upper surface of the substrate. The process further includes flowing the molding compound into the gap between the die and the upper surface of the substrate while maintaining fluid communication between the vias and the air space. In this manner, air trapped between the molding compound and the upper surface of the substrate is urged to flow into the vias rather than forming a void in the molding compound. Fluid communication between the plurality of vias and the air space may be provided by not tenting the vias with a solder mask layer, or by removing any solder mask or other material which may have filled or tented over the vias during processing of the substrate.
    • 描述了一种集成电路封装制造工艺,其减少或消除了在管芯和下层衬底之间的模塑料中形成空隙。 该方法包括提供在上表面上方具有上表面和空气空间的基底。 导电孔通过衬底的上表面形成,其至少部分延伸通过衬底,并且在通孔和上覆空气空间之间提供流体连通。 该过程包括在集成电路管芯的至少一部分通孔之上附接集成电路管芯到衬底的上表面,同时在管芯和衬底的上表面之间留下间隙。 该方法还包括使模塑料流动到模具和衬底的上表面之间的间隙中,同时保持通孔和空气空间之间的流体连通。 以这种方式,被迫在模塑料和衬底的上表面之间被捕获的空气被迫流入通孔,而不是在模塑料中形成空隙。 多个通孔和空气空间之间的流体连通可以通过不用通孔焊接掩模层来提供,或者通过在衬底的处理期间移除可能已经填充或覆盖过孔的任何焊接掩模或其他材料来提供。
    • 3. 发明授权
    • Multi-chip package having a contiguous heat spreader assembly
    • 具有连续散热器组件的多芯片封装
    • US06963129B1
    • 2005-11-08
    • US10464178
    • 2003-06-18
    • Thomas EvansStan MihelcicLeah M. MillerKumar NagarajanEdwin M. Fulcher
    • Thomas EvansStan MihelcicLeah M. MillerKumar NagarajanEdwin M. Fulcher
    • H01L23/10H01L23/34H01L23/36H01L25/065
    • H01L23/36H01L25/0655H01L2224/16225H01L2224/32245H01L2224/73253H01L2924/15153H01L2924/1517H01L2924/15311H01L2924/16195H01L2924/19105
    • A system and method are provided for forming a multi-chip package. The multi-chip package includes a multi-layer substrate and a heat spreader of single, unibody construction. At least two integrated circuits are coupled between the multi-layer substrate and the heat spreader. The integrated circuits are spaced from one another to allow airflow between those circuits and a portion of the underside surface of the heat spreader. Depending on the layout of the package, a passive device can also be placed in the space between integrated circuits. The passive device extends upward a spaced distance from the underneath surface of the heat spreader so as not to block the airflow therebetween. The multi-chip package can accommodate integrated circuits that are either all packaged, all unpackaged, or a combination of each. If packaged and unpackaged integrated circuits are placed on the multi-layer substrate, the heat spreader can extend in two separate planes to accommodate the different thicknesses of those packaged and unpackaged integrated circuits. Alternatively, a second heat spreader can be placed on a relatively thin integrated circuit so that the upper surface of the second heat spreader is coplanar with an upper surface of a relatively thick integrated circuit. This will allow a planar heat spreader to be arranged across the thick integrated circuit and the second heat spreader. In all instances, however, the heat spreader extends as a single, contiguous unibody element across the entire multi-chip package.
    • 提供了一种用于形成多芯片封装的系统和方法。 多芯片封装包括多层基板和单一单体结构的散热器。 至少两个集成电路耦合在多层基板和散热器之间。 集成电路彼此间隔开,以允许这些电路之间的气流和散热器的下表面的一部分。 根据封装的布局,无源器件也可放置在集成电路之间的空间中。 被动装置从散热器的下表面向上延伸一定距离,以便不阻挡散热器之间的气流。 多芯片封装可以容纳所有封装,所有未封装的封装或各自的组合的集成电路。 如果封装和未封装的集成电路放置在多层基板上,散热器可以在两个独立的平面中延伸,以适应那些封装和未封装的集成电路的不同厚度。 或者,可以将第二散热器放置在相对薄的集成电路上,使得第二散热器的上表面与相对较厚的集成电路的上表面共面。 这将允许平面散热器布置在厚集成电路和第二散热器之间。 然而,在所有情况下,散热器在整个多芯片封装上延伸为单个,连续的一体元件。
    • 4. 发明授权
    • Electrostatic discharge protection
    • 静电放电保护
    • US06911736B2
    • 2005-06-28
    • US10456281
    • 2003-06-06
    • Kumar Nagarajan
    • Kumar Nagarajan
    • H01L23/498H01L23/50H01L23/538H01L23/52
    • H01L23/60H01L23/49816H01L23/50H01L23/5382H01L2224/05571H01L2224/05573H01L2224/16H01L2924/00014H01L2924/15311H01L2224/05599
    • A package substrate that is adapted to receive at least one subject integrated circuit having a subject contact pattern, where the subject integrated circuit is selected from a design set of integrated circuits. The package substrate has an upper surface with electrically conductive bump contacts in a bump array. The bump array is configured to provide electrical connections to all possible integrated circuit contact patterns in the design set of integrated circuits. A lower surface of the package substrate has electrically conductive ball contacts in a ball array. One each of the bump contacts is electrically connected to one each of the ball contacts through the package substrate. An electrically conductive ground plane is disposed between the upper surface and the lower surface. Grounding contacts are disposed adjacent the ball contacts, where the grounding contacts are electrically connected to the ground plane. The grounding contacts are adapted to electrically short a given ball contact to the ground plane when the bump contact electrically connected to the given ball contact is not used by the subject contact pattern of the subject integrated circuit.
    • 适用于接收至少一个具有主题接触图案的被摄体集成电路的封装基板,其中所述主体集成电路从集成电路的设计集合中选择。 封装衬底具有在凸起阵列中具有导电凸起接触的上表面。 凸块阵列被配置为提供与集成电路的设计集合中的所有可能的集成电路接触图案的电连接。 封装衬底的下表面具有球阵列中的导电球接触。 每个凸块触点中的每一个通过封装基板电连接到每个滚珠触点。 导电接地平面设置在上表面和下表面之间。 接地触点设置在球触点附近,其中接地触头电连接到接地平面。 接地触头适合于当与主体集成电路的主体接触图案不使用电连接到给定球接触点的凸点接触时,将给定的球接触电地短路到接地平面。
    • 9. 发明授权
    • Stiffener design
    • 加固设计
    • US06825066B2
    • 2004-11-30
    • US10308310
    • 2002-12-03
    • Yogendra RanadeAnand GovindKumar NagarajanFarshad GhahghahiAritharan Thurairajaratnam
    • Yogendra RanadeAnand GovindKumar NagarajanFarshad GhahghahiAritharan Thurairajaratnam
    • H01L2144
    • H01L23/04H01L23/50H01L25/165H01L2924/0002H01L2924/1433H01L2924/00
    • A stiffener for reinforcing a package integrated circuit. The stiffener includes a rigid planar element having a first surface for bonding to a package substrate. The rigid planar element forms a major interior aperture for receiving and surrounding an integrated circuit on all sides of the integrated circuit. The rigid planar element also forms a minor interior aperture for receiving and surrounding a secondary circuit structure on at least three sides of the secondary circuit structure. In this manner, the stiffener provides structural support to the integrated circuit package, which reduces and preferably eliminates twisting and warping of the substrate package as it heats and is subjected to other stresses. Because the major interior apertures does not need to be large enough to fit both the monolithic integrated circuit and the secondary circuit structure, there is more stiffener material available to provide structural support than there would be if the major interior aperture was large enough to fit both the monolithic integrated circuit and the secondary circuit structure.
    • 用于加强封装集成电路的加强件。 加强件包括刚性平面元件,其具有用于结合到封装基板的第一表面。 刚性平面元件形成用于在集成电路的所有侧面上接收和围绕集成电路的主要内部孔。 刚性平面元件还形成次要内孔,用于在次级电路结构的至少三侧上接收和围绕次级电路结构。 以这种方式,加强件提供对集成电路封装的结构支撑,其降低并优选地消除了衬底封装在其加热并经受其它应力时的扭曲和翘曲。 因为主要内部孔径不需要足够大以适合单片集成电路和次级电路结构,所以有更多的加强材料可用于提供结构支撑,如果主要内部孔径足够大以适合于两者 单片集成电路和二次电路结构。