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    • 6. 发明授权
    • Light emitting compositional semiconductor device
    • 发光组合半导体器件
    • US5057881A
    • 1991-10-15
    • US444194
    • 1989-11-30
    • Hans LobentanzerWolfgang StolzKlaus PloogJulien Nagle
    • Hans LobentanzerWolfgang StolzKlaus PloogJulien Nagle
    • H01L33/06H01S5/00H01S5/34
    • H01L33/06B82Y20/00H01S5/34
    • A multiple quantum well light emitting compositional semiconductor device ch as a laser diode or a light emitting diode has an active region comprising an alternating sequence of layers of well layer material and of barrier layer material. The thickness of the barrier layer and of the adjacent well layers is chosen such that for one type of charge carrier a relatively high probability exists for such charge carriers to be present in the barrier region whereas the other type of charge carriers are localized in the potential wells. In this way it is possible to reduce the probability of non-radiative Auger recombination processes occurring thus reducing the threshold current and increasing the quantum efficiency of the device. This is particularly important since material systems with a small bandgap which lase at long wavelengths suitable for optical fibre transmission normally suffer performance penalties due to non-radiative Auger recombination and these penalties can be substantially reduced by tailoring the layer thicknesses to achieve the described probability distributions.
    • 诸如激光二极管或发光二极管的多量子阱发光组合半导体器件具有包括阱层材料层和势垒层材料的交替序列的有源区。 选择阻挡层和相邻阱层的厚度,使得对于一种类型的电荷载体,存在这样的电荷载流子存在于阻挡区域中的相对高的概率,而另一种类型的载流子被定位在电位 井。 以这种方式,可以降低发生的非辐射俄歇复合过程的可能性,从而降低阈值电流并提高器件的量子效率。 这是特别重要的,因为具有适用于光纤传输的长波长的小带隙的材料系统通常由于非辐射俄歇复合而遭受性能惩罚,并且通过调整层厚度可以显着减少这些惩罚以实现所描述的概率分布 。