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    • 4. 发明授权
    • Semiconductor differential pressure measuring device
    • 半导体差压测量装置
    • US5959213A
    • 1999-09-28
    • US891105
    • 1997-07-10
    • Kyoichi IkedaTetsuya WatanabeSatoshi FukuharaTakashi YoshidaHideo Tsukamoto
    • Kyoichi IkedaTetsuya WatanabeSatoshi FukuharaTakashi YoshidaHideo Tsukamoto
    • G01L9/00G01L9/06G01L13/02G01L19/04G01L9/04
    • G01L13/025G01L15/00G01L9/0054G01L9/045
    • A semiconductor differential pressure measuring device comprising two measurement diaphragms and two detection sensors provided in a semiconductor substrate using micromachining techniques, and a computing circuit which computes the differences between the two sensor outputs, wherein a communicating hole is provided for applying pressure to each diaphragm so that the diaphragms operate in opposite phases by differential pressure, and two detecting sensors are provided on each diaphragm for detecting displacement or strain of each diaphragm caused by the differential pressure applied to the respective diaphragm, whereby detecting the differences in displacement or strain cancels the static pressure error and temperature error so that the invention has excellent temperature and static pressure characteristics, and whereby the computing circuit comprises a bridge using the two detecting sensors, which substantially reduces the cost of the device.
    • 一种半导体差压测量装置,包括使用微加工技术设置在半导体衬底中的两个测量膜片和两个检测传感器,以及计算电路,其计算两个传感器输出之间的差异,其中设置有用于向每个隔膜施加压力的连通孔 膜片通过差压在相反的相位下工作,并且在每个隔膜上设置两个检测传感器,用于检测由施加到各个隔膜的差压引起的每个隔膜的位移或应变,由此检测位移或应变的差异消除了静态 压力误差和温度误差,使得本发明具有优异的温度和静压特性,并且由此计算电路包括使用两个检测传感器的桥,这大大降低了装置的成本。
    • 9. 发明授权
    • Wafer surface observing method and apparatus
    • 晶圆表面观察方法及装置
    • US08577119B2
    • 2013-11-05
    • US11698987
    • 2007-01-29
    • Hiroshi HigashiTetsuya WatanabeKenji Aiko
    • Hiroshi HigashiTetsuya WatanabeKenji Aiko
    • G06K9/00G01N21/00
    • G01N21/9501G01N21/9503
    • A wafer surface observing apparatus for inspecting a peripheral portion of an object has (A) a lens system and a CCD camera for taking images of the peripheral portion of the object, (B) storage for storing image data about the taken images, and (C) display for displaying the image data stored in the storage device. In particular, the present apparatus can have functions of rotating the object placed on a prealignment portion, recording images of one full outer periphery of an end portion of the object by the lens system and CCD camera into the location where the orientation flat portions or notched portions of the object are placed in position, accepting the images into the storage device, and displaying the images on a CRT.
    • 用于检查物体的周边部分的晶片表面观察装置具有(A)用于拍摄物体的周边部分的图像的透镜系统和CCD照相机,(B)用于存储关于拍摄图像的图像数据的存储器和( C)显示用于显示存储在存储装置中的图像数据。 具体地说,本装置具有使放置在预对准部上的物体旋转的功能,通过透镜系统和CCD照相机将物体的端部的一个完整外周的图像记录到定位平面部分或切口的位置 将物体的部分放置在适当位置,将图像接收到存储装置中,并将图像显示在CRT上。