会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明授权
    • Evaluation and amplifier circuit
    • 评估和放大电路
    • US5731718A
    • 1998-03-24
    • US723847
    • 1996-09-30
    • Johann Rieger
    • Johann Rieger
    • G11C11/417G11C7/06G11C11/409G11C11/4091G01C7/00
    • G11C11/4091G11C7/065
    • An evaluation and amplifier circuit of the type of a keyed flipflop including at least two first transistors of a given channel type connected in series to each other disposed between first and second signal lines, has a connection from the gates of the first transistors to a respective one of the second and first signal lines. The first two transistors respectively form a first node common to the first two transistors for receiving a first control signal. A series circuit has at least two second transistors of the same channel type as the first transistors being connected in parallel to the first transistors, The gates of the first transistors are further connected with a respective one of the second and first signal lines. Furthermore, the amplifier circuit includes the feature that the second transistors form a second node common to the second transistors for receiving a second control signal, and a differential signal appearing on the signal lines is evaluated and amplified by the second transistors after the first transistors have received the differential signal.
    • 具有连接在第一和第二信号线之间的彼此串联连接的给定沟道类型的至少两个第一晶体管的键控触发器类型的评估和放大器电路具有从第一晶体管的栅极到相应的第一晶体管的连接 第二和第一信号线之一。 前两个晶体管分别形成用于接收第一控制信号的前两个晶体管公共的第一节点。 串联电路具有与第一晶体管并联连接的至少两个与第一晶体管并联的沟道类型的第二晶体管。第一晶体管的栅极与第二和第一信号线中的相应一个进一步连接。 此外,放大器电路包括第二晶体管形成用于接收第二控制信号的第二晶体管公共的第二节点的特征,并且在第一晶体管具有第一晶体管之后,出现在信号线上的差分信号由第二晶体管评估和放大 接收差分信号。
    • 5. 发明授权
    • Method for checking a semiconductor memory device
    • 用于检查半导体存储器件的方法
    • US06366511B2
    • 2002-04-02
    • US09910745
    • 2001-07-23
    • Johann RiegerThomas Von Der Ropp
    • Johann RiegerThomas Von Der Ropp
    • G11C700
    • G11C29/028G11C11/401G11C29/50G11C2029/5004
    • A method for checking a semiconductor memory device integrated on a semiconductor chip includes providing the semiconductor memory device with a plurality of memory cells each being disposed on a semiconductor substrate for one binary information value, data lines for reading out and writing in information values, gate transistors being associated with the memory cells for selectively clearing a data path between a given memory cell and a data line, selection lines for purposefully triggering the gate transistors, and at least one in-chip reference voltage being adjusted to a predetermined normal value when the semiconductor memory device is functioning as intended. The method for checking the semiconductor memory device integrated on a semiconductor chip is carried out by at least intermittently varying the at least one in-chip reference voltage, and detecting and weighting the information values read out at the at least intermittently varied reference voltage.
    • 一种用于检查集成在半导体芯片上的半导体存储器件的方法包括:为半导体存储器件提供多个存储单元,每个存储单元分别设置在半导体衬底上用于一个二进制信息值,用于读出和写入信息值的数据线,门 晶体管与存储器单元相关联,用于选择性地清除给定存储单元和数据线之间的数据通路,用于有目的地触发栅极晶体管的选择线,以及至少一个片上参考电压被调整到预定正常值时 半导体存储器件按预期工作。 用于检查集成在半导体芯片上的半导体存储器件的方法至少间歇地改变至少一个片上参考电压,并且检测和加权在至少间歇变化的参考电压读出的信息值。
    • 7. 发明授权
    • Bootstrap circuit and integrated memory circuit having the bootstrap
circuit
    • 自举电路和具有自举电路的集成存储器电路
    • US5783962A
    • 1998-07-21
    • US679372
    • 1996-07-08
    • Johann Rieger
    • Johann Rieger
    • G11C11/407G11C5/14G11C8/08H03K17/06H03K17/16
    • H03K17/063G11C5/145G11C8/08
    • A bootstrap circuit includes a transfer transistor and a driver transistor of the same channel type each having two channel terminals and a gate. A first signal terminal receives a first signal and a second signal terminal receives a second signal. One of the channel terminals of the transfer transistor is connected to the gate of the driver transistor. The other of the channel terminals of the transfer transistor is connected to the first signal terminal. One of the channel terminals of the driver transistor is connected to the second signal terminal. The other of the channel terminals of the driver transistor forms an output of the bootstrap circuit. A configuration generates a third signal and has an output connected to the gate of the transfer transistor. The second signal has an edge extending from a first level to a second level and beginning at a bootstrap time. The first signal has a precharging level between the first level and the second level of the second signal occurring no later than another time being at the latest equal to the bootstrap time. After the other time, the third signal has a first level being equal to or located on the other side of the level of the first signal as seen from the second level of the second signal. Before the other time, the third signal has a second level being on the same side of the precharging level of the first signal as seen from the second level of the second signal.
    • 自举电路包括传输晶体管和具有两个通道端子和栅极的相同通道类型的驱动器晶体管。 第一信号终端接收第一信号,第二信号终端接收第二信号。 传输晶体管的通道端子之一连接到驱动晶体管的栅极。 传输晶体管的另一个通道端子连接到第一信号端子。 驱动晶体管的通道端子之一连接到第二信号端子。 驱动器晶体管的另一个通道端子形成自举电路的输出。 配置产生第三信号并且具有连接到传输晶体管的栅极的输出。 第二信号具有从第一级延伸到第二级的边缘并且在引导时间开始。 所述第一信号具有在所述第二信号的所述第一电平和所述第二电平之间的预充电电平不迟于等于所述自举时间的另一时间。 在另一时间之后,第三信号具有与第二信号的第二电平相同的第一电平等于或位于第一信号的电平的另一侧。 在另一时间之前,第三信号具有与第二信号的第二电平相似的第一信号的预充电电平的同一侧。
    • 8. 发明授权
    • Integrated semiconductor memory with redundancy arrangement
    • 具有冗余布置的集成半导体存储器
    • US5459690A
    • 1995-10-17
    • US920315
    • 1992-08-17
    • Johann RiegerJohann Stecker
    • Johann RiegerJohann Stecker
    • G11C29/00G06F20060101G06F11/16G11C20060101G11C7/00G11C29/04
    • G11C29/781G11C29/806G11C29/808G11C29/846
    • An integrated semiconductor memory has a block decoder BKDEC having block selection signals BKS and a plurality of main memory area block units BK which can be individually activated. The main memory area block units BK contain memory locations which can be selected via word and bit lines NWL, NBL, NBL and redundancy memory locations RMC, which can be selected via redundancy word lines RWL. The main memory area block units BK contain programmable redundancy block decoders RBK, which in conjunction with redundancy word line decoders RWDEC enable the selection of redundancy word lines RWL. If a redundancy word line RWL is to be selected, it is exclusively that main memory area block unit BK in which the redundancy word line RWL that is to be selected is contained that is activated. In this case, activation which is otherwise usual is suppressed via an appropriate block selection signal BKS. It is rendered possible in this way that the redundancy word line RWL that is to be selected together with its redundancy memory locations RMC can be arranged in a different main memory area block unit BK from the memory locations to be replaced together with their normal word lines NWL, but also in an (any) other main memory area block unit BK. It is possible in this way to increase the yield in the production of integrated semiconductor memories.
    • PCT No.PCT / DE92 / 00316 Sec。 371日期:1992年8月17日 102(e)日期1992年8月17日PCT提交1992年4月16日PCT公布。 出版物WO93 / 21578 日期为1993年10月28日。集成半导体存储器具有块解码器BKDEC,其具有块选择信号BKS和可单独激活的多个主存储区域块单元BK。 主存储器区块单元BK包含可以经由字线和位线NWL,NBL,&UPbar&N和冗余存储器位置RMC选择的存储器位置,其可以通过冗余字线RWL选择。 主存储区域块单元BK包含可编程冗余块解码器RBK,其与冗余字线解码器RWDEC一起使能冗余字线RWL的选择。 如果要选择冗余字线RWL,则仅包含被激活的要被选择的冗余字线RWL的主存储器区块单元BK。 在这种情况下,通过适当的块选择信号BKS来抑制否则通常的激活。 以这种方式可以使得要与其冗余存储器位置RMC一起选择的冗余字线RWL可以被布置在与要被替换的存储器位置不同的主存储区域块单元BK中,与其正常字线 NWL,也可以在(任何)其他主存储区块BK中。 以这种方式可以提高集成半导体存储器的生产中的产量。
    • 9. 发明授权
    • Device for fixing stock rails in railway switches as well as process for
fixing stock rails by means of such device
    • 用于固定铁路开关中的导轨的装置以及借助于这种装置固定导轨的工艺
    • US4981264A
    • 1991-01-01
    • US353025
    • 1989-05-17
    • Hermann OrascheJohann Rieger
    • Hermann OrascheJohann Rieger
    • E01B7/02E01B7/22
    • E01B7/02E01B7/22
    • In a device for fixing stock rails (1) in railway switches, including a base plate (2) for the stock rail (1) and a sliding chair (3) for the switch tongue mounted on the base plate and comprising an elongated spring element (6) for pressing down the rail foot and preferably having the shape of a plate, the spring element (6) can be introduced, preferably without tension, into a tunnel-shaped recess (5) provided in the sliding chair (3) and extending in a direction approximately normal to the stock rail. The upper edge of the tongue-shaped recess (5) within the sliding chair (3) extends, with the formation of a kink (13), in direction towards the rail foot steeper in upward direction that in an area (11) extending more flatly in front of the kink (13). A separate wedge (10) can, for the purpose of guying the spring element (6) against the rail foot, be driven in within the area (11) of flatter extension of the upper edge at a distance from the kink (13) of the upper edge. On account of the wedges presence, a progressive spring characteristic of the spring element (6) can easily be adapted to the requirements.
    • 在用于在铁路开关中固定库存轨道(1)的装置中,包括用于库存轨道(1)的基板(2)和用于安装在基板上的开关舌的滑动椅(3),并且包括细长的弹簧元件 (6)用于压下导轨脚并且优选地具有板的形状,弹簧元件(6)可以优选地没有张力地被引入设置在滑动椅子(3)中的隧道形凹部(5)中,并且 沿大致垂直于钢轨的方向延伸。 在滑椅(3)内的舌形凹部(5)的上边缘沿着朝向轨道脚的方向形成扭结(13),在向上方向上更陡,在更延伸的区域(11)中 在扭结前面(13)。 为了使弹簧元件(6)抵靠导轨脚,单独的楔形件(10)可以被驱动在与上边缘的平坦延伸区域(11)相距一定距离处 上边缘。 由于楔子存在,弹簧元件(6)的渐进弹簧特性可以容易地适应要求。
    • 10. 发明授权
    • Integrated semiconductor memory device
    • 集成半导体存储器件
    • US5675543A
    • 1997-10-07
    • US694533
    • 1996-08-09
    • Johann Rieger
    • Johann Rieger
    • G11C29/00G11C29/04G11C7/00
    • G11C29/80G11C29/846
    • Integrated semiconductor memory device having a semiconductor substrate with a redundant circuit arrangement formed thereon for replacing a defective memory cell of the integrated semiconductor memory device by selecting a redundant memory cell likewise disposed on the semiconductor substrate, the memory cells of the integrated semiconductor memory device being constructed and addressable in blocks; the redundant memory cells being combined into a redundant memory cell field addressable as a unit by the redundant circuit arrangement; and the redundant circuit arrangement having a redundant selection circuit for selecting a redundant memory cell from the redundant memory cell field to replace a defective memory cell from any of the memory cell blocks, includes a redundance control circuit forming part of the redundant circuit arrangement and enabling, as a function of a programmed redundant selection signal, one of the data content of a normal memory cell and the data content of a redundant memory cell suitably substituted in the event of a defect in the normal memory cell of the redundant memory cell field, the redundance control circuit being connected downstream from read amplifier circuits for reading out data from the normal memory cells and from read amplifier circuits for reading out redundant data from the redundant memory cells.
    • 一种集成半导体存储器件,具有形成有冗余电路装置的半导体衬底,用于通过选择同样设置在半导体衬底上的冗余存储单元来替换集成半导体存储器件的有缺陷的存储单元,所述集成半导体存储器件的存储单元为 构造和可寻址的块; 所述冗余存储单元被组合成冗余存储单元区域,所述冗余存储器单元可由所述冗余电路装置作为单元寻址; 并且所述冗余电路装置具有冗余选择电路,用于从所述冗余存储单元字段中选择冗余存储器单元以从任何存储单元块替换有缺陷的存储器单元,所述冗余选择电路包括冗余控制电路,其形成所述冗余电路装置的一部分并使能 作为编程冗余选择信号的函数,正常存储单元的数据内容之一和在冗余存储单元字段的正常存储单元中的缺陷的情况下适当替代的冗余存储单元的数据内容, 冗余控制电路连接在读取放大器电路的下游,用于从正常存储单元读出数据,并从读取放大器电路连接用于从冗余存储单元读出冗余数据。