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1. 发明授权

US07464307B2 High performance serial bus testing methodology 有权
标题翻译：高性能串行总线测试方法
公开(公告)号：US07464307B2
公开(公告)日：2008-12-09
申请号：US10396071
申请日：2003-03-25
申请人： Jay J. Nejedlo , Mike Wiznerowicz , David G. Ellis , Richard J. Glass , Andrew W. Martwick , Theodore Z. Schoenborn
发明人： Jay J. Nejedlo , Mike Wiznerowicz , David G. Ellis , Richard J. Glass , Andrew W. Martwick , Theodore Z. Schoenborn
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G01R31/3187 , G01R31/31717 , H04L1/242
摘要： According to one embodiment, a built-in self test (IBIST) architecture/methodology is disclosed. The IBIST provides for testing the functionality of an interconnect (such as a bus) between a transmitter and a receiver component. The IBIST architecture includes a pattern generator and a pattern checker. The pattern checker operates to compare a received plurality of bits (for the pattern generator) with a previously stored plurality of bits.
摘要翻译：根据一个实施例，公开了内置自检（IBIST）架构/方法。 IBIST提供测试发射机和接收机组件之间的互连（例如总线）的功能。 IBIST架构包括一个模式生成器和一个模式检查器。模式检查器操作以将接收到的多个比特（对于模式生成器）与先前存储的多个比特进行比较。

2. 发明授权

US08868992B2 Robust memory link testing using memory controller 有权
标题翻译：使用内存控制器的强大的内存链接测试
公开(公告)号：US08868992B2
公开(公告)日：2014-10-21
申请号：US12651252
申请日：2009-12-31
申请人： Bryan L. Spry , Theodore Z. Schoenborn , Philip Abraham , Christopher P. Mozak , David G. Ellis , Jay J. Nejedlo , Bruce Querbach , Zvika Greenfield , Rony Ghattas , Jayasekhar Tholiyil , Charles D. Lucas , Christopher E. Yunker
发明人： Bryan L. Spry , Theodore Z. Schoenborn , Philip Abraham , Christopher P. Mozak , David G. Ellis , Jay J. Nejedlo , Bruce Querbach , Zvika Greenfield , Rony Ghattas , Jayasekhar Tholiyil , Charles D. Lucas , Christopher E. Yunker
IPC分类号： G06F11/00 , G11C29/08
CPC分类号： G11C29/08 , G11C29/10 , G11C29/44
摘要： REUT (Robust Electrical Unified Testing) for memory links is introduced which speeds testing, tool development, and debug. In addition it provides training hooks that have enough performance to be used by BIOS to train parameters and conditions that have not been possible with past implementations. Address pattern generation circuitry is also disclosed.
摘要翻译：引入了用于存储器链接的REUT（鲁棒电气统一测试），可以加速测试，开发和调试。此外，它还提供了具有足够性能的训练钩子，以供BIOS使用，以训练过去实施中不可能的参数和条件。还公开了地址图案生成电路。

3. 发明授权

US06826100B2 Push button mode automatic pattern switching for interconnect built-in self test 失效
公开(公告)号：US06826100B2
公开(公告)日：2004-11-30
申请号：US10404405
申请日：2003-03-31
申请人： David G. Ellis , Bruce Querbach , Jay J. Nejedlo , Amjad Khan , Sean R. Babcock , Eric S. Gayles , Eshwar Gollapudi
发明人： David G. Ellis , Bruce Querbach , Jay J. Nejedlo , Amjad Khan , Sean R. Babcock , Eric S. Gayles , Eshwar Gollapudi
IPC分类号： G11C700
CPC分类号： G01R31/2853 , G01R31/31855 , G01R31/3187 , G06F11/27
摘要： A built-in self test (BIST) unit, of a primary integrated circuit (IC) component of a computer system, is programmed or hardwired with a test pattern. The test pattern is launched in multiple test cycles, to test an interconnect bus of the computer system or perform a device validation test of the component. A pin assignment of the pattern is automatically changed after each test cycle, without requiring re-programming of the BIST unit to do so.

4. 发明授权

US10198333B2 Test, validation, and debug architecture 有权
公开(公告)号：US10198333B2
公开(公告)日：2019-02-05
申请号：US13997182
申请日：2010-12-23
申请人： Mark B. Trobough , Keshavan K. Tiruvallur , Chinna B. Prudvi , Christian E. Iovin , David W. Grawrock , Jay J. Nejedlo , Ashok N. Kabadi , Travis K. Goff , Evan J. Halprin , Kapila B. Udawatta , Jiun Long Foo , Wee Hoo Cheah , Vui Yong Liew , Selvakumar Raja Gopal , Yuen Tat Lee , Samie B. Samaan , Kip C. Killpack , Neil Dobler , Nagib Z. Hakim , Brian Meyer , William H. Penner , John L. Baudrexl , Russell J. Wunderlich , James J. Grealish , Kyle Markley , Timothy S. Storey , Loren J. McConnell , Lyle E. Cool , Mukesh Kataria , Rahima K. Mohammed , Tieyu Zheng , Yi Amy Xia , Ridvan A. Sahan , Arun R. Ramadorai , Priyadarsan Patra , Edwin E. Parks , Abhijit Davare , Padmakumar Gopal , Bruce Querbach , Hermann W. Gartler , Keith Drescher , Sanjay S. Salem , David C. Florey
发明人： Mark B. Trobough , Keshavan K. Tiruvallur , Chinna B. Prudvi , Christian E. Iovin , David W. Grawrock , Jay J. Nejedlo , Ashok N. Kabadi , Travis K. Goff , Evan J. Halprin , Kapila B. Udawatta , Jiun Long Foo , Wee Hoo Cheah , Vui Yong Liew , Selvakumar Raja Gopal , Yuen Tat Lee , Samie B. Samaan , Kip C. Killpack , Neil Dobler , Nagib Z. Hakim , Brian Meyer , William H. Penner , John L. Baudrexl , Russell J. Wunderlich , James J. Grealish , Kyle Markley , Timothy S. Storey , Loren J. McConnell , Lyle E. Cool , Mukesh Kataria , Rahima K. Mohammed , Tieyu Zheng , Yi Amy Xia , Ridvan A. Sahan , Arun R. Ramadorai , Priyadarsan Patra , Edwin E. Parks , Abhijit Davare , Padmakumar Gopal , Bruce Querbach , Hermann W. Gartler , Keith Drescher , Sanjay S. Salem , David C. Florey
IPC分类号： G06F11/273 , G06F11/267
摘要： An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware hooks (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and debug of a part/platform under test. In essence, a complete test architecture stack is described herein for test, validation, and debug of electronic parts, devices, and platforms.

5. 发明授权

US07536267B2 Built-in self test for memory interconnect testing 有权
标题翻译：内置自检内存互连测试
公开(公告)号：US07536267B2
公开(公告)日：2009-05-19
申请号：US11289186
申请日：2005-11-28
申请人： David Zimmerman , Jay J. Nejedlo
发明人： David Zimmerman , Jay J. Nejedlo
IPC分类号： G01R31/00
CPC分类号： G11C29/16 , G11C5/04 , G11C29/02 , G11C29/025 , G11C2029/0401 , G11C2029/0405
摘要： In some embodiments, built-in self-test logic is provided for an integrated circuit (IC) device having memory controller logic to generate address and command information for accessing a memory device. Driver circuits are on-chip with the memory controller logic. The driver circuits have outputs that are coupled to on-chip signal pads, respectively. The BIST logic is coupled between the driver circuits and the controller logic. The BIST logic is to transmit, at speed, address and command information that has been generated by the controller logic using the driver circuits in a normal mode of operation for the device. In addition, the BIST logic is able to transmit, at speed, test symbols using the driver circuits in a test mode of operation for the IC device, during which a chip-to-chip connection between the IC device and another device is tested. Other embodiments are also described and claimed.
摘要翻译：在一些实施例中，为具有存储器控制器逻辑的集成电路（IC）设备提供内置的自检逻辑，以产生访问存储器件的地址和命令信息。驱动器电路采用内存控制器逻辑芯片。驱动器电路具有分别耦合到片上信号焊盘的输出。 BIST逻辑耦合在驱动器电路和控制器逻辑之间。 BIST逻辑是在设备的正常操作模式下使用驱动器电路以速度传送由控制器逻辑产生的地址和命令信息。此外，BIST逻辑能够在IC器件的测试操作模式下使用驱动器电路以速度传输测试符号，在此期间测试IC器件与另一器件之间的芯片到芯片的连接。还描述和要求保护其他实施例。

6. 发明申请

US20150127983A1 TEST, VALIDATION, AND DEBUG ARCHITECTURE 审中-公开
标题翻译：测试，验证和调试架构
公开(公告)号：US20150127983A1
公开(公告)日：2015-05-07
申请号：US13997182
申请日：2010-12-23
申请人： Mark B. Trobough , Keshavan K. Tiruvallur , Chinna B. Prudvi , Christian E. Iovin , David W. Grawrock , Jay J. Nejedlo , Ashok N. Kabadi , Travis K. Goff , Evan J. Halprin , Kapila B. Udawatta , Jiun Long Foo , Wee Hoo Cheah , Vui Yong Liew , Selvakumar Raja Gopal , Yuen Tat Lee , Samie B. Samaan , Kip C. Killpack , Neil Dobler , Nagib Z. Hakim , Briar Meyer , William H. Penner , John L. Baudrexl , Russell J. Wunderlich , James J. Grealish , Kyle Markley , Timothy S. Storey , Loren J. McConnell , Lyle E. Cool , Mukesh Kataria , Rahima K. Mohammed , Tieyu Zheng , Yi Amy Xia , Ridvan A. Sahan , Arun R. Ramadorai , Priyadarsan Patra , Edwin E. Parks , Abhijit Davare , Padmakumar Gopal , Bruce Querbach , Hermann W. Gartler , Keith Drescher , Sanjay S. Salem , David C. Florey
发明人： Mark B. Trobough , Keshavan K. Tiruvallur , Chinna B. Prudvi , Christian E. Iovin , David W. Grawrock , Jay J. Nejedlo , Ashok N. Kabadi , Travis K. Goff , Evan J. Halprin , Kapila B. Udawatta , Jiun Long Foo , Wee Hoo Cheah , Vui Yong Liew , Selvakumar Raja Gopal , Yuen Tat Lee , Samie B. Samaan , Kip C. Killpack , Neil Dobler , Nagib Z. Hakim , Briar Meyer , William H. Penner , John L. Baudrexl , Russell J. Wunderlich , James J. Grealish , Kyle Markley , Timothy S. Storey , Loren J. McConnell , Lyle E. Cool , Mukesh Kataria , Rahima K. Mohammed , Tieyu Zheng , Yi Amy Xia , Ridvan A. Sahan , Arun R. Ramadorai , Priyadarsan Patra , Edwin E. Parks , Abhijit Davare , Padmakumar Gopal , Bruce Querbach , Hermann W. Gartler , Keith Drescher , Sanjay S. Salem , David C. Florey
IPC分类号： G06F11/273
CPC分类号： G06F11/2733 , G06F11/267
摘要： An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and de-bug of a part/platform under test. In essence, a complete test architecture stack is described herein for test, validation, and debug of electronic parts, devices, and platforms.
摘要翻译：这里描述了一种用于提供测试，验证和调试架构的装置和方法。在目标或基础级别，硬件（测试设计或DFx）被设计并集成在硅部件中。控制器可以提供对这种钩子的抽象访问，例如通过抽象层来抽象硬件DFx的低级细节。此外，通过接口（如API）的抽象层向更高级的软件/表示层提供服务，例程和数据结构，这些层能够收集测试数据，以便对被测单元/平台进行验证和调试。此外，该架构可能提供对测试架构的分层（多级）安全访问。此外，可以通过使用统一的双向测试访问端口来简化对平台的测试架构的物理访问，同时还可能允许远程访问执行被测部件/平台的远程测试和脱离。本质上描述了一个完整的测试架构栈，用于电子部件，设备和平台的测试，验证和调试。

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