会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 9. 发明授权
    • System for testing digital components
    • 数字元件测试系统
    • US07386776B2
    • 2008-06-10
    • US10514537
    • 2003-05-14
    • Ralf ArnoldMatthias HeinitzSiegmar KöppeVolker Schöber
    • Ralf ArnoldMatthias HeinitzSiegmar KöppeVolker Schöber
    • G06F11/00
    • G01R31/3183G01R31/31813G01R31/318547
    • In order to test digital modules with functional elements, these are divided into test units (3) which respectively have inputs and outputs. Alternating test patterns are applied to the inputs of the test unit (3), and the test responses resulting from this are evaluated at the outputs of the test unit (3). The effect is then encountered that changes at each of the inputs of a test unit (3) do not all affect a particular output of this test unit (3). For every output of the test unit (3), it is possible to define a cone (5) whose apex is formed by the particular output of the test unit (3) and whose base comprises the inputs of the test unit (3) where, and only where, changes affect the particular output. According to the invention, the test pattern to be applied to the inputs of the test unit (3) is constructed of sub-patterns, whose length is in particular ≦ the number of inputs of the test unit (3) that are contained in the base of a cone (5). Owing to their shorter length, all possible combinations can be used for selecting the sub-patterns, so that a comprehensive function test of the test unit (3) can be carried out rapidly and with little outlay. In a digital module, this test function may in particular be implemented by a self-test unit (1) which can switch over the rest of the digital module into a test mode, generates the test patterns on the basis of sub-patterns, loads them into a test-pattern output register (2) for application to a test unit (3) and can evaluate the test response subsequently found at the outputs of the test unit (3) by means of an evaluation unit (16), or read it in for evaluation.
    • 为了测试具有功能元件的数字模块,它们分为测试单元(3),分别具有输入和输出。 将交替测试图案应用于测试单元(3)的输入,并且在测试单元(3)的输出处评估由此产生的测试响应。 然后会遇到测试单元(3)的每个输入端的变化都不会影响该测试单元(3)的特定输出的效果。 对于测试单元(3)的每个输出,可以定义锥形(5),其顶点由测试单元(3)的特定输出形成,并且其底部包括测试单元(3)的输入,其中 ,只有在这些变化影响特定的输出。 根据本发明,应用于测试单元(3)的输入的测试模式由子模式构成,子模式的长度特别地<=测试单元(3)的输入数量 锥体的底部(5)。 由于其长度较短,所有可能的组合都可用于选择子图案,从而可以快速实现测试单元(3)的综合功能测试,并且具有很少的支出。 在数字模块中,该测试功能可以特别地由可以将数字模块的其余部分切换到测试模式的自检单元(1)来实现,并且基于子模式生成测试模式 它们进入用于应用于测试单元(3)的测试图案输出寄存器(2),并且可以通过评估单元(16)评估随后在测试单元(3)的输出处发现的测试响应,或读取 它用于评估。
    • 10. 发明授权
    • Pulsed static flip-flop
    • 脉冲静态触发器
    • US08188780B2
    • 2012-05-29
    • US11648194
    • 2006-12-29
    • Christian PachaSiegmar KöppeKarl Zapf
    • Christian PachaSiegmar KöppeKarl Zapf
    • H03K3/00
    • H03K3/35625H03K3/012
    • A pulsed static flip-flop comprises a first logic device which combines a logic signal with a pulsed signal and outputs a set signal, a second logic device which logically combines the logic signal with a complementary pulsed signal and outputs a reset signal; and a latch device comprising storage means which hold a logic hold level to be tapped off as a stored logic state of the logic signal. The logic hold level is adjustable to a first logic level by a first push-pull transistor controlled by the set signal and to a second logic level by a second push-pull transistor controlled by the reset signal.
    • 脉冲静态触发器包括将逻辑信号与脉冲信号组合并输出设定信号的第一逻辑器件,将逻辑信号与互补脉冲信号逻辑组合并输出复位信号的第二逻辑器件; 以及锁存装置,其包括存储装置,其保持要作为逻辑信号的存储的逻辑状态被分接的逻辑保持电平。 逻辑保持电平由被设置信号控制的第一推挽晶体调节到第一逻辑电平,并且由复位信号控制的第二推挽晶体调节到第二逻辑电平。