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    • 8. 发明授权
    • Correcting 3D effects in phase shifting masks using sub-resolution features
    • 使用子分辨率特征校正相移掩模中的3D效果
    • US08032845B2
    • 2011-10-04
    • US12360694
    • 2009-01-27
    • Vishnu G. KamatArmen Kroyan
    • Vishnu G. KamatArmen Kroyan
    • G06F17/50G03F1/00G06K9/00
    • G03F1/30G03F1/36
    • Using phase shifting on a mask can advantageously improve printed feature resolution on a wafer, thereby allowing greater feature density on an integrated circuit. Phase shifting can create an intensity imbalance between 0 degree and 180 degree phase shifters on the mask. An improved method of designing an alternating PSM to minimize this intensity imbalance is provided. Sub-resolution features, called “blockers”, can be incorporated in the alternating PSM design. Specifically, blockers can be formed in the 0 degree phase shifters. In this configuration, the intensity associated with the 0 degree phase shifters approximates the intensity associated with the corresponding 180 degree phase shifters. Intensity balancing using blockers retains image contrast, thereby ensuring printed feature quality.
    • 使用掩模上的相移可以有利地提高晶片上的印刷特征分辨率,从而允许集成电路上的更大的特征密度。 相移可能在掩模上产生0度和180度移相器之间的强度不平衡。 提供了一种设计交替PSM以最小化该强度不平衡的改进方法。 称为“阻塞剂”的亚分辨率特征可以并入交替的PSM设计中。 具体地,可以在0度移相器中形成阻挡剂。 在该配置中,与0度移相器相关联的强度近似于与相应的180度移相器相关联的强度。 使用阻滞剂的强度平衡保留了图像对比度,从而确保打印的特征质量。
    • 9. 发明申请
    • Correcting 3D Effects In Phase Shifting Masks Using Sub-Resolution Features
    • 使用子分辨率功能校正相移掩码中的3D效果
    • US20090136857A1
    • 2009-05-28
    • US12360694
    • 2009-01-27
    • Vishnu G. KamatArmen Kroyan
    • Vishnu G. KamatArmen Kroyan
    • G03F1/00G06F17/50
    • G03F1/30G03F1/36
    • Using phase shifting on a mask can advantageously improve printed feature resolution on a wafer, thereby allowing greater feature density on an integrated circuit. Phase shifting can create an intensity imbalance between 0 degree and 180 degree phase shifters on the mask. An improved method of designing an alternating PSM to minimize this intensity imbalance is provided. Sub-resolution features, called “blockers”, can be incorporated in the alternating PSM design. Specifically, blockers can be formed in the 0 degree phase shifters. In this configuration, the intensity associated with the 0 degree phase shifters approximates the intensity associated with the corresponding 180 degree phase shifters. Intensity balancing using blockers retains image contrast, thereby ensuring printed feature quality.
    • 使用掩模上的相移可以有利地提高晶片上的印刷特征分辨率,从而允许集成电路上的更大的特征密度。 相移可能在掩模上产生0度和180度移相器之间的强度不平衡。 提供了一种设计交替PSM以最小化该强度不平衡的改进方法。 称为“阻塞剂”的亚分辨率特征可以并入交替的PSM设计中。 具体地,可以在0度移相器中形成阻挡剂。 在该配置中,与0度移相器相关联的强度近似于与相应的180度移相器相关联的强度。 使用阻滞剂的强度平衡保留了图像对比度,从而确保打印的特征质量。
    • 10. 发明申请
    • Correcting 3D Effects In Phase Shifting Masks Using Sub-Resolution Features
    • 使用子分辨率功能校正相移掩码中的3D效果
    • US20070160917A1
    • 2007-07-12
    • US11462686
    • 2006-08-04
    • Vishnu KamatArmen Kroyan
    • Vishnu KamatArmen Kroyan
    • G06F17/50G03F1/00
    • G03F1/30G03F1/36
    • Using phase shifting on a mask can advantageously improve printed feature resolution on a wafer, thereby allowing greater feature density on an integrated circuit. Phase shifting can create an intensity imbalance between 0 degree and 180 degree phase shifters on the mask. An improved method of designing an alternating PSM to minimize this intensity imbalance is provided. Sub-resolution features, called “blockers”, can be incorporated in the alternating PSM design. Specifically, blockers can be formed in the 0 degree phase shifters. In this configuration, the intensity associated with the 0 degree phase shifters approximates the intensity associated with the corresponding 180 degree phase shifters. Intensity balancing using blockers retains image contrast, thereby ensuring printed feature quality.
    • 使用掩模上的相移可以有利地提高晶片上的印刷特征分辨率,从而允许集成电路上的更大的特征密度。 相移可能在掩模上产生0度和180度移相器之间的强度不平衡。 提供了一种设计交替PSM以最小化该强度不平衡的改进方法。 称为“阻塞剂”的亚分辨率特征可以并入交替的PSM设计中。 具体地,可以在0度移相器中形成阻挡剂。 在该配置中,与0度移相器相关联的强度近似于与相应的180度移相器相关联的强度。 使用阻滞剂的强度平衡保留了图像对比度,从而确保打印的特征质量。