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    • 2. 发明授权
    • Ultraviolet diode and atomic mass analysis ionization source collecting device using ultraviolet diode and an MCP
    • 使用紫外二极管和MCP的紫外二极管和原子质量分析电离源收集装置
    • US08981289B2
    • 2015-03-17
    • US14125436
    • 2011-12-16
    • Seung Yong KimMo YangHyun Sik Kim
    • Seung Yong KimMo YangHyun Sik Kim
    • H01J49/10H01J49/06H01J49/26H01J49/16H01J49/00H01J49/08H01J49/42
    • H01J49/161H01J49/0022H01J49/08H01J49/424Y10T29/49826
    • The present invention relates to an ultraviolet diode and an atomic mass analysis ionization source collecting device using an MCP. In the manufacturing of a portable atomic mass analyzer, an object of the present invention is to use an MCP electron multiplier plate, whereby ultraviolet photons emitted from an ultraviolet diode are irradiated on a front surface plate of the MCP electron multiplier plate to induce primary electrons, an amplified electron beam is collected from the electrons, and an electron beam is generated at a low temperature and low power and having a discharge time that is accurately controlled. The atomic mass analysis ionization source collecting device using an ultraviolet diode and an MCP according to the present invention comprises: an ultraviolet diode emitting ultraviolet rays by means of supplied power; an MCP electron multiplier plate inducing and amplifying primary electron discharge from ultraviolet photons from the ultraviolet diode, and collecting a large amount of electron beams from an MCP reverse surface plate; an electron condenser lens condensing the electron beam amplified through the MCP electron multiplier plate; an ion trap atomic mass separator ionizing gas sample molecules by means of an electron beam injected through the electron condenser lens; and an ion detector performing detection of ions separated from the ion trap atomic mass separator, by means of an atomic mass spectrum.
    • 本发明涉及使用MCP的紫外二极管和原子质量分析电离源收集装置。 在便携式原子质量分析仪的制造中,本发明的目的是使用MCP电子倍增器板,其中从紫外二极管发射的紫外光子照射在MCP电子倍增器板的前表面板上以诱导一次电子 从电子收集放大的电子束,并且在低温和低功率下产生电子束,并且具有被精确控制的放电时间。 根据本发明的使用紫外二极管和MCP的原子质量分析电离源收集装置包括:通过供电的电源发射紫外线的紫外二极管; MCP电子倍增器板从紫外二极管的紫外光子中诱发和放大一次电子放电,并从MCP反面板收集大量的电子束; 电子聚光透镜,聚合通过MCP电子倍增器板放大的电子束; 离子阱原子质量分离器通过通过电子聚光透镜注入的电子束离子化气体样品分子; 以及离子检测器,其通过原子质谱进行离子阱原子质量分离器分离的离子的检测。
    • 3. 发明申请
    • DEVICE FOR OBTAINING THE ION SOURCE OF A MASS SPECTROMETER USING AN ULTRAVIOLET DIODE AND A CEM
    • 用于获得使用超紫外线二极管和CEM的质谱仪的离子源的装置
    • US20140124662A1
    • 2014-05-08
    • US14125491
    • 2011-12-16
    • Mo YangSeung Yong KimHyun Sik Kim
    • Mo YangSeung Yong KimHyun Sik Kim
    • H01J49/10
    • H01J49/10H01J49/0022H01J49/08H01J49/424
    • The present invention relates to a device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM module, having the purpose of inducing initial electron emission using a CEM module and by radiating ultraviolet photons emitted from the ultraviolet diode to the entrance of the CEM module to obtain a large amount of amplified electron beams from the exit and to produce electron beams the emission times of which are accurately controlled at low temperature and at low power. The present invention is characterized by a device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM module, the device consisting essentially of: an ultraviolet diode emitting ultraviolet rays by means of supplied power; an electron multiplier inducing and amplifying the initial electron emission of ultraviolet photons from the ultraviolet diode and obtaining a large amount of electron beams from the exit; an electron condenser lens condensing the electron beams amplified by the electron multiplier; an ion trap mass separator ionizing gas sample molecules by the electron beams injected through the electron xondensing lens; and an ion detector detecting ions separated from the ion trap mass separator by mass spectrum, wherein the electron multiplier is a CEM module.
    • 本发明涉及一种使用紫外二极管和CEM模块获得质谱仪的离子源的装置,其目的是使用CEM模块诱发初始电子发射,并将从紫外线二极管发射的紫外光子辐射到入口 的CEM模块,以从出口获得大量的放大电子束,并产生其发射时间在低温和低功率下精确控制的电子束。 本发明的特征在于一种用于使用紫外二极管和CEM模块获得质谱仪的离子源的装置,该装置基本上由以下部分组成:紫外线二极管,通过供电供给紫外线; 电子倍增器,从紫外二极管感应并放大紫外光子的初始电子发射,并从出口获得大量的电子束; 电子聚光透镜,聚合由电子倍增器放大的电子束; 离子阱质量分离器通过电子透射透镜注入的电子束离子化气体样品分子; 以及离子检测器,通过质谱检测离子阱质量分离器分离的离子,其中电子倍增器是CEM模块。
    • 4. 发明授权
    • Gaseous sample injection valve and gaseous sample injection method using same
    • 气体样品注射阀和使用其的气态样品注射方法
    • US09551431B2
    • 2017-01-24
    • US14358859
    • 2011-11-18
    • Mo YangSeung Yong KimHyun Sik Kim
    • Mo YangSeung Yong KimHyun Sik Kim
    • G01N30/20F16K31/06H01J49/04F16K11/20F16K11/24
    • F16K31/0658F16K11/207F16K11/24H01J49/0422H01J49/0495
    • The present invention relates to a gaseous sample injection valve. The gaseous sample injection valve includes a middle body injecting a fixed amount of a gaseous sample into the vacuum chamber of a mass spectrometer, the middle body being constituted by a gaseous sample injection tube, a gaseous sample discharge tube, a storage part, and a vacuum chamber connection tube; an upper body accommodating a first solenoid coil, a first plunger, and a first packing; and a lower body accommodating a second solenoid coil, a second plunger, and a second packing. The gaseous sample injection valve according to the present invention may be miniaturized to utilize a lightweight portable mass spectrometer. Also, the vacuum pump may be reduced in load to extend the operation life-cycle of the vacuum pump. In addition, when the gaseous sample is analyzed by using the mass spectrometer, a uniform mass spectrum with respect to the gaseous sample may be obtained.
    • 本发明涉及一种气态样品注入阀。 气态样品注入阀包括将固定量的气态样品注入质谱仪的真空室中的中间体,中间体由气体样品注入管,气体样品放电管,存储部和 真空室连接管; 容纳第一螺线管线圈的上体,第一柱塞和第一填料; 以及容纳第二电磁线圈,第二柱塞和第二填料的下体。 根据本发明的气态样品注射阀可以被小型化以利用轻便的便携式质谱仪。 此外,真空泵可以减小负载以延长真空泵的操作寿命。 此外,当通过使用质谱仪分析气态样品时,可以获得相对于气态样品的均匀质谱。
    • 5. 发明授权
    • Device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM
    • 用于使用紫外二极管和CEM获得质谱仪的离子源的装置
    • US08927943B2
    • 2015-01-06
    • US14125491
    • 2011-12-16
    • Mo YangSeung Yong KimHyun Sik Kim
    • Mo YangSeung Yong KimHyun Sik Kim
    • H01J49/10H01J49/00H01J49/08H01J49/42
    • H01J49/10H01J49/0022H01J49/08H01J49/424
    • The present invention relates to a device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM module, having the purpose of inducing initial electron emission using a CEM module and by radiating ultraviolet photons emitted from the ultraviolet diode to the entrance of the CEM module to obtain a large amount of amplified electron beams from the exit and to produce electron beams the emission times of which are accurately controlled at low temperature and at low power. The present invention is characterized by a device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM module, the device consisting essentially of: an ultraviolet diode emitting ultraviolet rays by means of supplied power; an electron multiplier inducing and amplifying the initial electron emission of ultraviolet photons from the ultraviolet diode and obtaining a large amount of electron beams from the exit; an electron condenser lens condensing the electron beams amplified by the electron multiplier; an ion trap mass separator ionizing gas sample molecules by the electron beams injected through the electron xondensing lens; and an ion detector detecting ions separated from the ion trap mass separator by mass spectrum, wherein the electron multiplier is a CEM module.
    • 本发明涉及一种使用紫外二极管和CEM模块获得质谱仪的离子源的装置,其目的是使用CEM模块诱发初始电子发射,并且将从紫外线二极管发射的紫外光子辐射到入口 的CEM模块,以从出口获得大量的放大电子束,并产生其发射时间在低温和低功率下精确控制的电子束。 本发明的特征在于一种用于使用紫外二极管和CEM模块获得质谱仪的离子源的装置,该装置基本上由以下部分组成:紫外线二极管,通过供电供给紫外线; 电子倍增器,从紫外二极管感应并放大紫外光子的初始电子发射,并从出口获得大量的电子束; 电子聚光透镜,聚合由电子倍增器放大的电子束; 离子阱质量分离器通过电子透射透镜注入的电子束离子化气体样品分子; 以及离子检测器,通过质谱检测离子阱质量分离器分离的离子,其中电子倍增器是CEM模块。
    • 6. 发明申请
    • GASEOUS SAMPLE INJECTION VALVE AND GASEOUS SAMPLE INJECTION METHOD USING SAME
    • 气体样品注射阀和采用相同方法的气体样品注射方法
    • US20140312255A1
    • 2014-10-23
    • US14358859
    • 2011-11-18
    • Mo YangSeung Yong KimHyun Sik Kim
    • Mo YangSeung Yong KimHyun Sik Kim
    • F16K31/06
    • F16K31/0658F16K11/207F16K11/24H01J49/0422H01J49/0495
    • The present invention relates to a gaseous sample injection valve. The gaseous sample injection valve includes a middle body injecting a fixed amount of a gaseous sample into the vacuum chamber of a mass spectrometer, the middle body being constituted by a gaseous sample injection tube, a gaseous sample discharge tube, a storage part, and a vacuum chamber connection tube; an upper body accommodating a first solenoid coil, a first plunger, and a first packing; and a lower body accommodating a second solenoid coil, a second plunger, and a second packing. The gaseous sample injection valve according to the present invention may be miniaturized to utilize a lightweight portable mass spectrometer. Also, the vacuum pump may be reduced in load to extend the operation life-cycle of the vacuum pump. In addition, when the gaseous sample is analyzed by using the mass spectrometer, a uniform mass spectrum with respect to the gaseous sample may be obtained.
    • 本发明涉及一种气态样品注入阀。 气态样品注入阀包括将固定量的气态样品注入质谱仪的真空室中的中间体,中间体由气体样品注入管,气体样品放电管,存储部和 真空室连接管; 容纳第一螺线管线圈的上体,第一柱塞和第一填料; 以及容纳第二电磁线圈,第二柱塞和第二填料的下体。 根据本发明的气态样品注射阀可以被小型化以利用轻便的便携式质谱仪。 此外,真空泵可以减小负载以延长真空泵的操作寿命。 此外,当通过使用质谱仪分析气态样品时,可以获得相对于气态样品的均匀质谱。
    • 7. 发明申请
    • ULTRAVIOLET DIODE AND ATOMIC MASS ANALYSIS IONIZATION SOURCE COLLECTING DEVICE USING ULTRAVIOLET DIODE AND AN MCP
    • 超紫外线二极管和原子质谱分析离子源采集超紫外二极管和MCP的装置
    • US20140339423A1
    • 2014-11-20
    • US14125436
    • 2011-12-16
    • Seung Yong KimMo YangHyun Sik Kim
    • Seung Yong KimMo YangHyun Sik Kim
    • H01J49/16
    • H01J49/161H01J49/0022H01J49/08H01J49/424Y10T29/49826
    • The present invention relates to an ultraviolet diode and an atomic mass analysis ionization source collecting device using an MCP. In the manufacturing of a portable atomic mass analyzer, an object of the present invention is to use an MCP electron multiplier plate, whereby ultraviolet photons emitted from an ultraviolet diode are irradiated on a front surface plate of the MCP electron multiplier plate to induce primary electrons, an amplified electron beam is collected from the electrons, and an electron beam is generated at a low temperature and low power and having a discharge time that is accurately controlled. The atomic mass analysis ionization source collecting device using an ultraviolet diode and an MCP according to the present invention comprises: an ultraviolet diode emitting ultraviolet rays by means of supplied power; an MCP electron multiplier plate inducing and amplifying primary electron discharge from ultraviolet photons from the ultraviolet diode, and collecting a large amount of electron beams from an MCP reverse surface plate; an electron condenser lens condensing the electron beam amplified through the MCP electron multiplier plate; an ion trap atomic mass separator ionizing gas sample molecules by means of an electron beam injected through the electron condenser lens; and an ion detector performing detection of ions separated from the ion trap atomic mass separator, by means of an atomic mass spectrum.
    • 本发明涉及使用MCP的紫外二极管和原子质量分析电离源收集装置。 在便携式原子质量分析仪的制造中,本发明的目的是使用MCP电子倍增器板,其中从紫外二极管发射的紫外光子照射在MCP电子倍增器板的前表面板上以诱导一次电子 从电子收集放大的电子束,并且在低温和低功率下产生电子束,并且具有被精确控制的放电时间。 根据本发明的使用紫外二极管和MCP的原子质量分析电离源收集装置包括:通过供电的电源发射紫外线的紫外二极管; MCP电子倍增器板从紫外二极管的紫外光子中诱发和放大一次电子放电,并从MCP反面板收集大量的电子束; 电子聚光透镜,聚合通过MCP电子倍增器板放大的电子束; 离子阱原子质量分离器通过通过电子聚光透镜注入的电子束离子化气体样品分子; 以及离子检测器,其通过原子质谱进行离子阱原子质量分离器分离的离子的检测。
    • 8. 发明申请
    • LIGHT EMITTING DIODE LIGHTING SYSTEM
    • 发光二极管照明系统
    • US20140312806A1
    • 2014-10-23
    • US14000863
    • 2011-10-10
    • Young Jong KimDong Young HuhTaek Soo KimHyun Sik Kim
    • Young Jong KimDong Young HuhTaek Soo KimHyun Sik Kim
    • H05B33/08
    • H05B33/0815H05B33/0851Y02B20/347Y02B20/348
    • An LED lighting system is provided. The LED lighting system includes a main transformer, a voltage detector, a current controller, a second reference voltage supplier, and a power factor compensation circuit. The main transformer transforms an input signal to supply the transformed input signal to an LED group. The voltage detector supplies a control voltage proportional to a level of an input voltage corresponding to the input signal. The current controller includes a first voltage storage, a negative voltage applier, a second voltage storage, switch, and a current control signal generator. The first voltage storage stores the control voltage supplied from the voltage detector or discharges a stored voltage. The negative voltage applier is connected to the first voltage storage, and connected to a ground to apply the control voltage to the ground when the control voltage is a negative voltage. The second voltage storage is connected to the first voltage storage, and stores the control voltage applied through the first voltage storage or discharges a stored voltage. The switch is connected to the second voltage storage, and activated by a driving signal to apply a ground voltage to the second voltage storage. The current control signal generator generates a current control signal according to a voltage signal and gain of the second voltage storage. The first voltage storage or the second voltage storage supplies the current control signal through the voltage detector. The second reference voltage supplier supplies the second reference voltage when the control signal supplied from the voltage detector is equal to or greater than the second reference voltage. The power factor compensation circuit controls a duty ratio of the driving signal according to a level of the current control signal, and controls a peak value of a primary current in the main transformer according to a level of the second reference voltage.
    • 提供LED照明系统。 LED照明系统包括主变压器,电压检测器,电流控制器,第二参考电压供应器和功率因数补偿电路。 主变压器转换输入信号以将变换的输入信号提供给LED组。 电压检测器提供与对应于输入信号的输入电压的电平成比例的控制电压。 电流控制器包括第一电压存储器,负电压施加器,第二电压存储器,开关和电流控制信号发生器。 第一电压存储器存储从电压检测器提供的控制电压或放电所存储的电压。 负电压施加器连接到第一电压存储器,并且当控制电压为负电压时,连接到地面以将控制电压施加到地。 第二电压存储器连接到第一电压存储器,并且存储通过第一电压存储器施加的控制电压或放电存储的电压。 开关连接到第二电压存储器,并由驱动信号激活,以将接地电压施加到第二电压存储器。 电流控制信号发生器根据电压信号和第二电压存储器的增益产生电流控制信号。 第一电压存储器或第二电压存储器通过电压检测器提供电流控制信号。 当从电压检测器提供的控制信号等于或大于第二参考电压时,第二参考电压供应器提供第二参考电压。 功率因数补偿电路根据电流控制信号的电平来控制驱动信号的占空比,并且根据第二参考电压的电平来控制主变压器中的初级电流的峰值。