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    • 2. 发明授权
    • Ultraviolet diode and atomic mass analysis ionization source collecting device using ultraviolet diode and an MCP
    • 使用紫外二极管和MCP的紫外二极管和原子质量分析电离源收集装置
    • US08981289B2
    • 2015-03-17
    • US14125436
    • 2011-12-16
    • Seung Yong KimMo YangHyun Sik Kim
    • Seung Yong KimMo YangHyun Sik Kim
    • H01J49/10H01J49/06H01J49/26H01J49/16H01J49/00H01J49/08H01J49/42
    • H01J49/161H01J49/0022H01J49/08H01J49/424Y10T29/49826
    • The present invention relates to an ultraviolet diode and an atomic mass analysis ionization source collecting device using an MCP. In the manufacturing of a portable atomic mass analyzer, an object of the present invention is to use an MCP electron multiplier plate, whereby ultraviolet photons emitted from an ultraviolet diode are irradiated on a front surface plate of the MCP electron multiplier plate to induce primary electrons, an amplified electron beam is collected from the electrons, and an electron beam is generated at a low temperature and low power and having a discharge time that is accurately controlled. The atomic mass analysis ionization source collecting device using an ultraviolet diode and an MCP according to the present invention comprises: an ultraviolet diode emitting ultraviolet rays by means of supplied power; an MCP electron multiplier plate inducing and amplifying primary electron discharge from ultraviolet photons from the ultraviolet diode, and collecting a large amount of electron beams from an MCP reverse surface plate; an electron condenser lens condensing the electron beam amplified through the MCP electron multiplier plate; an ion trap atomic mass separator ionizing gas sample molecules by means of an electron beam injected through the electron condenser lens; and an ion detector performing detection of ions separated from the ion trap atomic mass separator, by means of an atomic mass spectrum.
    • 本发明涉及使用MCP的紫外二极管和原子质量分析电离源收集装置。 在便携式原子质量分析仪的制造中,本发明的目的是使用MCP电子倍增器板,其中从紫外二极管发射的紫外光子照射在MCP电子倍增器板的前表面板上以诱导一次电子 从电子收集放大的电子束,并且在低温和低功率下产生电子束,并且具有被精确控制的放电时间。 根据本发明的使用紫外二极管和MCP的原子质量分析电离源收集装置包括:通过供电的电源发射紫外线的紫外二极管; MCP电子倍增器板从紫外二极管的紫外光子中诱发和放大一次电子放电,并从MCP反面板收集大量的电子束; 电子聚光透镜,聚合通过MCP电子倍增器板放大的电子束; 离子阱原子质量分离器通过通过电子聚光透镜注入的电子束离子化气体样品分子; 以及离子检测器,其通过原子质谱进行离子阱原子质量分离器分离的离子的检测。
    • 3. 发明申请
    • DEVICE FOR OBTAINING THE ION SOURCE OF A MASS SPECTROMETER USING AN ULTRAVIOLET DIODE AND A CEM
    • 用于获得使用超紫外线二极管和CEM的质谱仪的离子源的装置
    • US20140124662A1
    • 2014-05-08
    • US14125491
    • 2011-12-16
    • Mo YangSeung Yong KimHyun Sik Kim
    • Mo YangSeung Yong KimHyun Sik Kim
    • H01J49/10
    • H01J49/10H01J49/0022H01J49/08H01J49/424
    • The present invention relates to a device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM module, having the purpose of inducing initial electron emission using a CEM module and by radiating ultraviolet photons emitted from the ultraviolet diode to the entrance of the CEM module to obtain a large amount of amplified electron beams from the exit and to produce electron beams the emission times of which are accurately controlled at low temperature and at low power. The present invention is characterized by a device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM module, the device consisting essentially of: an ultraviolet diode emitting ultraviolet rays by means of supplied power; an electron multiplier inducing and amplifying the initial electron emission of ultraviolet photons from the ultraviolet diode and obtaining a large amount of electron beams from the exit; an electron condenser lens condensing the electron beams amplified by the electron multiplier; an ion trap mass separator ionizing gas sample molecules by the electron beams injected through the electron xondensing lens; and an ion detector detecting ions separated from the ion trap mass separator by mass spectrum, wherein the electron multiplier is a CEM module.
    • 本发明涉及一种使用紫外二极管和CEM模块获得质谱仪的离子源的装置,其目的是使用CEM模块诱发初始电子发射,并将从紫外线二极管发射的紫外光子辐射到入口 的CEM模块,以从出口获得大量的放大电子束,并产生其发射时间在低温和低功率下精确控制的电子束。 本发明的特征在于一种用于使用紫外二极管和CEM模块获得质谱仪的离子源的装置,该装置基本上由以下部分组成:紫外线二极管,通过供电供给紫外线; 电子倍增器,从紫外二极管感应并放大紫外光子的初始电子发射,并从出口获得大量的电子束; 电子聚光透镜,聚合由电子倍增器放大的电子束; 离子阱质量分离器通过电子透射透镜注入的电子束离子化气体样品分子; 以及离子检测器,通过质谱检测离子阱质量分离器分离的离子,其中电子倍增器是CEM模块。
    • 4. 发明申请
    • GASEOUS SAMPLE INJECTION VALVE AND GASEOUS SAMPLE INJECTION METHOD USING SAME
    • 气体样品注射阀和采用相同方法的气体样品注射方法
    • US20140312255A1
    • 2014-10-23
    • US14358859
    • 2011-11-18
    • Mo YangSeung Yong KimHyun Sik Kim
    • Mo YangSeung Yong KimHyun Sik Kim
    • F16K31/06
    • F16K31/0658F16K11/207F16K11/24H01J49/0422H01J49/0495
    • The present invention relates to a gaseous sample injection valve. The gaseous sample injection valve includes a middle body injecting a fixed amount of a gaseous sample into the vacuum chamber of a mass spectrometer, the middle body being constituted by a gaseous sample injection tube, a gaseous sample discharge tube, a storage part, and a vacuum chamber connection tube; an upper body accommodating a first solenoid coil, a first plunger, and a first packing; and a lower body accommodating a second solenoid coil, a second plunger, and a second packing. The gaseous sample injection valve according to the present invention may be miniaturized to utilize a lightweight portable mass spectrometer. Also, the vacuum pump may be reduced in load to extend the operation life-cycle of the vacuum pump. In addition, when the gaseous sample is analyzed by using the mass spectrometer, a uniform mass spectrum with respect to the gaseous sample may be obtained.
    • 本发明涉及一种气态样品注入阀。 气态样品注入阀包括将固定量的气态样品注入质谱仪的真空室中的中间体,中间体由气体样品注入管,气体样品放电管,存储部和 真空室连接管; 容纳第一螺线管线圈的上体,第一柱塞和第一填料; 以及容纳第二电磁线圈,第二柱塞和第二填料的下体。 根据本发明的气态样品注射阀可以被小型化以利用轻便的便携式质谱仪。 此外,真空泵可以减小负载以延长真空泵的操作寿命。 此外,当通过使用质谱仪分析气态样品时,可以获得相对于气态样品的均匀质谱。
    • 5. 发明授权
    • Gaseous sample injection valve and gaseous sample injection method using same
    • 气体样品注射阀和使用其的气态样品注射方法
    • US09551431B2
    • 2017-01-24
    • US14358859
    • 2011-11-18
    • Mo YangSeung Yong KimHyun Sik Kim
    • Mo YangSeung Yong KimHyun Sik Kim
    • G01N30/20F16K31/06H01J49/04F16K11/20F16K11/24
    • F16K31/0658F16K11/207F16K11/24H01J49/0422H01J49/0495
    • The present invention relates to a gaseous sample injection valve. The gaseous sample injection valve includes a middle body injecting a fixed amount of a gaseous sample into the vacuum chamber of a mass spectrometer, the middle body being constituted by a gaseous sample injection tube, a gaseous sample discharge tube, a storage part, and a vacuum chamber connection tube; an upper body accommodating a first solenoid coil, a first plunger, and a first packing; and a lower body accommodating a second solenoid coil, a second plunger, and a second packing. The gaseous sample injection valve according to the present invention may be miniaturized to utilize a lightweight portable mass spectrometer. Also, the vacuum pump may be reduced in load to extend the operation life-cycle of the vacuum pump. In addition, when the gaseous sample is analyzed by using the mass spectrometer, a uniform mass spectrum with respect to the gaseous sample may be obtained.
    • 本发明涉及一种气态样品注入阀。 气态样品注入阀包括将固定量的气态样品注入质谱仪的真空室中的中间体,中间体由气体样品注入管,气体样品放电管,存储部和 真空室连接管; 容纳第一螺线管线圈的上体,第一柱塞和第一填料; 以及容纳第二电磁线圈,第二柱塞和第二填料的下体。 根据本发明的气态样品注射阀可以被小型化以利用轻便的便携式质谱仪。 此外,真空泵可以减小负载以延长真空泵的操作寿命。 此外,当通过使用质谱仪分析气态样品时,可以获得相对于气态样品的均匀质谱。
    • 6. 发明授权
    • Device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM
    • 用于使用紫外二极管和CEM获得质谱仪的离子源的装置
    • US08927943B2
    • 2015-01-06
    • US14125491
    • 2011-12-16
    • Mo YangSeung Yong KimHyun Sik Kim
    • Mo YangSeung Yong KimHyun Sik Kim
    • H01J49/10H01J49/00H01J49/08H01J49/42
    • H01J49/10H01J49/0022H01J49/08H01J49/424
    • The present invention relates to a device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM module, having the purpose of inducing initial electron emission using a CEM module and by radiating ultraviolet photons emitted from the ultraviolet diode to the entrance of the CEM module to obtain a large amount of amplified electron beams from the exit and to produce electron beams the emission times of which are accurately controlled at low temperature and at low power. The present invention is characterized by a device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM module, the device consisting essentially of: an ultraviolet diode emitting ultraviolet rays by means of supplied power; an electron multiplier inducing and amplifying the initial electron emission of ultraviolet photons from the ultraviolet diode and obtaining a large amount of electron beams from the exit; an electron condenser lens condensing the electron beams amplified by the electron multiplier; an ion trap mass separator ionizing gas sample molecules by the electron beams injected through the electron xondensing lens; and an ion detector detecting ions separated from the ion trap mass separator by mass spectrum, wherein the electron multiplier is a CEM module.
    • 本发明涉及一种使用紫外二极管和CEM模块获得质谱仪的离子源的装置,其目的是使用CEM模块诱发初始电子发射,并且将从紫外线二极管发射的紫外光子辐射到入口 的CEM模块,以从出口获得大量的放大电子束,并产生其发射时间在低温和低功率下精确控制的电子束。 本发明的特征在于一种用于使用紫外二极管和CEM模块获得质谱仪的离子源的装置,该装置基本上由以下部分组成:紫外线二极管,通过供电供给紫外线; 电子倍增器,从紫外二极管感应并放大紫外光子的初始电子发射,并从出口获得大量的电子束; 电子聚光透镜,聚合由电子倍增器放大的电子束; 离子阱质量分离器通过电子透射透镜注入的电子束离子化气体样品分子; 以及离子检测器,通过质谱检测离子阱质量分离器分离的离子,其中电子倍增器是CEM模块。
    • 7. 发明申请
    • ULTRAVIOLET DIODE AND ATOMIC MASS ANALYSIS IONIZATION SOURCE COLLECTING DEVICE USING ULTRAVIOLET DIODE AND AN MCP
    • 超紫外线二极管和原子质谱分析离子源采集超紫外二极管和MCP的装置
    • US20140339423A1
    • 2014-11-20
    • US14125436
    • 2011-12-16
    • Seung Yong KimMo YangHyun Sik Kim
    • Seung Yong KimMo YangHyun Sik Kim
    • H01J49/16
    • H01J49/161H01J49/0022H01J49/08H01J49/424Y10T29/49826
    • The present invention relates to an ultraviolet diode and an atomic mass analysis ionization source collecting device using an MCP. In the manufacturing of a portable atomic mass analyzer, an object of the present invention is to use an MCP electron multiplier plate, whereby ultraviolet photons emitted from an ultraviolet diode are irradiated on a front surface plate of the MCP electron multiplier plate to induce primary electrons, an amplified electron beam is collected from the electrons, and an electron beam is generated at a low temperature and low power and having a discharge time that is accurately controlled. The atomic mass analysis ionization source collecting device using an ultraviolet diode and an MCP according to the present invention comprises: an ultraviolet diode emitting ultraviolet rays by means of supplied power; an MCP electron multiplier plate inducing and amplifying primary electron discharge from ultraviolet photons from the ultraviolet diode, and collecting a large amount of electron beams from an MCP reverse surface plate; an electron condenser lens condensing the electron beam amplified through the MCP electron multiplier plate; an ion trap atomic mass separator ionizing gas sample molecules by means of an electron beam injected through the electron condenser lens; and an ion detector performing detection of ions separated from the ion trap atomic mass separator, by means of an atomic mass spectrum.
    • 本发明涉及使用MCP的紫外二极管和原子质量分析电离源收集装置。 在便携式原子质量分析仪的制造中,本发明的目的是使用MCP电子倍增器板,其中从紫外二极管发射的紫外光子照射在MCP电子倍增器板的前表面板上以诱导一次电子 从电子收集放大的电子束,并且在低温和低功率下产生电子束,并且具有被精确控制的放电时间。 根据本发明的使用紫外二极管和MCP的原子质量分析电离源收集装置包括:通过供电的电源发射紫外线的紫外二极管; MCP电子倍增器板从紫外二极管的紫外光子中诱发和放大一次电子放电,并从MCP反面板收集大量的电子束; 电子聚光透镜,聚合通过MCP电子倍增器板放大的电子束; 离子阱原子质量分离器通过通过电子聚光透镜注入的电子束离子化气体样品分子; 以及离子检测器,其通过原子质谱进行离子阱原子质量分离器分离的离子的检测。