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1. 发明授权

US11971394B2 Electron capture detector 有权
公开(公告)号：US11971394B2
公开(公告)日：2024-04-30
申请号：US17047606
申请日：2019-04-16
申请人： SHARP KABUSHIKI KAISHA
发明人： Shohei Komaru , Tadashi Iwamatsu
IPC分类号： G01N30/70 , G01N27/66 , H01J49/08
CPC分类号： G01N30/70 , G01N27/66 , H01J49/08
摘要： The electron capture detector (100) is a device for detecting a sample (α1). The electron capture detector (100) includes a detection cell (1), a sample inlet (2), and an electron emitting element (20). The detection cell (1) forms a reaction chamber (6). The sample inlet (2) introduces a first carrier gas containing the sample (α1) into the reaction chamber (6). The electron emitting element (20) emits electrons (β) into the reaction chamber (6). An ion (α2) derived from the sample component is generated as a result of the electron emitting element (20) emitting electrons (β) into the reaction chamber (6).

2. 发明授权

US11791121B2 3D-printed field emission sources for compact systems 有权
公开(公告)号：US11791121B2
公开(公告)日：2023-10-17
申请号：US16868000
申请日：2020-05-06
申请人： Massachusetts Institute of Technology , Instituto Tecnológico y de Estudios Superiores de Monterrey
发明人： Luis Fernando Velásquez-García , Imperio Perales-Martinez
IPC分类号： H01J1/304 , H01J49/08 , H01J35/06 , H01J9/02 , F03H1/00
CPC分类号： H01J1/3042 , F03H1/0025 , H01J9/025 , H01J35/064 , H01J35/065 , H01J49/08
摘要： A field emission electron source and a method of manufacturing the same. A field emission electron source comprises an emitting electrode and an extractor gate electrode. The emitting electrode comprising a plurality of particles with nanosharp protrusions. The extractor gate electrode comprises a metal. The extractor gate electrode is formed in a same plane as the emitting electrode. The extractor gate electrode is formed surrounding the emitting electrode. A method of manufacturing a field emission electron source comprises forming an emitting electrode comprising a plurality of particles with nanosharp protrusions using a direct ink writing (DIW) printer. The method comprises forming an extractor gate electrode comprising a metal using the DIW printer.

3. 发明授权

US11217437B2 Electron capture dissociation (ECD) utilizing electron beam generated low energy electrons 有权
公开(公告)号：US11217437B2
公开(公告)日：2022-01-04
申请号：US16298654
申请日：2019-03-11
申请人： Agilent Technologies, Inc.
发明人： Kenneth R. Newton , Nigel P. Gore , Mark Denning
IPC分类号： H01J49/00 , H01J49/06 , H01J49/08
摘要： Electron capture dissociation (ECD) is performed by transmitting an electron beam through a cell along an electron beam axis, generating plasma in the cell by energizing a gas with the electron beam, and transmitting an ion beam through the interaction region along an ion beam axis to produce fragment ions. Generating the plasma forms an interaction region in the cell spaced from and not intersecting the electron beam, and including low-energy electrons effective for ECD. The ion beam axis may be at an angle to and offset from the ion beam axis, such that the electron beam does not intersect the ion beam.

4. 发明授权

US10892153B2 Robust ion source 有权
公开(公告)号：US10892153B2
公开(公告)日：2021-01-12
申请号：US16713713
申请日：2019-12-13
申请人： MKS Instruments, Inc.
发明人： James E. Blessing , Jonathan Leslie , Jonathan Hugh Batey
IPC分类号： H01J49/14 , H01J49/08
摘要： Apparatus (e.g., ion source), systems (e.g., residual gas analyzer), and methods provide extended life and improved analytical stability of mass spectrometers in the presence of contamination gases while achieving substantial preferential ionization of sampled gases over internal background gases. One embodiment is an ion source that includes a gas source, nozzle, electron source, and electrodes. The gas source delivers gas via the nozzle to an evacuated ionization volume and is at a higher pressure than that of the evacuated ionization volume. Gas passing through the nozzle freely expands in an ionization region of the ionization volume. The electron source emits electrons through the expanding gas in the ionization region to ionize at least a portion of the expanding gas. The electrodes create electrical fields for ion flow from the ionization region to a mass filter and are located at distances from the nozzle and oriented to limit their exposure to the gas.

5. 发明授权

US10832901B2 EELS detection technique in an electron microscope 有权
公开(公告)号：US10832901B2
公开(公告)日：2020-11-10
申请号：US16424206
申请日：2019-05-28
申请人： FEI Company
发明人： Bert Henning Freitag , Sorin Lazar , Stephan Kujawa , Maarten Kuijper , Gerard Nicolaas Anne van Veen , Peter Christiaan Tiemeijer , Jamie McCormack
IPC分类号： H01J49/44 , H01J49/00 , H01J49/02 , H01J49/08
摘要： A method of performing Electron Energy-Loss Spectroscopy (EELS) in an electron microscope, comprising: Producing a beam of electrons from a source; Using an illuminator to direct said beam so as to irradiate the specimen; Using an imaging system to receive a flux of electrons transmitted through the specimen and direct it onto a spectroscopic apparatus comprising: A dispersion device, for dispersing said flux in a dispersion direction so as to form an EELS spectrum; and A detector, comprising a detection surface that is sub-divided into a plurality of detection zones, specifically comprising: Using at least a first detection zone, a second detection zone and a third detection zone to register a plurality of EELS spectral entities; and Reading out said first and said second detection zones whilst said third detection zone is registering one of said plurality of EELS spectral entities.

6. 发明申请

US20200328071A1 MASS SPECTROMETER, SAMPLING PROBE, AND ANALYSIS METHOD 审中-公开
公开(公告)号：US20200328071A1
公开(公告)日：2020-10-15
申请号：US16814036
申请日：2020-03-10
申请人： SHIMADZU CORPORATION
发明人： Osamu FURUHASHI , Tomomi TAMURA , Kiyoshi OGAWA
IPC分类号： H01J49/08 , H01J49/04
摘要： A mass spectrometer, includes: a sampling probe that irradiates a specimen disposed in the atmosphere with an electron and obtains a sample separated from the specimen; and a measurement unit that performs mass spectrometry of the sample obtained by the sampling probe, wherein the sampling probe comprises: a casing having an opening which is opened to the atmosphere and an outlet through which the sample is discharged to the measurement unit; and a surface emission type electron emission element housed in the casing such that an electron emission surface thereof opposes to the opening.

7. 发明授权

US10388506B2 Time-of-flight mass spectrometer using a cold electron beam as an ionization source 有权
公开(公告)号：US10388506B2
公开(公告)日：2019-08-20
申请号：US15321563
申请日：2015-12-04
申请人： Korea Basic Science Institute
发明人： Mo Yang , Seung Yong Kim , Hyun Sik Kim , Wan Seop Jeong
IPC分类号： H01J49/40 , H01J49/08 , H01J49/14 , H01J43/10 , H01J43/24
摘要： Provided is a time-of-flight mass spectrometer including: an ionization part receiving electron beams to thereby emit ions; a cold electron supply part injecting the electron beams to the ionization part; an ion detection part detecting the ions emitted from the ionization part; and an ion separation part connecting the ionization part and the ion detection part, wherein the cold electron supply part includes a microchannel plate receiving ultraviolet rays to thereby emit the electron beams, the ions emitted from the ionization part pass through the ion separation part to thereby reach the ion detection part, and the ion separation part has a straight tube shape.

8. 发明授权

US09305760B2 Electron source for an RF-free electronmagnetostatic electron-induced dissociation cell and use in a tandem mass spectrometer 有权
标题翻译：用于无RF电子静电电子诱导解离电池的电子源，并用于串联质谱仪
公开(公告)号：US09305760B2
公开(公告)日：2016-04-05
申请号：US14420545
申请日：2013-08-15
申请人： State of Oregon acting by and through the State board of higher education on behalf of OSU
发明人： Douglas F. Barofsky , Valery G. Voinov , Joseph S. Beckman
IPC分类号： H01J49/40 , H01J49/14 , H01J49/08 , H01J49/26
CPC分类号： H01J49/147 , H01J49/0054 , H01J49/062 , H01J49/08 , H01J49/26
摘要： An electron source for electron-induced dissociation in an RF-free electromagnetostatic cell for use installation in a tandem mass spectrometer is provided. An electromagnetostatic electron-induced dissociation cell may include at least one magnet having an opening disposed therein and having a longitudinal axis extending through the opening, the magnet having magnetic flux lines associated therewith, and an electron emitter having an electron emissive surface comprising a sheet, the emitter disposed about the axis at a location relative to the magnet where the electron emissive surface is substantially perpendicular to the magnetic flux lines at the electron emissive surface.
摘要翻译：提供了一种用于无串联电磁静电电池中电子诱导解离的电子源，用于串联质谱仪中的安装。电磁静电电子诱导解离单元可以包括至少一个具有设置在其中的开口的磁体，并且具有延伸穿过该开口的纵向轴线，该磁体具有与之相关联的磁通线，以及具有包括片材的电子发射表面的电子发射器，所述发射极围绕所述轴设置在相对于所述磁体的位置处，其中所述电子发射表面基本上垂直于所述电子发射表面处的磁通线。

9. 发明申请

US20150162174A1 DETECTORS AND METHODS OF USING THEM 有权
标题翻译：检测器及其使用方法
公开(公告)号：US20150162174A1
公开(公告)日：2015-06-11
申请号：US14552303
申请日：2014-11-24
申请人： PERKINELMER HEALTH SCIENCES, INC.
发明人： Hamid Badiei , Steven A. Beres
IPC分类号： H01J49/00 , H01J49/08 , H01J49/26 , H01J49/02
CPC分类号： H01J43/18 , H01J49/0009 , H01J49/025
摘要： Certain embodiments described herein are directed to detectors and systems using them. In some examples, the detector can include a plurality of dynodes, in which one or more of the dynodes are coupled to an electrometer. In some instances, an analog signal from a non-saturated dynode is measured and cross-calibrated with a pulse count signal to extend the dynamic range of the detector.
摘要翻译：本文描述的某些实施例涉及使用它们的检测器和系统。在一些示例中，检测器可以包括多个倍增电极，其中一个或多个倍增电极耦合到静电计。在一些情况下，测量来自非饱和倍增极的模拟信号并用脉冲计数信号进行交叉校准，以扩展检测器的动态范围。

10. 发明授权

US5616920A Apparatus for removing ions from an electron beam 失效
标题翻译：用于从电子束去除离子的装置
公开(公告)号：US5616920A
公开(公告)日：1997-04-01
申请号：US538865
申请日：1995-10-04
申请人： Erich Plies
发明人： Erich Plies
IPC分类号： H01J49/08 , H01J35/02 , H01J37/05 , H01J37/147 , H01J49/28 , H01J49/48
CPC分类号： H01J37/1477 , H01J35/02 , H01J37/05 , H01J49/288 , H01J49/48
摘要： Purely electrical or magnetic deflection systems are usually utilized in the probe-shaping part of modern electron beam tomographs in order to remove the gas ions generated in the evacuated drift tube by electron impact from the beam. The known deflection systems, however, cause an offset of the electron beam, so that this enters extra-axially into the lens element following the deflection system. In the apparatus for removing ions from an electron beam disclosed herein, a deflection unit (Wien filter) generates an E.times.B field oriented perpendicular to the beam axis that exerts strong shearing forces only on the positively charged gas ions, but does not influence the electrons. The deflection unit is essentially composed of two tube electrodes lying at a constant potential, of an electrostatic octopole deflector, and two saddle coil pairs annularly surrounding the octopole deflector. The apparatus is useful for fast electron beam tomographs, including x-ray scanners.
摘要翻译：通常在现代电子束断层摄影机的探针成形部分中采用纯电气或磁偏转系统，以便通过电子束从电子束中去除真空漂移管中产生的气体离子。然而，已知的偏转系统引起电子束的偏移，使得其在偏转系统之后进入到轴向进入透镜元件。在用于从本文公开的电子束去除离子的装置中，偏转单元（维恩滤波器）产生垂直于光束轴线定向的ExB场，其仅在带正电荷的气体离子上施加强剪切力，但不影响电子。偏转单元基本上由位于恒定电位的静电八极偏转器的两个管电极和环形围绕八极偏转器的两个鞍形线圈组成。该装置适用于快速电子束断层扫描仪，包括x射线扫描仪。

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