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    • 4. 发明申请
    • Semiconductor storage device, test method therefor, and test circuit therefor
    • 半导体存储装置及其测试方法及其测试电路
    • US20050207252A1
    • 2005-09-22
    • US10498398
    • 2002-12-10
    • Hiroyuki TakahashiHideo InabaSyouzou Uchida
    • Hiroyuki TakahashiHideo InabaSyouzou Uchida
    • G01R31/28G01R31/3185G11C8/18G11C11/401G11C11/403G11C11/406G11C29/08G11C29/14G11C7/00
    • G11C29/12015G11C8/18G11C11/401G11C11/406G11C29/14
    • A test method and a test circuit which enable operations to be checked when the time interval between a refresh operation and a read or write operation is forcibly reduced. Timings for a read or write operation in a normal operation mode and in a test mode are determined on the basis of an address transition detection circuit. A timing for a refresh operation in the normal operation mode is set on the basis of a normal refreshing pulse signal generated by a refresh pulse generating circuit in response to a timing signal generated by a timer circuit. A timing for a refresh operation in the test mode is set on the basis of a first testing refresh pulse generation signal generated by a first testing refresh pulse generating circuit in response to the address transition detection signal. By controlling a timing for generating the first testing refresh pulse generation signal, it is possible to generate a read or write operation and a refresh operation so that there is a predetermined time interval between these operations.
    • 当刷新操作和读/写操作之间的时间间隔被强制降低时,能够检查操作的测试方法和测试电路。 基于地址转换检测电路来确定在正常操作模式和测试模式下进行读或写操作的时序。 基于由定时器电路产生的定时信号由刷新脉冲发生电路产生的正常刷新脉冲信号来设定正常操作模式下的刷新操作的定时。 基于由第一测试刷新脉冲发生电路响应于地址转换检测信号产生的第一测试刷新脉冲产生信号来设置测试模式下的刷新操作的定时。 通过控制用于产生第一测试刷新脉冲产生信号的定时,可以产生读或写操作和刷新操作,使得在这些操作之间存在预定的时间间隔。
    • 5. 发明申请
    • Semiconductor memory device
    • 半导体存储器件
    • US20050207214A1
    • 2005-09-22
    • US11130464
    • 2005-05-16
    • Hiroyuki TakahashiAtsushi NakagawaHideo Inaba
    • Hiroyuki TakahashiAtsushi NakagawaHideo Inaba
    • G06F1/32G11C11/403G11C11/406G11C11/407G11C11/4074G11C11/00
    • G11C11/40615G11C11/406G11C11/4074G11C2207/2227G11C2211/4067
    • A semiconductor memory device is provided which effectively reduces a consumption of current of a system of circuits associated with refresh operations. A control signal circuit 2 controls n-channel transistors 3C, 4B to be in an OFF-state based on an internal chip select signal SCI in an interval time period between the refresh operations, wherein the n-channel transistors 3C, 4B are connected between the system of circuits associated with refresh operations (an internal voltage-down circuit 3 and a boost circuit 4) and the ground, so as to break down a leak path of the system of circuits associated with refresh operations for reducing the leakage of current. At a timing of starting the refresh operation by triggering a timer, the internal chip select signal SCI is transitioned to a high level for supplying a ground voltage to the internal voltage-down circuit 3 and the boost circuit 4.
    • 提供一种半导体存储器件,其有效地减少与刷新操作相关的电路系统的电流消耗。 在刷新操作之间的间隔时间内,控制信号电路2基于内部片选信号SCI控制n沟道晶体管3C,4B处于截止状态,其中n沟道晶体管3 C,4 B连接在与刷新操作(内部降压电路3和升压电路4)相关联的电路系统和地之间,以便分解与刷新操作相关联的电路系统的泄漏路径,以减少 电流泄漏。 在通过触发定时器开始刷新操作的定时,内部芯片选择信号SCI转换到用于向内部降压电路3和升压电路4提供接地电压的高电平。
    • 6. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US06947345B2
    • 2005-09-20
    • US10473656
    • 2002-03-28
    • Hiroyuki TakahashiHideo InabaAtsushi Nakagawa
    • Hiroyuki TakahashiHideo InabaAtsushi Nakagawa
    • G11C7/22G11C11/406G11C11/4076G11C7/00
    • G11C11/40615G11C7/22G11C11/406G11C11/4076G11C2207/2227G11C2211/4061G11C2211/4067
    • A semiconductor memory device is provided, which is capable of effectively reducing a current comsumption caused by a self-refresh operation in a stand-by mode.In the refresh operation in the stand-by mode, under the control by a refresh control circuit 8B, firstly, a suppression is made for current driving abilities of sense amplifiers 70A˜70D provided for amplifying data signals appearing on bit lines, and secondly, an expansion is made of a pulse width of a row enable signal RE, which defines a period of time for selecting word lines WL, and thirdly, parallel activations of plural word lines are made based on the row enable signal RE with the expanded pulse width, thereby reducing the frequency of operations of the circuit system associated with the refresh operations, resulting in a suppression of the current consumption.
    • 提供一种半导体存储器件,其能够有效地降低由待机模式中的自刷新操作引起的电流消耗。 在待机模式的刷新操作中,在刷新控制电路8B的控制下,首先抑制用于放大位线上出现的数据信号的读出放大器70A〜70D的电流驱动能力, 其次,扩展行限制信号RE的脉冲宽度,该行允许信号RE定义了用于选择字线WL的时间段,第三,基于行允许信号RE进行多条字线的并行激活, 扩大的脉冲宽度,从而降低与刷新操作相关联的电路系统的操作频率,导致电流消耗的抑制。
    • 7. 发明授权
    • Semiconductor storage and method for testing the same
    • 半导体存储和测试方法
    • US06751144B2
    • 2004-06-15
    • US10148430
    • 2002-05-29
    • Hiroyuki TakahashiHideo InabaTakashi Kusakari
    • Hiroyuki TakahashiHideo InabaTakashi Kusakari
    • G11C700
    • G11C11/40615G11C8/18G11C11/406G11C29/12
    • A semiconductor storage having the same memory cells as a DRAM, operating in SRAM specifications, and having advantages such as a small chop size, a low power consumption, a low manufacturing cost, no access delay due to skew, and no memory cell breakdown. An ATD circuit (3) generates a one-shot pulse added to an address change detection signal (ATD) from a change of the address (Address) supplied from external. By combining one-shot pulse produced for each bit of the address, only one one-shot pulse is generated even if the address includes skew. A memory cell is refreshed by using a refresh address (R_ADD) generated by a refresh control circuit (4) during the time when a one-shot pulse is generated. At the fall of the one-shot pulse, a latch control signal (LC) is generated, and the address is taken in a latch (2) so as to access a memory cell array (6).
    • 具有与DRAM相同的存储单元的半导体存储器,以SRAM规格工作,具有小斩尺寸,低功耗,低制造成本,无偏移的访问延迟以及无存储器单元故障等优点。 ATD电路(3)根据从外部提供的地址(地址)的改变产生添加到地址变化检测信号(ATD)的单触发脉冲。 通过组合为地址的每个位产生的单触发脉冲,即使地址包含偏斜,也只产生一个单触发脉冲。 通过使用在产生单次脉冲的时间期间由刷新控制电路(4)产生的刷新地址(R_ADD)来刷新存储器单元。 在单触发脉冲的下降时,产生锁存控制信号(LC),并将该地址取入锁存器(2),以访问存储单元阵列(6)。
    • 8. 发明授权
    • Heat pump and dehumidifying device
    • 热泵和除湿装置
    • US06672082B1
    • 2004-01-06
    • US10069119
    • 2002-02-28
    • Kensaku MaedaHideo InabaShunro Nishiwaki
    • Kensaku MaedaHideo InabaShunro Nishiwaki
    • F25D1706
    • F25B5/04F24F3/1405F24F3/153F24F2012/005F25B40/02F25B41/04Y02B30/563
    • A heat pump with a high coefficient of performance and a dehumidifying apparatus consumes a small amount of energy per amount of moisture removal. The heat pump includes a pressurizer for raising a pressure of a refrigerant; a condenser for condensing the refrigerant to heat a high-temperature heat source fluid; an evaporator for evaporating the refrigerant to cool a low-temperature heat source fluid; and heat exchanger disposed in a refrigerant path connecting the condenser and the evaporator for evaporating and condensing the refrigerant under an intermediate pressure between the condensing pressure of the condenser and the evaporating pressure of the evaporator 210. The low-temperature heat source fluid is successively cooled by the heat exchanging means, cooled by the evaporator, and heated by the heat exchanger in such order. The low-temperature heat source fluid can be precooled by the heat exchanger prior to cooling in the evaporator, and the amount of heat removed in the precooling process can be recovered from the low-temperature heat source fluid which has been cooled by the evaporator.
    • 具有高性能系数的热泵和除湿装置每消除水分消耗少量的能量。 热泵包括用于提高制冷剂压力的加压器; 用于冷凝制冷剂以加热高温热源流体的冷凝器; 用于蒸发制冷剂以冷却低温热源流体的蒸发器; 以及热交换器,其设置在连接冷凝器和蒸发器的制冷剂路径中,用于在冷凝器的冷凝压力与蒸发器210的蒸发压力之间的中间压力下蒸发和冷凝制冷剂。低温热源流体依次冷却 通过由蒸发器冷却的热交换装置,并按照这种顺序由热交换器加热。 在蒸发器中冷却之前,低温热源流体可以由热交换器预冷却,并且可以从已经被蒸发器冷却的低温热源流体中回收在预冷却过程中除去的热量。
    • 9. 发明授权
    • Semiconductor device and semiconductor chips outputting a data strobe signal
    • 输出数据选通信号的半导体器件和半导体芯片
    • US07746711B2
    • 2010-06-29
    • US11984606
    • 2007-11-20
    • Hideo Inaba
    • Hideo Inaba
    • G11C7/00
    • G11C7/1027G11C7/1066G11C7/1072G11C7/22G11C11/4076
    • High-speed operation is achieved without increase in a circuit current and unstable operation of data strobe signal level due to collision between data strobe signals. Each of RAMs 11a and 11b outputs a data signal DQ and a data strobe signal DQS indicative of an output timing of the data signal. RAM 11a includes a strobe signal control unit 15a that determines whether RAM 11b connected in parallel with the RAM 11a is in a read state or not, and delays an output start timing of data strobe signal DQS when the RAM 11b is in the read state. Strobe signal control unit 15a of the RAM 11a controls output start timing so that a latter half portion of a preamble period of the data strobe signal DQS to be output coincides with a postamble period of the data strobe signal DQS output by the RAM 11b.
    • 由于数据选通信号之间的冲突,电路电流不增加,数据选通信号电平不稳定,实现高速运行。 每个RAM11a和11b输出数据信号DQ和表示数据信号的输出定时的数据选通信号DQS。 RAM 11a包括选通信号控制单元15a,其确定与RAM 11a并联连接的RAM 11b是否处于读取状态,并且当RAM 11b处于读取状态时延迟数据选通信号DQS的输出开始定时。 RAM 11a的选通信号控制单元15a控制输出开始定时,使得要输出的数据选通信号DQS的前导码周期的后半部分与RAM 11b输出的数据选通信号DQS的后同步周期一致。