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    • 6. 发明授权
    • Semiconductor memory device and write control method thereof
    • 半导体存储器件及其写入控制方法
    • US07710790B2
    • 2010-05-04
    • US12116580
    • 2008-05-07
    • Satoshi Katagiri
    • Satoshi Katagiri
    • G11C7/10
    • G11C7/1078G11C7/1072G11C7/1096G11C7/22G11C13/0004G11C13/0061
    • A semiconductor memory device comprise a word line, a bit line intersecting the word line, a memory element arranged at intersections of the word line and the bit line and having different required time for a write operation according to a logical value of write data, a write driver supplying a write current to the bit line, a write control circuit controlling operations of the write driver, and a timing signal generation circuit supplying a timing signal to the write control circuit. The timing signal has a waveform including a pulse indicating a time of starting supplying the write current when a first logical level is to be written, a pulse indicating a time of ending supplying the write current if the first logical level is to be written, and a pulse indicating one of a time of starting supplying the write current and a time of ending supplying the write current when a second logical level is to be written.
    • 半导体存储器件包括字线,与字线相交的位线,布置在字线和位线的交点处的存储元件,并且根据写入数据的逻辑值具有不同的写入操作所需的时间, 向位线提供写入电流的写入驱动器,控制写入驱动器的操作的写入控制电路以及向写入控制电路提供定时信号的定时信号产生电路。 定时信号具有波形,该波形包括当要写入第一逻辑电平时指示开始提供写入电流的时间的脉冲,指示如果要写入第一逻辑电平则提供写入电流的结束时间的脉冲;以及 指示在写入第二逻辑电平时开始提供写入电流的时间中的一个和结束提供写入电流的时间的脉冲。
    • 7. 发明申请
    • Phase change memory device
    • 相变存储器件
    • US20090010049A1
    • 2009-01-08
    • US12216271
    • 2008-07-02
    • Satoshi Katagiri
    • Satoshi Katagiri
    • G11C11/00G11C7/00
    • G11C13/0023G11C13/0004G11C13/0038G11C13/0069G11C2013/0071G11C2013/0078
    • A phase change memory device is constituted of a plurality of memory cells including a plurality of phase change memory elements, which are arranged at intersecting points formed between a plurality of word lines and a plurality of bit lines. A write circuit which operates based on a write voltage source (Vwrite) is controlled by control signals (e.g. WE, RDIS, SDIS, and DIN) output from a control circuit which operates based on a voltage source (VDD), where Vwrite>VDD. All the control signals based on VDD are applied to the gates of N-channel MOS transistors included in the write circuit. This allows adequately high write currents to be supplied to phase change memory elements; and this eliminates the necessity of arranging a potential switch circuit in the write circuit, thus reducing the scale of the phase change memory device.
    • 相变存储器件由包括多个相变存储元件的多个存储单元组成,它们被布置在形成在多个字线和多个位线之间的相交点处。 基于写入电压源(Vwrite)工作的写入电路由从基于电压源(VDD)工作的控制电路输出的控制信号(例如WE,RDIS,SDIS和DIN)控制,其中Vwrite> VDD 。 基于VDD的所有控制信号被施加到写入电路中包括的N沟道MOS晶体管的栅极。 这允许向相变存储器元件提供足够高的写入电流; 并且这消除了在写入电路中布置潜在的开关电路的必要性,从而减小了相变存储器件的规模。
    • 8. 发明授权
    • Nonvolatile semiconductor memory device
    • 非易失性半导体存储器件
    • US06400601B1
    • 2002-06-04
    • US09602178
    • 2000-06-22
    • Naoaki SudoSatoshi Katagiri
    • Naoaki SudoSatoshi Katagiri
    • G11C1604
    • G11C16/3459G11C11/5621G11C11/5628G11C11/5642G11C16/26G11C16/3454G11C2211/5621
    • A nonvolatile semiconductor device is provided, which does not need excessive writing or verification operations, except for the originally required writing and verification operations. The data is arranged in the order from the lowest “11”, “10”, “01”, to the highest “01”. Four valued writing data are set in the latches 1 and 2 by data signals DL1 and DL2, and the latch 3 is initialized to “0”. Writing is executed by three stages, and before writing at each stage, if the latch 3 is “0”, the data is transferred to the latch 2. Writing is only executed when any one latch is “0”, and the latch is changed to “1” after the verification is completed. First, writing is executed up to the threshold value of the data “01”, except the data “11” where the latch 2 is “0”. Next, writing is executed for the data “00” and “01” up to the threshold value of the data “00”, where the latch 1 is “0”. Finally, the data “01” where the latch 2 is “0” is written up to the threshold value of “01”.
    • 提供了不需要过多的写入或验证操作的非易失性半导体器件,除了最初要求的写入和验证操作。 数据按照从最低“11”,“10”,“01”到最高“01”的顺序排列。 通过数据信号DL1和DL2在锁存器1和2中设置四值写入数据,并且锁存器3被初始化为“0”。 写入由三个阶段执行,并且在每个阶段写入之前,如果锁存器3为“0”,则数据被传送到锁存器2.写入仅在任何一个锁存器为“0”且锁存器被改变时才执行 到验证完成后为“1”。 首先,除了锁存器2为“0”的数据“11”之外,执行直到数据“01”的阈值的写入。 接下来,对数据“00”和“01”执行写入,直到数据“00”的阈值为止,其中锁存器1为“0”。 最后,将锁存器2为“0”的数据“01”写入阈值“01”。
    • 9. 发明授权
    • Phase change memory device
    • 相变存储器件
    • US08264871B2
    • 2012-09-11
    • US12216271
    • 2008-07-02
    • Satoshi Katagiri
    • Satoshi Katagiri
    • G11C11/00
    • G11C13/0023G11C13/0004G11C13/0038G11C13/0069G11C2013/0071G11C2013/0078
    • A phase change memory device is constituted of a plurality of memory cells including a plurality of phase change memory elements, which are arranged at intersecting points formed between a plurality of word lines and a plurality of bit lines. A write circuit which operates based on a write voltage source (Vwrite) is controlled by control signals (e.g. WE, RDIS, SDIS, and DIN) output from a control circuit which operates based on a voltage source (VDD), where Vwrite>VDD. All the control signals based on VDD are applied to the gates of N-channel MOS transistors included in the write circuit. This allows adequately high write currents to be supplied to phase change memory elements; and this eliminates the necessity of arranging a potential switch circuit in the write circuit, thus reducing the scale of the phase change memory device.
    • 相变存储器件由包括多个相变存储元件的多个存储单元组成,它们被布置在形成在多个字线和多个位线之间的相交点处。 基于写入电压源(Vwrite)工作的写入电路由从基于电压源(VDD)工作的控制电路输出的控制信号(例如WE,RDIS,SDIS和DIN)控制,其中Vwrite> VDD 。 基于VDD的所有控制信号被施加到写入电路中包括的N沟道MOS晶体管的栅极。 这允许向相变存储器元件提供足够高的写入电流; 并且这消除了在写入电路中布置潜在的开关电路的必要性,从而减小了相变存储器件的规模。