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1. 发明授权

US09340361B2 Electronic device transfer apparatus, electronic device handling apparatus, and electronic device testing apparatus 有权
标题翻译：电子设备传送设备，电子设备处理设备和电子设备测试设备
公开(公告)号：US09340361B2
公开(公告)日：2016-05-17
申请号：US13724234
申请日：2012-12-21
申请人： Haruki Nakajima , Hiroyuki Kikuchi , Tsuyoshi Yamashita
发明人： Haruki Nakajima , Hiroyuki Kikuchi , Tsuyoshi Yamashita
IPC分类号： G01R31/20 , B65G17/12 , G01R31/28
CPC分类号： B65G17/12 , B65G35/06 , G01R31/2893
摘要： There is provided an electronic device transfer apparatus which has an excellent capacity of transferring DUTs between trays.An electronic device transfer apparatus, which transfers DUTs between trays, includes a device conveying unit. The device conveying unit includes a plurality of shuttles which hold the DUTs, an endless first guide rail which guides the shuttles, and first to third feeders which move the shuttles on the first guide rail. The shuttles are movable on the first guide rail over the entire circumference of the rail.
摘要翻译：提供了一种电子设备传送设备，其具有在托盘之间传送DUT的优异容量。在托盘之间传送DUT的电子设备传送设备包括设备传送单元。设备传送单元包括多个保持DUT的梭子，引导梭子的环形第一导轨以及在第一导轨上移动梭子的第一至第三馈送器。梭子可以在轨道的整个圆周上的第一导轨上移动。

2. 发明授权

US06257319B1 IC testing apparatus 失效
标题翻译： IC测试仪器
公开(公告)号：US06257319B1
公开(公告)日：2001-07-10
申请号：US09357906
申请日：1999-07-21
申请人： Tadashi Kainuma , Noboru Masuda , Haruki Nakajima , Noriyuki Igarashi , Yuichi Nansai
发明人： Tadashi Kainuma , Noboru Masuda , Haruki Nakajima , Noriyuki Igarashi , Yuichi Nansai
IPC分类号： G01R3102
CPC分类号： G01R31/2868 , G01R31/2849 , G01R31/2874
摘要： An IC testing apparatus 1 for performing a test by applying at least a low temperature stress to ICs to be tested comprising a refrigerant cycle 210 wherein at least a compressor 211, condenser 212, expansion valve 214 and evaporator 215 are connected in this order, and a cold air applying line 220 having a blower 223 for supplying heat exchanged cold air by the evaporator 215 to the ICs to be tested.
摘要翻译：用于通过对要测试的IC至少应用低温应力进行测试的IC测试装置1包括至少压缩机211，冷凝器212，膨胀阀214和蒸发器215依次连接的制冷剂循环210，以及具有用于通过蒸发器215将热交换的冷空气供给到要测试的IC的鼓风机223的冷空气施加管线220。

3. 发明授权

US07298156B2 Electronic part test apparatus 有权
标题翻译：电子零件测试仪器
公开(公告)号：US07298156B2
公开(公告)日：2007-11-20
申请号：US10505959
申请日：2002-12-03
申请人： Hiroshi Okuda , Toshiyuki Kiyokawa , Haruki Nakajima
发明人： Hiroshi Okuda , Toshiyuki Kiyokawa , Haruki Nakajima
IPC分类号： G01R31/26 , G01R31/02
CPC分类号： G01R31/01 , G01R31/2851 , G01R31/2886 , G01R31/2887 , G01R31/2893
摘要： A holding side contact arm (317) for holding an IC to be tested is positioned on the optical axis (OP) of an alignment CCD camera (326) of an alignment device (320), the IC to be tested is inserted to a first opening (321a) formed on an alignment movable portion (321), and a contact member (317d) of the holding side contact arm (317) is brought to contact the alignment movable portion (321). Then, an alignment amount for correcting a position of the IC to be tested is calculated by taking an image by the camera (326) and performing image processing. A lock-and-free means (318) provided to a first contact arm (315a1) is made to be in a non-restricted state, a movable portion driving device (322) is driven based on the alignment amount, and the holding side contact arm (317) contacting the alignment movable portion (321) is moved with respect to a root side contact arm (316), so that alignment of a position of the IC to be tested is performed.
摘要翻译：用于保持待测试的IC的保持侧接触臂（317）位于对准装置（320）的对准CCD照相机（326）的光轴（OP）上，待测试的IC被插入到第一形成在对准可动部（321）上的开口（321a）和保持侧接触臂（317）的接触部件（317d）与对准可动部（321）接触。然后，通过摄像机（326）拍摄图像并进行图像处理来计算用于校正待测试IC的位置的对准量。设置到第一接触臂（315a，1N）的无锁装置（318）被制成处于非限制状态，可动部分驱动装置（322）被驱动为基于并且与对准可动部（321）接触的保持侧接触臂（317）相对于根侧接触臂（316）移动，从而进行被测试IC的位置的对准。

4. 发明授权

US06663092B2 Holding apparatus 失效
公开(公告)号：US06663092B2
公开(公告)日：2003-12-16
申请号：US10267956
申请日：2002-10-10
申请人： Toshio Kashiwazaki , Noriyuki Igarashi , Haruki Nakajima
发明人： Toshio Kashiwazaki , Noriyuki Igarashi , Haruki Nakajima
IPC分类号： B23F1904
CPC分类号： B25J15/0616 , B25B11/007 , B65G47/91 , H05K13/0409
摘要： A device holding apparatus comprising a base plate; a hollow pad guard provided on the base plate; a pad pin inserted to the pad guard movably in an axis direction and having a through hole; a pad provided at a tip of the pad pin and having a through hole connected to the through hole of the pad pin; and a bellows pad provided on the base plate, having a through hole connected to the through hole of the pad pin and being elastic in the axis direction; for holding by suction a device by the pad by applying a negative pressure to the through hole of the bellows pad, the through hole of the pad pin and the through hole of the pad.

5. 发明申请

US20050151551A1 Electronic part test apparatus 有权
标题翻译：电子零件测试仪器
公开(公告)号：US20050151551A1
公开(公告)日：2005-07-14
申请号：US10505959
申请日：2002-12-03
申请人： Hiroshi Okuda , Toshiyuki Kiyokawa , Haruki Nakajima
发明人： Hiroshi Okuda , Toshiyuki Kiyokawa , Haruki Nakajima
IPC分类号： G01R31/26 , G01R31/01 , H01L21/66 , G01R31/02
CPC分类号： G01R31/01 , G01R31/2851 , G01R31/2886 , G01R31/2887 , G01R31/2893
摘要： A holding side contact arm (317) for holding an IC to be tested is positioned on the optical axis (OP) of an alignment CCD camera (326) of an alignment device (320), the IC to be tested is inserted to a first opening (321a) formed on an alignment movable portion (321), and a contact member (317d) of the holding side contact arm (317) is brought to contact the alignment movable portion (321). Then, an alignment amount for correcting a position of the IC to be tested is calculated by taking an image by the camera (326) and performing image processing. A lock-and-free means (318) provided to a first contact arm (315a1) is made to be in a non-restricted state, a movable portion driving device (322) is driven based on the alignment amount, and the holding side contact arm (317) contacting the alignment movable portion (321) is moved with respect to a root side contact arm (316), so that alignment of a position of the IC to be tested is performed.
摘要翻译：用于保持待测试的IC的保持侧接触臂（317）位于对准装置（320）的对准CCD照相机（326）的光轴（OP）上，待测试的IC被插入到第一形成在对准可动部（321）上的开口（321a）和保持侧接触臂（317）的接触部件（317d）与对准可动部（321）接触。然后，通过摄像机（326）拍摄图像并进行图像处理来计算用于校正待测试IC的位置的对准量。设置到第一接触臂（315a，1N）的无锁装置（318）被制成处于非限制状态，可动部分驱动装置（322）被驱动为基于并且与对准可动部（321）接触的保持侧接触臂（317）相对于根侧接触臂（316）移动，从而进行被测试IC的位置的对准。

6. 发明授权

US06485009B2 Holding apparatus 失效
标题翻译：保持装置
公开(公告)号：US06485009B2
公开(公告)日：2002-11-26
申请号：US09809065
申请日：2001-03-16
申请人： Toshio Kashiwazaki , Norivuki Igarashi , Haruki Nakajima
发明人： Toshio Kashiwazaki , Norivuki Igarashi , Haruki Nakajima
IPC分类号： B23P1904
CPC分类号： B25J15/0616 , B25B11/007 , B65G47/91 , H05K13/0409
摘要： A device holding apparatus comprising a base plate; a hollow pad guard provided on the base plate; a pad pin inserted to the pad guard movably in an axis direction and having a through hole; a pad provided at a tip of the pad pin and having a through hole connected to the through hole of the pad pin; and a bellows pad provided on the base plate, having a through hole connected to the through hole of the pad pin and being elastic in the axis direction; for holding by suction a device by the pad by applying a negative pressure to the through hole of the bellows pad, the through hole of the pad pin and the through hole of the pad.
摘要翻译：一种装置保持装置，包括：基板; 设置在基板上的中空衬垫防护罩; 垫销，其沿轴向方向可移动地插入到所述垫护罩中，并具有通孔; 垫，其设置在所述垫销的前端，并具有连接到所述垫销的通孔的通孔; 以及设置在所述基板上的波纹管垫，具有与所述垫销的通孔连接并且沿轴向具有弹性的通孔; 用于通过对波纹管垫的通孔施加负压，垫销的通孔和垫的通孔来通过垫吸入装置来保持装置。

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