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    • 1. 发明申请
    • RADIATION HEATING EFFICIENCY BY INCREASING OPTICAL ABSORPTION OF A SILICON CONTAINING MATERIAL
    • 通过增加光学吸收含硅材料的辐射加热效率
    • US20110272709A1
    • 2011-11-10
    • US13093584
    • 2011-04-25
    • HIROJI HANAWAKyawwin Jason Maung
    • HIROJI HANAWAKyawwin Jason Maung
    • H01L33/60
    • H01L21/67115H01L21/68771
    • Embodiments of the present invention generally provide a process and apparatus for increasing the absorption coefficient of a chamber component disposed in a thermal process chamber. In one embodiment, a method generally includes providing a substrate carrier having a first surface and a second surface, the first surface is configured to support a substrate and being parallel and opposite to the second surface, subjecting the second surface of the substrate carrier to a surface treatment process to roughen the second surface of the substrate carrier, wherein the substrate carrier contains a material comprising silicon carbide, and forming an oxide-containing layer on the roughened second surface of the substrate carrier. The formed oxide-containing layer has optical absorption properties at wavelengths close to the radiation delivered from one or more energy sources used to heat the chamber component.
    • 本发明的实施例通常提供一种用于增加设置在热处理室中的腔室部件的吸收系数的方法和装置。 在一个实施例中,一种方法通常包括提供具有第一表面和第二表面的衬底载体,所述第一表面被配置为支撑衬底并且与第二表面平行且相对,使衬底载体的第二表面经受 使基底载体的第二表面粗糙化的表面处理工艺,其中基底载体含有包含碳化硅的材料,并在基底载体的粗糙化的第二表面上形成含氧化物层。 形成的含氧化物层在接近从用于加热室部件的一个或多个能量源递送的辐射的波长处具有光学吸收特性。
    • 4. 发明申请
    • APPARATUS FOR CHARACTERIZING A MAGNETIC FIELD IN A MAGNETICALLY ENHANCED SUBSTRATE PROCESSING SYSTEM
    • 用于表征磁场增强基板处理系统中的磁场的装置
    • US20100188077A1
    • 2010-07-29
    • US12360664
    • 2009-01-27
    • KARTIK RAMASWAMYHIROJI HANAWALAWRENCE WONGCHINH DINH
    • KARTIK RAMASWAMYHIROJI HANAWALAWRENCE WONGCHINH DINH
    • G01R33/02
    • G01R33/0206G01R33/0023
    • Embodiments of sensor devices for characterizing magnetic fields formed in substrate processing systems and methods of use thereof are provided herein. In some embodiments, an apparatus for characterizing a magnetic field in a substrate processing system may include a carrier having a form substantially similar to a substrate to be processed in the substrate processing system. One or more magnetic sensors are disposed on the carrier for measuring a magnitude of a magnetic field formed in the processing system in an x-, y-, and z-direction. A microprocessor is coupled to the one or more magnetic sensors to sample data representative of the magnitude of the magnetic field in the x-, y-, and z-directions proximate a position of each sensor. A memory device is coupled to the microprocessor for storing the sampled data. A power source is provided to supply power to each magnetic sensor and the microprocessor.
    • 本文提供了用于表征在基板处理系统中形成的磁场的传感器装置的实施例及其使用方法。 在一些实施例中,用于表征衬底处理系统中的磁场的装置可以包括具有基本上类似于在衬底处理系统中要处理的衬底的形式的载体。 一个或多个磁传感器设置在载体上,用于测量在x,y和z方向上在处理系统中形成的磁场的大小。 微处理器耦合到一个或多个磁性传感器以对表示在每个传感器的位置附近的x,y和z方向上的磁场的大小的数据进行采样。 存储器件耦合到微处理器以存储采样数据。 提供电源以向每个磁传感器和微处理器供电。