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1. 发明授权

US07846396B2 Sample holder for surface plasmon resonance measuring instruments 有权
标题翻译：表面等离子体共振测量仪器的样品架
公开(公告)号：US07846396B2
公开(公告)日：2010-12-07
申请号：US11141167
申请日：2005-05-31
申请人： Daniel B. Roitman , Gregory D. VanWiggeren
发明人： Daniel B. Roitman , Gregory D. VanWiggeren
IPC分类号： B01L3/00
CPC分类号： G01N21/553 , B01L3/5085 , B01L3/5088 , B01L2300/0822 , B01L2300/161 , B82Y20/00 , G02B5/008 , Y10T436/24 , Y10T436/25
摘要： A droplet sample holder, especially a sample holder for use in a measuring instrument utilizing surface plasmon resonance. The sample holder reduces or minimizes the measurement distortion result of the droplet “pherpheral concentration effect” by surrounding the analysis zone with a wettable (hydrophilic) zone that captures the periphery of the droplet to keep the pheriphery of the droplet and the increased concentration of the analyte out of the analysis zone. The wettable zone is surrounded by a nonwettable (hydrophobic) zone that restricts the periphery of the droplet to analysis zone and the wettable zone.
摘要翻译：液滴样品架，特别是用于使用表面等离子体共振的测量仪器中的样品架。样品架通过用可捕获液滴的周边的可湿性（亲水性）区围绕分析区来降低或最小化液滴“pherpheral浓度效应”的测量失真结果，以保持液滴的浓度，并且增加浓度分析出分析区。可湿润区域被不可润湿（疏水）区域围绕，该区域将液滴的周边限制到分析区域和可湿性区域。

2. 发明授权

US07737947B2 Tracking motion using an interference pattern 有权
标题翻译：使用干涉图案跟踪运动
公开(公告)号：US07737947B2
公开(公告)日：2010-06-15
申请号：US10687431
申请日：2003-10-16
申请人： Dale W. Schroeder , Marshall T. DePue , Ramakrishna Kakarala , Tong Xie , Gregory D. VanWiggeren
发明人： Dale W. Schroeder , Marshall T. DePue , Ramakrishna Kakarala , Tong Xie , Gregory D. VanWiggeren
IPC分类号： G09G5/08
CPC分类号： G06F3/0317 , G06F3/03545
摘要： A system, method, and device for tracking motion across a surface by creating an interference pattern by reflecting light from the surface. There is produced, as a result of sensor moving across the surface, at least one signal pattern corresponding to a detection of a dimension of the interference pattern. This detected dimension is associated with an assumed dimensional value to determine a distance traveled by the sensor.
摘要翻译：一种用于通过反射来自表面的光产生干涉图案来跟踪表面上的运动的系统，方法和装置。由于传感器在整个表面上移动，所产生的至少一个信号模式对应于干涉图案尺寸的检测。该检测尺寸与假设的尺寸值相关联，以确定传感器行进的距离。

3. 发明授权

US07009691B2 System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter 失效
公开(公告)号：US07009691B2
公开(公告)日：2006-03-07
申请号：US10157682
申请日：2002-05-29
申请人： Gregory D. VanWiggeren , Douglas M. Baney
发明人： Gregory D. VanWiggeren , Douglas M. Baney
IPC分类号： G01B9/02
CPC分类号： G01M11/331 , G01M11/31 , G01M11/338
摘要： By making combined interferometric and polarimetric measurements on a device under test, the relative phase uncertainty in device characterizations performed with a polarimeter or polarization analyzer alone is removed. This allows determination of the group delay to within a constant offset and the chromatic dispersion of the device under test.

4. 发明授权

US06900896B2 Method and system for measuring optical characteristics of a sub-component within a composite optical system 失效
标题翻译：用于测量复合光学系统内的子部件的光学特性的方法和系统
公开(公告)号：US06900896B2
公开(公告)日：2005-05-31
申请号：US10098702
申请日：2002-03-15
申请人： Ali Motamedi , Bogdan Szafraniec , Gregory D. VanWiggeren
发明人： Ali Motamedi , Bogdan Szafraniec , Gregory D. VanWiggeren
IPC分类号： G01J9/04 , G01B9/02 , G01M11/00 , G01M11/02 , G01B11/02 , G01N21/00
CPC分类号： G01M11/3172 , G01B2290/60
摘要： A method and system for measuring optical characteristics of a sub-component within a composite optical system is disclosed. In one embodiment, the present invention generates an optical response from a composite optical system. The present embodiment then separates an optical response of a sub-component from the optical response of the composite optical system. The present embodiment then determines the optical characteristics of the sub-component by utilizing at least one portion of the optical response of the sub-component.
摘要翻译：公开了一种用于测量复合光学系统内的子部件的光学特性的方法和系统。在一个实施例中，本发明从复合光学系统产生光学响应。然后，本实施例将子部件的光学响应与复合光学系统的光学响应分离。然后，本实施例通过利用子部件的光学响应的至少一部分来确定子部件的光学特性。

5. 发明授权

US07474404B2 Voltage sensor capable of contactless voltage measurement 失效
标题翻译：电压传感器可进行非接触式电压测量
公开(公告)号：US07474404B2
公开(公告)日：2009-01-06
申请号：US11741567
申请日：2007-04-27
申请人： Gregory D. VanWiggeren
发明人： Gregory D. VanWiggeren
IPC分类号： G01N21/55
CPC分类号： G01N21/553
摘要： A voltage sensor capable of single-point or simultaneous multi-point contactless voltage measurement has an electro-optic transducer, a surface plasmon resonance (SPR) and an optical system. The electro-optic transducer is operable to translate an electric field dependent on the voltage in a device under test field to a variation in refractive index. The surface plasmon resonance (SPR) transducer is juxtaposed with the electro-optic transducer and is operable to translate the variation in the refractive index of the electro-optic transducer to a variation in reflectivity. The optical system is configured to illuminate the SPR transducer with incident light at a surface plasmon resonance-inducing angle of incidence and to detect light reflected by the SPR transducer at a single point or at multiple points within a region.
摘要翻译：能够进行单点或同时多点非接触电压测量的电压传感器具有电光换能器，表面等离子体共振（SPR）和光学系统。电光换能器可操作以将取决于被测装置中的装置的电压的电场平移到折射率的变化。表面等离子体共振（SPR）传感器与电光换能器并置并且可操作以将电光换能器的折射率的变化转换为反射率的变化。光学系统被配置为用表面等离子体共振引起入射角的入射光照射SPR传感器，并且在单个点或在一个区域内的多个点处检测由SPR换能器反射的光。

6. 发明授权

US07317519B2 Swept-angle SPR measurement system 有权
标题翻译：扫频SPR测量系统
公开(公告)号：US07317519B2
公开(公告)日：2008-01-08
申请号：US10977669
申请日：2004-10-29
申请人： Gregory D. VanWiggeren , Douglas M. Baney
发明人： Gregory D. VanWiggeren , Douglas M. Baney
IPC分类号： G01N21/41 , G01N21/55
CPC分类号： G01N21/553
摘要： A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.
摘要翻译：扫掠角SPR测量系统根据控制信号使光束偏转在偏转角范围上，并将偏转光束映射到对应于偏转角范围的入射角范围内的目标。

7. 发明授权

US06977720B2 Characterization of active and passive optical properties of an optical device 失效
标题翻译：光学器件的有源和无源光学特性的表征
公开(公告)号：US06977720B2
公开(公告)日：2005-12-20
申请号：US10634952
申请日：2003-08-05
申请人： Douglas M. Baney , Gregory D. VanWiggeren
发明人： Douglas M. Baney , Gregory D. VanWiggeren
IPC分类号： G01M11/00 , G01N21/00 , H04B3/46 , H04B10/08 , H04B17/00
CPC分类号： G01M11/336 , G01M11/331 , G01M11/335 , G01M11/337
摘要： Characterizing active and passive properties of an optical device involves applying a local oscillator signal to a device under test (DUT) and providing a portion of the local oscillator signal (referred to as the reference local oscillator signal) directly to the an optical analyzer. Providing the reference local oscillator signal to the optical analyzer enables interferometric measurements associated with the DUT to be obtained along with direct measurements, where the interferometric measurements result from combining the portion of the local oscillator signal that is applied to the DUT with the reference local oscillator signal. The interferometric measurements are used to characterize passive properties of the DUT while the direct measurements are used to characterize active properties of the DUT.
摘要翻译：表征光学器件的有源和无源特性包括将本地振荡器信号施加到被测器件（DUT），并将本地振荡器信号（称为参考本地振荡器信号）的一部分直接提供给光学分析器。将参考本地振荡器信号提供给光学分析器，可以实现与DUT直接测量相关联的干涉测量，其中干涉测量结果是将施加到DUT的本地振荡器信号的部分与参考本地振荡器信号。干涉测量用于表征DUT的被动特性，而直接测量用于表征DUT的有源特性。

8. 发明申请

US20090180105A1 Swept-Angle SPR Measurement System 有权
标题翻译：扫频角SPR测量系统
公开(公告)号：US20090180105A1
公开(公告)日：2009-07-16
申请号：US11941769
申请日：2007-11-16
申请人： Gregory D. VanWiggeren , Douglas M. Baney
发明人： Gregory D. VanWiggeren , Douglas M. Baney
IPC分类号： G01N21/41 , G01N21/55
CPC分类号： G01N21/553
摘要： A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.
摘要翻译：扫掠角SPR测量系统根据控制信号在一定范围的偏转角度偏转光束，并将偏转光束映射到对应于偏转角范围的入射角范围内的目标。

9. 发明授权

US07023557B2 Parallel interferometric measurements using an expanded local oscillator signal 有权
标题翻译：使用扩展的本地振荡器信号的并行干涉测量
公开(公告)号：US07023557B2
公开(公告)日：2006-04-04
申请号：US10634358
申请日：2003-08-05
申请人： Gregory D. VanWiggeren , Douglas M. Baney
发明人： Gregory D. VanWiggeren , Douglas M. Baney
IPC分类号： G01B9/02 , G01N21/00
CPC分类号： G01M11/331 , G01M11/31
摘要： A system for characterizing optical properties of a device under test (DUT) uses an expanded local oscillator signal to perform multiple parallel interferometric measurements. In one system, the expanded local oscillator signal is optically connected to a lens array. The lens array focuses the expanded swept local oscillator signal into multiple beams. The multiple beams are then used in multiple parallel interferometric measurements. The multiple beams may be used as the reference beams or applied to the DUT and used as the test beams depending on the application. The test beams and reference beams are combined to perform the interferometric measurements. In another system, a portion of the expanded local oscillator signal is applied directly to a DUT as the test beam while another portion of the expanded local oscillator signal is used for the reference beam.
摘要翻译：用于表征被测器件（DUT）的光学特性的系统使用扩展的本地振荡器信号来执行多个并行干涉测量。在一个系统中，扩展的本地振荡器信号被光学连接到透镜阵列。透镜阵列将扩展的扫频本地振荡器信号聚焦成多个波束。然后将多个光束用于多个并行干涉测量。可以将多个光束用作参考光束或施加到DUT并且根据应用用作测试光束。测试光束和参考光束被组合以执行干涉测量。在另一个系统中，扩展的本地振荡器信号的一部分被直接施加到DUT作为测试波束，而扩展的本地振荡器信号的另一部分被用于参考波束。

10. 发明授权

US06882428B2 Optical analyzer and method for reducing relative intensity noise in interferometric optical measurements using a continuously tunable laser 失效
标题翻译：光学分析仪和使用连续可调激光器在干涉光学测量中降低相对强度噪声的方法
公开(公告)号：US06882428B2
公开(公告)日：2005-04-19
申请号：US10305597
申请日：2002-11-27
申请人： Douglas M. Baney , Gregory D. VanWiggeren , Ali Motamedi
发明人： Douglas M. Baney , Gregory D. VanWiggeren , Ali Motamedi
IPC分类号： G01B9/02 , G01M11/00 , G01N21/21 , G01N21/00
CPC分类号： G01M11/331 , G01N21/21
摘要： A heterodyne optical network analyzer and method for device characterization reduces the effect of relative intensity noise (RIN) in interferometric optical measurements by subtracting the measured intensities of first and second interference signals derived from an optical interferometer. The first and second interference signals are produced by combining a first lightwave transmitted to an optical device being characterized with a second lightwave, which is a delayed version of the first lightwave. The first and second lightwaves are derived by splitting an input lightwave having a continuously swept optical frequency generated by a light source, such as a continuously tunable laser.
摘要翻译：外差光网络分析仪和设备表征方法通过减去从光干涉仪得到的第一和第二干涉信号的测量强度来减少干涉光学测量中的相对强度噪声（RIN）的影响。第一和第二干扰信号是通过组合传输到第一光波的第二光波的第二光波组合而产生的第一和第二干涉信号。第二光波是第一光波的延迟版本。第一和第二光波通过分离由诸如连续可调谐激光器的光源产生的具有连续扫掠的光学频率的输入光波导出。

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