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    • 1. 发明授权
    • EEPROM flash memory erasable line by line
    • EEPROM闪存可逐行删除
    • US06687167B2
    • 2004-02-03
    • US10225513
    • 2002-08-20
    • Giovanni GuaitiniMarco PasottiGuido De SandreDavid IezziMarco PolesPier Luigi Rolandi
    • Giovanni GuaitiniMarco PasottiGuido De SandreDavid IezziMarco PolesPier Luigi Rolandi
    • G11C1604
    • G11C16/08G11C16/16
    • A non-volatile semiconductor memory device including an output connected to a row line and two supply terminals. Each elementary stage has an upper branch with a p-channel MOS transistor and a lower branch with an n-channel MOS transistor. In order to permit the memory to be erased line by line without having to use components capable of withstanding high voltages, each elementary stage has two supplementary MOS transistors, namely an n-channel transistor in the upper branch and a p-channel transistor in the lower branch. In this way it becomes possible to bias the elementary stages in such a manner the in the reading and programming phases the upper branch will function as pull-up and the lower branch as pull-down, while in the erasure phase the upper branch functions as pull-down and the lower branch as pull-up.
    • 一种非易失性半导体存储器件,包括连接到行线和两个电源端子的输出。 每个基本级具有具有p沟道MOS晶体管的上部分支和具有n沟道MOS晶体管的下部分支。 为了允许逐行擦除存储器,而不必使用能够承受高电压的部件,每个基本级具有两个辅助MOS晶体管,即上部支路中的n沟道晶体管和 下分支。 以这种方式,可以以这种方式偏置基本级,在读取和编程阶段,上部分支将用作上拉和下部分支作为下拉,而在擦除阶段,上部分支作为 下拉和下部分支作为上拉。
    • 4. 发明授权
    • Reading method and circuit for a non-volatile memory
    • 用于非易失性存储器的读取方法和电路
    • US06473340B1
    • 2002-10-29
    • US09699043
    • 2000-10-27
    • Marco PasottiGiovanni GuaitiniPier Luigi RolandiGuido De Sandre
    • Marco PasottiGiovanni GuaitiniPier Luigi RolandiGuido De Sandre
    • G11C1300
    • G11C11/5642G11C16/28
    • A reading circuit having an array branch connected via an array bit line to an array memory cell, the content of which is to be read; a reference branch connected via a reference bit line to a current generator stage supplying a reference current; a current/voltage converter stage connected to the array branch and to the reference branch, and supplying at an array node and at a reference node respectively an array potential and a reference potential, which are correlated to the currents flowing respectively in the array branch and in the reference branch; a comparator stage connected to the array node and the reference node for comparing the array and reference potentials; a sample and hold stage arranged between the array node and the comparator stage and selectively operable to sample and hold the array potential; and a switching off stage for switching off the array branch.
    • 一种读取电路,具有经由阵列位线连接到阵列存储单元的阵列分支,其内容将被读取; 通过参考位线连接到提供参考电流的电流发生器级的参考支路; 连接到阵列支路和参考支路的电流/电压转换器级,并且在阵列节点和参考节点处分别提供与分别在阵列支路中流动的电流相关联的阵列电位和参考电位, 在参考分支中; 连接到阵列节点的比较器级和用于比较阵列和参考电位的参考节点; 布置在所述阵列节点和所述比较器台之间并且可选择地可操作地采样和保持所述阵列电位的采样和保持级; 以及用于关闭阵列分支的关闭阶段。
    • 7. 发明授权
    • Method for controlled soft programming of non-volatile memory cells, in particular of the flash EEPROM and EPROM type
    • 用于非易失性存储单元的受控软编程的方法,特别是闪存EEPROM和EPROM类型的方法
    • US06381177B1
    • 2002-04-30
    • US09699309
    • 2000-10-27
    • Guido De SandreMarco PasottiPier Luigi Rolandi
    • Guido De SandreMarco PasottiPier Luigi Rolandi
    • G11C1600
    • G11C16/12
    • A method for controlled soft programming of a plurality of non-volatile memory cells, having bulk terminals connected to one another and to a common bulk line. The method includes supplying at least one soft programming pulse to the plurality of memory cells for a time interval. In this step, a bulk voltage with a rising negative ramp is applied to the common bulk line for the time interval. By this means, the threshold voltage of the cells is increased by body effect, and initially only the most depleted cells are soft programmed, with a limited drain current. Subsequently, when the bulk voltage increases, the cells with a higher threshold voltage are also soft programmed, until all the cells have reached the required minimum threshold value.
    • 一种用于多个非易失性存储器单元的受控软编程的方法,其具有彼此连接的批量端子和公共批量线。 该方法包括在一段时间间隔内向多个存储器单元提供至少一个软编程脉冲。 在该步骤中,具有上升负斜率的体电压在时间间隔上被施加到公共批量线。 通过这种方式,电池的阈值电压由于体效应而增加,并且最初只有最耗尽的电池被软编程,具有有限的漏极电流。 随后,当体电压增加时,具有较高阈值电压的单元也被软编程,直到所有单元达到所需的最小阈值。
    • 9. 发明授权
    • Circuit for parallel programming nonvolatile memory cells, with
adjustable programming speed
    • 并行编程电路非易失性存储单元,具有可编程速度
    • US6163483A
    • 2000-12-19
    • US447531
    • 1999-11-23
    • Marco PasottiRoberto CanegalloGiovanni GuaitiniPier Luigi Rolandi
    • Marco PasottiRoberto CanegalloGiovanni GuaitiniPier Luigi Rolandi
    • G11C16/12G11C7/00
    • G11C16/12
    • A circuit having a current mirror circuit with a first node and a second node connected, respectively, to a controllable current source and to a common node connected to the drain terminals of selected memory cells. A first operational amplifier has inputs connected to the first node and the second node, and an output connected to a control terminal of the selected memory cells and forming the circuit output. A second operational amplifier has a first input connected to a ramp generator, a second input connected to the circuit output, and an output connected to a control input of the controllable current source. Thereby, two negative feedback loops keep the drain terminals of the selected memory cells at a voltage value sufficient for programming, and feed the control terminal of the memory cells with a ramp voltage that causes writing of the selected memory cells. The presence of a bias source between the second node and the common node enables use of the same circuit also during reading.
    • 一种具有电流镜电路的电路,具有第一节点和第二节点,分别连接到可控电流源和连接到所选存储器单元的漏极端子的公共节点。 第一运算放大器具有连接到第一节点和第二节点的输入,以及连接到所选择的存储器单元的控制端子并形成电路输出的输出。 第二运算放大器具有连接到斜坡发生器的第一输入端,连接到电路输出端的第二输入端,以及连接到可控电流源的控制输入端的输出端。 因此,两个负反馈环路将所选择的存储单元的漏极端子保持在足以编程的电压值,并且以导致所选择的存储单元写入的斜坡电压馈送存储单元的控制端子。 在第二节点和公共节点之间存在偏置源,使得在读取期间也可以使用相同的电路。
    • 10. 发明授权
    • Device and method for programming nonvolatile memory cells with automatic generation of programming voltage
    • 用于自动生成编程电压来编程非易失性存储单元的装置和方法
    • US06466481B1
    • 2002-10-15
    • US09438232
    • 1999-11-12
    • Marco PasottiRoberto CanegalloGiovanni GuaitiniPier Luigi Rolandi
    • Marco PasottiRoberto CanegalloGiovanni GuaitiniPier Luigi Rolandi
    • G11C1606
    • G11C16/12
    • The device comprises a current mirror circuit having a first and a second node connected, respectively, to a constant current source and to a drain terminal of a memory cell to be programmed. A voltage generating circuit is connected to the first node to bias it at a constant reference voltage (VR); an operational amplifier has an inverting input connected to the first node, a non-inverting input connected to the second node, and an output connected to the control terminal of the memory cell. Thereby, the drain terminal of the memory cell is biased at the constant reference voltage, having a value sufficient for programming, and the operational amplifier and the memory cell form a negative feedback loop that supplies, on the control terminal of the memory cell, a ramp voltage (VPCX) that causes writing of the memory cell. The ramp voltage increases with the same speed as the threshold voltage and can thus be used to know when the desired threshold value is reached, and thus when programming must be stopped. The presence of a bias transistor between the second node and the memory cell enables use of the same circuit also during reading.
    • 该器件包括电流镜电路,其具有分别连接到待编程的存储器单元的恒定电流源和漏极端子的第一和第二节点。 电压产生电路连接到第一节点以将其以恒定的参考电压(VR)偏置; 运算放大器具有连接到第一节点的反相输入端,连接到第二节点的非反相输入端,以及连接到存储器单元的控制端子的输出端。 因此,存储单元的漏极端子被偏置在具有足以编程的值的恒定参考电压,并且运算放大器和存储单元形成负反馈回路,其在存储单元的控制端上提供 导致存储单元写入的斜坡电压(VPCX)。 斜坡电压以与阈值电压相同的速度增加,因此可以用于知道什么时候达到期望的阈值,并且因此当必须停止编程时。 在第二节点和存储器单元之间存在偏置晶体管,在读取期间也可以使用相同的电路。