会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 10. 发明申请
    • Memory cell arrangements and methods of manufacturing memory cell arrangements
    • 存储单元布置和制造存储单元布置的方法
    • US20080073694A1
    • 2008-03-27
    • US11526149
    • 2006-09-22
    • Josef WillerThomas MikolajickNicolas NagelMichael Specht
    • Josef WillerThomas MikolajickNicolas NagelMichael Specht
    • H01L29/788
    • H01L27/105H01L27/11526H01L27/11529
    • A memory cell arrangement includes a first memory cell string having a plurality of serially source-to-drain-coupled transistors, at least some of them being memory cells, a second memory cell string having a plurality of serially source-to-drain-coupled transistors, at least some of them being memory cells. A dielectric material is between and above the first memory cell string and the second memory cell string. A source/drain line groove is defined in the dielectric material. The source/drain line groove extends from a source/drain region of one transistor of the first memory cell string to a source/drain region of the second memory cell string. Electrically conductive filling material is disposed in the source/drain line groove. Dielectric filling material is disposed in the source/drain line groove between the source/drain regions.
    • 存储单元布置包括具有多个串联的源极至漏极耦合的晶体管的第一存储单元串,其中至少一些是存储单元;第二存储单元串,具有多个串联的源至漏耦合的晶体管 晶体管,其中至少有一些是存储单元。 电介质材料在第一存储单元串和第二存储单元串之间和之上。 源极/漏极线沟槽限定在电介质材料中。 源极/漏极线槽从第一存储单元串的一个晶体管的源极/漏极区域延伸到第二存储单元串的源极/漏极区域。 导电填充材料设置在源极/漏极线槽中。 电介质填充材料设置在源极/漏极区域之间的源极/漏极线沟槽中。