会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Scanning probe microscope
    • 扫描探针显微镜
    • US5496999A
    • 1996-03-05
    • US320490
    • 1994-10-11
    • Frederick I. LinkerMichael D. KirkJohn D. AlexanderSang-il ParkSung-il ParkIan R. SmithPeter R. Swift
    • Frederick I. LinkerMichael D. KirkJohn D. AlexanderSang-il ParkSung-il ParkIan R. SmithPeter R. Swift
    • G01Q10/02G01Q10/04G01Q10/06G01Q20/00G01Q30/02G01Q30/06G01Q60/10G01Q60/24G01Q70/02G02B21/00H01J37/26
    • G01Q10/04B82Y35/00G01Q10/06G01Q20/02G01Q30/025G01Q70/02G02B21/002Y10S977/851Y10S977/86Y10S977/873
    • A scanning probe microscope having numerous advantages is disclosed. Respective scanning force and scanning tunneling probes are removably mounted in the head using kinematic mounting techniques so that they may be substituted for one another without the need to adjust the cantilever deflection sensor. A linear position-sensitive photodetector in the deflection sensor eliminates further the need for adjustments. A motorized, non-stacked x,y coarse movement stage is kinematically positioned with respect to the base and features a minimized mechanical loop to reduce thermal and vibrational effects on the position of the sample. A z coarse movement stage positions the head kinematically with respect to the base and includes a motorized drive means which allows the height, tilt and pitch of the probe to be adjusted. The scanner includes x,y and z sample position detectors which provide an accurate measurement of the position of the sample with respect to the probe. The z position detector provides an output which is exclusive of sample tilt and which may be used as an output of the scanning probe microscope. The outputs of the x,y and z position detectors may also be connected in feedback loops with the controller to improve the performance of the scanning probe microscope.
    • 公开了具有许多优点的扫描探针显微镜。 使用运动学安装技术将各扫描力和扫描隧道探针可拆卸地安装在头部中,使得它们可以彼此替代,而不需要调整悬臂偏转传感器。 偏转传感器中的线性位置敏感光电检测器进一步消除了对调整的需要。 机动的,非堆叠的x,y粗移动台相对于基座运动地定位,并具有最小化的机械回路,以减少对样品位置的热和振动影响。 z粗移动台将头相对于基座运动地定位,并且包括允许调节探头的高度,倾斜和俯仰的电动驱动装置。 扫描器包括x,y和z采样位置检测器,其提供样品相对于探针的位置的精确测量。 z位置检测器提供的输出不包括样品倾斜,可用作扫描探针显微镜的输出。 x,y和z位置检测器的输出也可以与控制器连接在反馈回路中,以提高扫描探针显微镜的性能。
    • 2. 发明授权
    • Scanning probe microscope
    • 扫描探针显微镜
    • US5376790A
    • 1994-12-27
    • US850669
    • 1992-03-13
    • Frederick I. LinkerMichael D. KirkJohn D. AlexanderSang-il ParkSung-il ParkIan R. Smith
    • Frederick I. LinkerMichael D. KirkJohn D. AlexanderSang-il ParkSung-il ParkIan R. Smith
    • G01Q10/02G01Q10/04G01Q10/06G01Q20/00G01Q30/02G01Q30/06G01Q60/10G01Q60/24G01Q70/02G02B21/00H01J37/00
    • G01Q10/04B82Y35/00G01Q10/06G01Q20/02G01Q30/025G01Q70/02G02B21/002Y10S977/851Y10S977/86Y10S977/873
    • A scanning probe microscope having numerous advantages is disclosed. Respective scanning force and scanning tunneling probes are removably mounted in the head using kinematic mounting techniques so that they may be substituted for one another without the need to adjust the cantilever deflection sensor. A linear position-sensitive photodetector in the deflection sensor eliminates further the need for adjustments. A motorized, non-stacked x,y coarse movement stage is kinematically positioned with respect to the base and features a minimized mechanical loop to reduce thermal and vibrational effects on the position of the sample. A z coarse movement stage positions the head kinematically with respect to the base and includes a motorized drive means which allows the height, tilt and pitch of the probe to be adjusted. The scanner includes x,y and z sample position detectors which provide an accurate measurement of the position of the sample with respect to the probe. The z position detector provides an output which is exclusive of sample tilt and which may be used as an output of the scanning probe microscope. The outputs of the x,y and z position detectors may also be connected in feedback loops with the controller to improve the performance of the scanning probe microscope.
    • 公开了具有许多优点的扫描探针显微镜。 使用运动学安装技术将各扫描力和扫描隧道探针可拆卸地安装在头部中,使得它们可以彼此替代,而不需要调整悬臂偏转传感器。 偏转传感器中的线性位置敏感光电检测器进一步消除了对调整的需要。 机动的,非堆叠的x,y粗移动台相对于基座运动地定位,并具有最小化的机械回路,以减少对样品位置的热和振动影响。 z粗移动台将头相对于基座运动地定位,并且包括允许调节探头的高度,倾斜和俯仰的电动驱动装置。 扫描器包括x,y和z采样位置检测器,其提供样品相对于探针的位置的精确测量。 z位置检测器提供的输出不包括样品倾斜,可用作扫描探针显微镜的输出。 x,y和z位置检测器的输出也可以与控制器连接在反馈回路中,以提高扫描探针显微镜的性能。
    • 6. 发明授权
    • Large stage system for scanning probe microscopes and other instruments
    • 用于扫描探针显微镜和其他仪器的大型舞台系统
    • US5672816A
    • 1997-09-30
    • US448004
    • 1995-05-23
    • Sang-il ParkIan R. SmithMichael D. Kirk
    • Sang-il ParkIan R. SmithMichael D. Kirk
    • G01Q10/02G01Q20/02G01Q30/02G01Q30/18G01Q70/04G02B21/00G02B21/26G02B21/06G01B9/04G01N21/01G01N21/84
    • G01Q10/02B82Y35/00G01Q30/025G02B21/002G02B21/26Y10S977/87
    • A large scale horizontal translation stage for a microscope or other instrument particularly a scanning probe microscope is disclosed. The translation stage is provided with air bearings which allow it to float over a planar surface. The translation stage is kinematically mounted on a guiding member such that the horizontal position of the translation stage is defined by the guiding member but the translation stage is free to move in a direction perpendicular to the planar surface. To position a sample, the air bearings are actuated and the guiding member moves the translation stage to a desired position. An attractive force, preferably suction in the air bearings, is then applied to hold the translation stage firmly against the supporting surface while the sample is analyzed. The preferred embodiment includes two optical microscopes. The first optical microscope is directed substantially perpendicular to the plane of the sample and has a focal point which coincides with the surface of the sample when it is being positioned by the translation stage. The second optical microscope is directed obliquely and focused on the probe.
    • 公开了用于显微镜或其他仪器,特别是扫描探针显微镜的大型水平平移平台。 平移台设有空气轴承,允许其浮在平面上。 平移台被运动地安装在引导构件上,使得平移台的水平位置由引导构件限定,但是平移台可以在垂直于平面的方向上自由移动。 为了定位样品,空气轴承被致动并且引导构件将平移台移动到期望的位置。 然后施加吸引力,优选在空气轴承中的吸力,以在分析样品时将平移台牢固地保持在支撑表面上。 优选实施例包括两个光学显微镜。 第一光学显微镜被定向为基本上垂直于样品的平面,并且具有当通过平移台定位时与样品表面重合的焦点。 第二光学显微镜倾斜地定向并聚焦在探头上。