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    • 3. 发明授权
    • Process for producing semiconductor components between which contact is
made vertically
    • 用于制造在其之间进行触点的半导体部件的制造方法
    • US5767001A
    • 1998-06-16
    • US545650
    • 1995-11-03
    • Emmerich BertagnolliHelmut Klose
    • Emmerich BertagnolliHelmut Klose
    • H01L21/768H01L23/48H01L25/065H01L27/00H01L27/06H01L21/283H01L21/302
    • H01L25/0657H01L21/76898H01L23/481H01L25/50H01L27/0688H01L2225/06513H01L2225/06524H01L2225/06541H01L2924/0002
    • A process for producing components having a contact structure provides for vertical contact-making, in which, for the connection of a metal contact of a first component to a metal contact of a second component, the substrate is etched out, starting from the top, in a region provided for a vertical, conductive connection, this recess is filled with a metal so that said metal is connected to the surface of the metal contact, the rear side of the substrate is removed until the metal projects beyond the rear side, a metallization layer made of a metal having a low melting point, for example AuIn, is applied to the metal contact of the second component, the surface of the second component is provided with a planar layer, the two components are arranged vertically with respect to one another and a permanent contact is produced between the metal of the first component and the metallization layer of the second component by pressing one onto the other and heating.
    • PCT No.PCT / DE94 / 00486 Sec。 371日期:1995年11月3日 102(e)1995年11月3日日期PCT 1994年5月2日PCT PCT。 WO94 / 25981 PCT公开 日期1994年11月10日具有接触结构的部件的制造方法提供垂直接触,其中为了将第一部件的金属接触件与第二部件的金属接触件连接,蚀刻出基板, 从顶部开始,在设置用于垂直导电连接的区域中,该凹部填充有金属,使得所述金属连接到金属接触件的表面,基板的后侧被移除,直到金属突出超出 背面,由具有低熔点的金属(例如AuIn)制成的金属化层被施加到第二部件的金属接触件,第二部件的表面设置有平面层,两个部件被布置 在第一部件的金属和第二部件的金属化层之间通过将其彼此挤压并加热而产生永久接触。
    • 4. 发明授权
    • DRAM cell arrangement and method for the manufacture thereof
    • DRAM单元布置及其制造方法
    • US06172391B2
    • 2001-01-09
    • US09140972
    • 1998-08-27
    • Bernd GoebelEmmerich BertagnolliHelmut Klose
    • Bernd GoebelEmmerich BertagnolliHelmut Klose
    • H01L2978
    • H01L27/10841H01L21/76237H01L27/10808H01L27/10823H01L27/10876H01L29/4232H01L29/4238
    • An element that prevents the formation of a channel is arranged in a level of the channel region (Kaa) at one of two opposite sidewalls of a semiconductor structure that has a source/drain region (S/D1a) and a channel region (Kaa) of a vertical selection transistor arranged therebelow. The source/drain region as well as a respective word line (W1a) adjoin at both sidewalls. For folded bit lines (B1a), respectively two word lines (W1a) can be formed in the trenches (G2a). The elements of semiconductor structures neighboring along one of the trenches (G2a) are then arranged in alternation at a sidewall of the trench (G2a) and at a sidewall of a neighboring trench (D2a). A storage capacitor can be arranged over a substrate (1a) or can be buried in the substrate (1a). The connection of the selection transistor to a bit line (B1a) can ensue in many ways.
    • 防止形成通道的元件被布置在具有源极/漏极区域(S / D1a)和沟道区域(Kaa))的半导体结构的两个相对侧壁之一处的沟道区域(Kaa)的水平面中, 的垂直选择晶体管。 源极/漏极区域以及相应的字线(W1a)在两个侧壁处相邻。 对于折叠位线(B1a),可以在沟槽(G2a)中分别形成两个字线(W1a)。 然后沿沟槽(G2a)之一相邻的半导体结构的元件交替地布置在沟槽(G2a)的侧壁和相邻沟槽(D2a)的侧壁处。 存储电容器可以布置在基板(1a)上方或者可以被埋在基板(1a)中。 选择晶体管与位线(B1a)的连接可以以许多方式进行。
    • 6. 发明授权
    • Read-only memory cell device and method for its production
    • 只读存储单元器件及其生产方法
    • US06211019B1
    • 2001-04-03
    • US09130051
    • 1998-08-06
    • Helmut KloseEmmerich Bertagnolli
    • Helmut KloseEmmerich Bertagnolli
    • H01L218234
    • H01L27/1126H01L27/112
    • A read-only memory cell device includes a substrate formed of semiconductor material and having a main area. Memory cells in the vicinity of the main area are disposed in matrix form in columns and rows in a cell field. Each memory cell has in each case at least one MOS transistor with a source region, a drain region, a channel region, a gate dielectric and a gate electrode. The MOS transistors of a column are connected in series one after the other. Each column is connected to a bit line and the gate electrodes of the MOS transistors of a row are connected to a word line. The source and drain regions of the MOS transistors of a column are formed in source/drain webs running substantially parallel to one another at a predetermined spacing, are electrically insulated from one another, are produced from the semiconductor material of the substrate and have a predetermined web depth, starting from the main area of the substrate. The word lines for connection of the gate electrodes of the MOS transistors run transversely with respect to the longitudinal direction of the source/drain webs.
    • 只读存储单元器件包括由半导体材料形成并具有主区域的衬底。 在主区域附近的存储单元以矩阵形式在单元格区域中的列和行中排列。 每个存储单元在每种情况下都具有至少一个具有源极区,漏极区,沟道区,栅极电介质和栅电极的MOS晶体管。 柱的MOS晶体管一个接一个地串联连接。 每列连接到位线,并且一行的MOS晶体管的栅电极连接到字线。 柱的MOS晶体管的源极和漏极区域以预定的间隔彼此电绝缘的方式形成在源极/漏极幅片中,彼此电绝缘,由基板的半导体材料制成,并且具有预定的 纸幅深度,从基材的主要区域开始。 用于连接MOS晶体管晶体管的栅电极的字线相对于源极/漏极引线的纵向方向横向延伸。
    • 9. 发明授权
    • Method for manufacturing lateral bipolar transistors
    • 制造横向双极晶体管的方法
    • US5407843A
    • 1995-04-18
    • US261142
    • 1994-06-14
    • Emmerich BertagnolliHelmut Klose
    • Emmerich BertagnolliHelmut Klose
    • H01L21/331H01L29/73H01L21/265
    • H01L29/66265H01L29/7317Y10S148/01
    • Method for manufacturing lateral bipolar transistors on a SOI substrate, whereby a basic doping for the conductivity type of emitter and collector is produced in the silicon layer of this SOI substrate, insulation regions are produced outside the region provided for the transistor, contact layers and dielectric layers are applied over a highly doped emitter zone and over a highly doped collector zone produced by a mask technique and are structured, so that a trench is located over a base zone to be produced and in the middle between emitter zone and collector zone, an auxiliary layer is then conformally deposited surface-wide with constant thickness, as a result whereof the trench having the width is reduced to a gap having the width of the base zone to be produced, an implantation of dopant for the operational sign of the conductivity of the base is undertaken through this gap, the regions situated laterally relative to this base zone are shielded by the vertical portions of the auxiliary layer that cover the sidewalls of the trench, via holes are then etched into the auxiliary layer and into the dielectric layer and metal contacts are produced for the electrical connection of emitter, collector and base.
    • 在SOI衬底上制造横向双极晶体管的方法,由此在该SOI衬底的硅层中产生用于发射极和集电极的导电类型的基本掺杂,在为晶体管,接触层和电介质提供的区域之外产生绝缘区 层被施加在高度掺杂的发射极区域上并且通过掩模技术产生的高度掺杂的集电极区域上并且被构造为使得沟槽位于待产生的基极区域上方,并且位于发射极区域和收集器区域之间的中间, 辅助层然后以恒定的厚度共面沉积在表面宽度上,其结果是具有宽度的沟槽被减小到具有要产生的基极区宽度的间隙,掺杂剂的注入用于电导率的操作符号 通过该间隙进行基座,相对于该基部区域横向设置的区域被辅助件的垂直部分屏蔽 覆盖沟槽侧壁的通孔然后被蚀刻到辅助层中并进入电介质层,并且制造金属触点用于发射极,集电极和基极的电连接。