会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明申请
    • SEMICONDUCTOR INTEGRATED CIRCUIT
    • 半导体集成电路
    • US20110216573A1
    • 2011-09-08
    • US12884452
    • 2010-09-17
    • Keiko ABEShinobu FUJITA
    • Keiko ABEShinobu FUJITA
    • G11C11/15G11C11/21
    • G11C14/009G11C11/1659G11C11/1675G11C11/1693G11C11/21G11C14/0054G11C14/0081
    • According to one embodiment, a semiconductor integrated circuit includes first and second inverters, a first transistor which has a gate connected to a word line, a source connected to a first bit line, and a drain connected to an input terminal of the second inverter, a second transistor which has a gate connected to the word line, a source connected to a second bit line, and a drain connected to an input terminal of the first inverter, a first variable resistive element which has a first terminal connected to the drain of the first transistor, and a second terminal connected to an output terminal of the first inverter, and a second variable resistive element which has a first terminal connected to the drain of the second transistor, and a second terminal connected to an output terminal of the second inverter.
    • 根据一个实施例,半导体集成电路包括第一和第二反相器,具有连接到字线的栅极的第一晶体管,连接到第一位线的源极和连接到第二反相器的输入端子的漏极, 第二晶体管,其具有连接到字线的栅极,连接到第二位线的源极和连接到第一反相器的输入端子的漏极;第一可变电阻元件,其具有连接到第一位线的漏极的第一端子 第一晶体管和连接到第一反相器的输出端的第二端子,以及第二可变电阻元件,其具有连接到第二晶体管的漏极的第一端子,以及连接到第二晶体管的输出端子的第二端子 逆变器。
    • 5. 发明申请
    • NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE AND ITS READING METHOD
    • 非易失性半导体存储器件及其读取方法
    • US20100080054A1
    • 2010-04-01
    • US12406498
    • 2009-03-18
    • Keiko ABE
    • Keiko ABE
    • G11C11/14G11C11/416G11C7/06
    • H01L27/228G11C11/1659G11C11/1673G11C11/1675
    • A reading method includes: selecting the memory cell; performing a read operation on the selected memory cell to supply the read voltage, amplifying a first voltage read out from the selected memory element, outputting a second voltage obtained by amplifying the first voltage, and storing the second voltage as a first read state; performing a write operation on the selected memory cell to supply one of the first and second write voltages, regarding a third voltage appearing on the second line during the write operation as a second read state, comparing the first read state with the second read state, and deciding a state stored in the memory element before the read operation, as a read logic state on the basis of a result of the comparison; and writing the decided read logic state into the memory element if a logic state written in the write operation is different from the decided read logic state.
    • 读取方法包括:选择存储单元; 对所选择的存储单元执行读取操作以提供读取电压,放大从所选存储元件读出的第一电压,输出通过放大第一电压获得的第二电压,并将第二电压存储为第一读取状态; 对所选择的存储单元执行写入操作,以便在写入操作期间将出现在第二行上的第三电压提供第一和第二写入电压中的一个作为第二读取状态,将第一读取状态与第二读取状态进行比较, 并且根据比较结果,将在读取操作之前存储在存储元件中的状态判定为读取逻辑状态; 以及如果在所述写入操作中写入的逻辑状态与所述决定的读取逻辑状态不同,则将所述决定的读取逻辑状态写入所述存储器元件。
    • 8. 发明申请
    • SEMICONDUCTOR INTEGRATED CIRCUIT AND PROCESSOR
    • 半导体集成电路和处理器
    • US20130028012A1
    • 2013-01-31
    • US13556431
    • 2012-07-24
    • Shinobu FUJITAKeiko ABE
    • Shinobu FUJITAKeiko ABE
    • G11C11/16
    • G11C14/0054G11C11/16G11C14/0081
    • In one embodiment, there is provided a semiconductor integrated circuit that includes: a first inverter; a second inverter; a first transistor, wherein one end of the first transistor is connected to a first bit line and the other end of the first transistor is connected to a first input terminal of the first inverter; a first element group including second transistors, wherein one end of the first element group is connected to a first output terminal of the first inverter and the other end of the first element group is connected to a second bit line; and a second element group including third transistors and a magnetoresistive element whose magnetic resistance is varied. The second element group is disposed between the second output terminal of the second inverter and a first terminal or disposed between the first transistor and the first terminal.
    • 在一个实施例中,提供了一种半导体集成电路,其包括:第一反相器; 第二个逆变器; 第一晶体管,其中第一晶体管的一端连接到第一位线,第一晶体管的另一端连接到第一反相器的第一输入端; 包括第二晶体管的第一元件组,其中第一元件组的一端连接到第一反相器的第一输出端子,第一元件组的另一端连接到第二位线; 以及包括第三晶体管和磁阻变化的磁阻元件的第二元件组。 第二元件组设置在第二反相器的第二输出端子与第一端子之间或者设置在第一晶体管和第一端子之间。
    • 9. 发明申请
    • CACHE SYSTEM AND PROCESSING APPARATUS
    • 缓存系统和处理设备
    • US20120246412A1
    • 2012-09-27
    • US13234837
    • 2011-09-16
    • Kumiko NOMURAKeiko ABEShinobu FUJITA
    • Kumiko NOMURAKeiko ABEShinobu FUJITA
    • G06F12/08
    • G06F12/0897G06F12/123G06F2212/225Y02D10/13
    • According to an embodiment, in a cache system, the sequence storage stores sequence data in association with each piece of data to be stored in the volatile cache memory in accordance with the number of pieces of data stored in the nonvolatile cache memory that have been unused for a longer period of time than the data stored in the volatile cache memory or the number of pieces of data stored in the nonvolatile cache memory that have been unused for a shorter period of time than the data stored in the volatile cache memory. The controller causes the first piece of data to be stored in the nonvolatile cache memory in a case where it can be determined that the first piece of data has been unused for a shorter period of time than any piece of the data stored in the nonvolatile cache memory.
    • 根据实施例,在高速缓存系统中,序列存储器根据存储在非易失性高速缓冲存储器中的数据的数量与已经被使用的非易失性高速缓冲存储器中存储的数据数量相关联地存储与要存储在易失性高速缓存存储器中的每条数据相关联 比存储在易失性高速缓冲存储器中的数据或存储在非易失性高速缓冲存储器中的数据的时间长于存储在易失性高速缓冲存储器中的数据的时间长于较短时间段的更长时间段。 在可以确定第一条数据已被使用的时间短于存储在非易失性高速缓冲存储器中的任何数据的时间段的情况下,控制器使得第一条数据被存储在非易失性高速缓冲存储器中 记忆。