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    • 1. 发明授权
    • Redundant circuit configuration for an integrated semiconductor memory
    • 集成半导体存储器的冗余电路配置
    • US5657279A
    • 1997-08-12
    • US514602
    • 1995-08-14
    • Dominique SavignacDiether SommerOliver Kiehl
    • Dominique SavignacDiether SommerOliver Kiehl
    • G11C29/00G11C29/04G11C8/00
    • G11C29/806G11C29/812
    • A redundant circuit configuration for an integrated semiconductor memory has normal and redundant memory cells, in which addresses of arbitrary groups of memory cells of the memory are formed from a first partial address and a second partial address. M fixedly programmable address circuits, where M.gtoreq.1, are each assigned to one of the first partial addresses. Each fixedly programmable address circuit in an activated state has the second partial address of a group of normal memory cells to be replaced and has a first output at which an activation signal is applied in the activated state of the address circuit if the first partial address applied to the circuit configuration matches the first partial address assigned to the address circuit. One address comparator is common to all of the address circuits and has a first output. The comparator compares the second partial address stored in memory in one of the address circuits with the applied second partial address, at the applied activation signal of the one address circuit. The comparator supplies an enable signal at the first output of the address comparator if the two partial addresses match. Redundance decoders are triggered by the enable signal.
    • 用于集成半导体存储器的冗余电路配置具有正常和冗余的存储单元,其中存储器的任意存储单元组的地址由第一部分地址和第二部分地址形成。 M个固定可编程地址电路,其中M> / = 1,每个分配给第一部分地址之一。 处于激活状态的每个固定可编程地址电路具有要被替换的一组正常存储器单元的第二部分地址,并且具有第一输出,在第一输出处,如果应用了第一部分地址,则在激活状态下施加激活信号 电路配置匹配分配给地址电路的第一部分地址。 一个地址比较器对于所有地址电路是公共的,并且具有第一输出。 所述比较器在所述一个地址电路的所施加的激活信号上比较存储在其中一个地址电路中的所述第二部分地址与所施加的第二部分地址。 如果两个部分地址匹配,比较器将在地址比较器的第一个输出端提供使能信号。 冗余解码器由使能信号触发。
    • 4. 发明授权
    • Data transmission system with reduced power consumption
    • 数据传输系统功耗降低
    • US07321628B2
    • 2008-01-22
    • US10674859
    • 2003-09-30
    • Oliver Kiehl
    • Oliver Kiehl
    • H04L27/00
    • H04L25/4915
    • System and method for reducing power consumption and noise in a transmission system with an asymmetrically terminated transmission line. A preferred embodiment comprises encoding data words to reduce the number of times a given state appears in a code word. The preferred embodiment comprises counting the number of times a given state appears in a data word. If the count is greater than half of the total number of bits in the data word, then the data word is inverted and a weight bit can be set to the given state. If the count is less than (or equal to) half of the total number of bits, then the data word may be unchanged and the weight bit can be set to the inverse of the given state. The code word can be generated by appending the weight bit to the data word.
    • 具有不对称端接传输线的传输系统中降低功耗和噪声的系统和方法。 优选实施例包括编码数据字以减少给定状态在码字中出现的次数。 优选实施例包括对给定状态在数据字中出现的次数进行计数。 如果计数大于数据字中总位数的一半,则数据字被反转,并且可以将权重位设置为给定状态。 如果计数小于(或等于)总位数的一半,则数据字可以不变,并且权重位可以被设置为给定状态的倒数。 可以通过将权重位附加到数据字来生成代码字。
    • 5. 发明授权
    • Memory device and method using a sense amplifier as a cache
    • 使用读出放大器作为缓存的存储器件和方法
    • US07215595B2
    • 2007-05-08
    • US10967899
    • 2004-10-18
    • Oliver Kiehl
    • Oliver Kiehl
    • G11C8/18
    • G11C11/4091G11C7/06G11C7/12G11C11/4094G11C2207/005
    • A memory device includes a pair of complementary bitlines including a first bitline and a second bitline. A bitline precharge block is coupled between the first bitline and the second bitline. A sense amplifier is coupled to both the first bitline and the second bitline and a sense amplifier precharge block is coupled to the sense amplifier. The sense amplifier precharge block can be activated independently from the bitline precharge block. An isolation block is coupled between the pair of complementary bitlines and the bitline precharge block on one side and the sense amplifier and sense amplifier precharge block on another side.
    • 存储器件包括一对补充位线,包括第一位线和第二位线。 位线预充电块耦合在第一位线和第二位线之间。 读出放大器耦合到第一位线和第二位线,读出放大器预充电块耦合到读出放大器。 读出放大器预充电块可以独立于位线预充电块来激活。 隔离块耦合在一对互补位线和一侧的位线预充电块和另一侧的读出放大器和读出放大器预充电块之间。
    • 7. 发明授权
    • Symmetric clock receiver for differential input signals
    • 用于差分输入信号的对称时钟接收器
    • US06294940B1
    • 2001-09-25
    • US09598349
    • 2000-06-21
    • Oliver Kiehl
    • Oliver Kiehl
    • H03K300
    • H03K5/1534G06F1/10H03K5/00006
    • A clock circuit, in accordance with the present invention, includes a first circuit stage for providing a first output signal and a second output signal. The first circuit stage includes inputs for clock signals. A switch is coupled to the first stage for switching an output polarity by selecting one of the first output signal and the second output signal generated by the first circuit stage in accordance with a control signal. A second circuit stage is coupled to the first circuit stage through the switch. The second circuit stage for shaping the first and second output signals input thereto from the switch. The second circuit stage includes an output for outputting clock pulses based on the first and second output signals. The control signal is generated from the clock pulses.
    • 根据本发明的时钟电路包括用于提供第一输出信号和第二输出信号的第一电路级。 第一个电路级包括时钟信号的输入。 开关通过根据控制信号选择由第一电路级产生的第一输出信号和第二输出信号之一来耦合到第一级用于切换输出极性。 第二电路级通过开关耦合到第一电路级。 用于对从开关输入的第一和第二输出信号进行整形的第二电路级。 第二电路级包括用于基于第一和第二输出信号输出时钟脉冲的输出。 控制信号由时钟脉冲产生。
    • 9. 发明申请
    • CIRCUIT TEST INTERFACE AND TEST METHOD THEREOF
    • 电路测试接口及其测试方法
    • US20130082718A1
    • 2013-04-04
    • US13253061
    • 2011-10-04
    • Bret DaleOliver Kiehl
    • Bret DaleOliver Kiehl
    • G01R1/00
    • G01R31/3172G01R31/318572
    • A circuit test interface and a test method are disclosed. The circuit test interface may include a test voltage input pad, a test voltage output pad, and a plurality of input buffers. Each of the plurality of input buffers may have a first input terminal, a second input terminal, and an output terminal. The first input terminal of each respective input buffer may be coupled to one of a plurality of through-silicon vias (TSVs). The circuit test interface may further include a plurality of switch units. Each of the plurality of switch units may have a first terminal and a second terminal. The circuit test interface may further include a scan chain, coupled to both the output terminal of each of the plurality of input buffers and to the test voltage output pad.
    • 公开了电路测试接口和测试方法。 电路测试接口可以包括测试电压输入焊盘,测试电压输出焊盘和多个输入缓冲器。 多个输入缓冲器中的每一个可以具有第一输入端子,第二输入端子和输出端子。 每个相应输入缓冲器的第一输入端可以耦合到多个穿硅通孔(TSV)中的一个。 电路测试接口还可以包括多个开关单元。 多个开关单元中的每一个可以具有第一端子和第二端子。 电路测试接口还可以包括耦合到多个输入缓冲器中的每一个的输出端和测试电压输出焊盘两者的扫描链。