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    • 6. 发明申请
    • LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURING METHOD, AND METHOD OF APPLYING A PATTERN TO A SUBSTRATE
    • 光刻设备,设备制造方法和将图案应用于基板的方法
    • US20120058434A1
    • 2012-03-08
    • US13207123
    • 2011-08-10
    • Laurent KHUAT DUYNoud Jan Gilissen
    • Laurent KHUAT DUYNoud Jan Gilissen
    • G03F7/20G03B27/42
    • G02B27/40G03F9/7049
    • A lithographic apparatus is arranged to transfer a pattern from a patterning device onto a substrate, in which a measuring subsystem comprises one or (preferably) more alignment & level sensors (AS, LS) directed at the substrate near a patterning location of a patterning subsystem. The alignment sensor(s) is operable to recognize and measure alignment marks (P1) on the substrate passing by the sensor during relative motion of the substrate and patterning subsystem under control of the positioning subsystem. A processor combines measurements of relative locations of a plurality of said marks to provide measurement results with an accuracy sufficient for the positioning subsystem to position at least a first substrate portion at said patterning location relative to said alignment marks. A preliminary step obtains position relative to a known pattern (M1) on the patterning device. Measurements are taken and updated in real time during exposure of successive substrate portions.
    • 光刻设备被布置成将图案从图案形成装置转移到基板上,其中测量子系统包括在图案化子系统的图案化位置附近指向基板的一个或(优选地)更多的对准和电平传感器(AS,LS) 。 对准传感器可操作以在基板和构图子系统在定位子系统的控制下的相对运动期间识别和测量在传感器上通过的基板上的对准标记(P1)。 处理器结合了多个所述标记的相对位置的测量结果,以提供具有足够的精度的测量结果,该精度足以使定位子系统相对于所述对准标记在所述图案化位置处至少定位第一衬底部分。 预备步骤相对于图案形成装置上的已知图案(M1)获得位置。 在连续的衬底部分的曝光期间实时地进行测量和更新。