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    • 1. 发明授权
    • Reconfigurable I/O DRAM
    • 可重配置I / O DRAM
    • US6070262A
    • 2000-05-30
    • US833367
    • 1997-04-04
    • Mark W. KelloggTimothy J. DellErik L. HedbergClaude L. Bertin
    • Mark W. KelloggTimothy J. DellErik L. HedbergClaude L. Bertin
    • G06F11/10G06F12/00G11C7/10G11C29/00
    • G11C7/1057G06F11/1044G11C7/1006G11C7/1045G11C7/1051G11C7/1078G11C7/1084
    • A Dynamic Random Access Memory (DRAM) configurable by eight (.times.8) or by nine (.times.9). The DRAM has nine Data Input/Outputs (I/Os). The memory array is divided into two or more sub-arrays, with sub-array cells arranged in addressable rows and columns. When the DRAM is configured .times.8, one I/O is held in its high impedance state; one ninth of the DRAM's data path (between the array and the ninth I/O) is ignored; and, the entire array address space is available for data storage through eight I/Os. When the DRAM is configured .times.9, all nine I/Os are active; the DRAM I/O path is reconfigured with part of the array providing the ninth bit through the ninth I/O; and the array address space reduced by one-eighth. All nine bits may be from a common sub-array. Alternatively, sub-arrays may be paired so that when the DRAM is configured .times.9, eight bits are accessed in seven-eighths of one sub-array, with the ninth bit being accessed in one eighth of the other sub-array of the pair.
    • 动态随机存取存储器(DRAM)可由八(x8)或九(x9)配置。 DRAM具有9个数据输入/输出(I / O)。 存储器阵列被分成两个或更多个子阵列,子阵列单元被布置成可寻址的行和列。 当DRAM被配置为x8时,一个I / O保持在其高阻抗状态; DRAM的数据路径(阵列和第九个I / O之间)的九分之一被忽略; 并且整个阵列地址空间可用于通过八个I / O进行数据存储。 当DRAM配置为x9时,所有9个I / O都有效; DRAM I / O路径被配置为通过第九个I / O提供第九位的阵列的一部分; 并且阵列地址空间减少了八分之一。 所有9位可能来自公共子阵列。 或者,子阵列可以配对,使得当DRAM被配置为x9时,在一个子阵列的七分之八中访问八个比特,其中第九比特在该对的另一个子阵列的八分之一中被访问。
    • 2. 发明授权
    • High bandwidth DRAM with low operating power modes
    • 具有低工作功率模式的高带宽DRAM
    • US06178517B1
    • 2001-01-23
    • US09121933
    • 1998-07-24
    • Claude L. BertinTimothy J. DellErik L. HedbergMark W. Kellogg
    • Claude L. BertinTimothy J. DellErik L. HedbergMark W. Kellogg
    • G06F1200
    • G06F13/1684Y02D10/14
    • A high bandwidth DRAM is provided with two separate bus networks connecting the DRAM to a processor. One bus network is a high speed (e.g., 500 MHZ) 8:1 or 16:1 multiplexed I/O bus and the second is a slower (e.g., 64-bit) bus. The high-speed bus is used for example for graphic intensive applications which require fast access to large numbers of bits in the DRAM memory array. This of course results in higher power requirements. Since, not all applications require such large amounts of data to be transferred between the DRAM and the processor, the slower bus is provided for these less demanding applications such as word processors, spreadsheets, and the like. The slower bus requires less power to operate and therefore results in a power saving mode which, among other things, facilitates longer battery life.
    • 高带宽DRAM具有将DRAM连接到处理器的两个单独的总线网络。 一个总线网络是高速(例如,500MHz)8:1或16:1多路复用I / O总线,第二个是较慢(例如,64位)总线。 例如,高速总线用于需要快速访问DRAM存储器阵列中大量位的图形密集型应用。 这当然会导致更高的功率需求。 由于并非所有应用都需要在DRAM和处理器之间传输大量数据,所以为这些不太要求苛刻的应用程序提供较慢的总线,例如文字处理器,电子表格等。 较慢的总线需要更少的功率来进行操作,因此导致省电模式,其中尤其有助于延长电池寿命。
    • 3. 发明授权
    • Programmable burst length DRAM
    • 可编程突发长度DRAM
    • US5896404A
    • 1999-04-20
    • US833371
    • 1997-04-04
    • Mark W. KelloggTimothy J. DellErik L. HedbergClaude L. Bertin
    • Mark W. KelloggTimothy J. DellErik L. HedbergClaude L. Bertin
    • G06F12/16G06F11/10G11C7/10G11C11/401G11C29/42G11C29/00
    • G06F11/1008G11C7/1018G06F11/1052
    • A Dynamic Random Access Memory (DRAM) with a burst length programmable as eight (8) or nine (9) bytes. The DRAM array is divided into two or more sub-arrays, with sub-array cells arranged in addressable rows and columns. When the DRAM is programmed in Normal mode, the burst length is 8 and the entire array address space is available for data storage. When the DRAM is programmed for error checking (ECC mode), the burst length is nine and the array is reconfigured with part of the array providing the ninth byte. The DRAM's address space is reduced by one-eighth in ECC mode. Preferably, all nine locations are in the same page, with each page being divided into eight equal portions. In Normal mode all eight equal portions are data storage; and, in ECC mode, seven-eighths of the page is data storage, the remaining one eighth being assigned to check bit storage.
    • 具有可编程为八(8)或九(9)字节的突发长度的动态随机存取存储器(DRAM)。 DRAM阵列分为两个或更多个子阵列,子阵列单元以可寻址的行和列排列。 当DRAM在正常模式下编程时,突发长度为8,整个阵列地址空间可用于数据存储。 当DRAM被编程用于错误检查(ECC模式)时,突发长度为9,并且阵列被配置为提供第九个字节的阵列的一部分。 在ECC模式下,DRAM的地址空间减少了八分之一。 优选地,所有九个位置在同一页面中,每个页面被分成八个相等的部分。 在正常模式下,所有八个相等的部分都是数据存储; 并且在ECC模式中,页面的七分之一是数据存储,剩下的八分之一被分配给校验位存储。
    • 5. 发明授权
    • Narrow data width DRAM with low latency page-hit operations
    • 狭窄的数据宽度DRAM,具有低延迟页命中操作
    • US5969997A
    • 1999-10-19
    • US942825
    • 1997-10-02
    • Michael P. ClintonMarc R. FaucherErik L. HedbergMark W. KelloggWilbur D. Pricer
    • Michael P. ClintonMarc R. FaucherErik L. HedbergMark W. KelloggWilbur D. Pricer
    • G11C11/41G11C11/401G11C11/407G11C11/409G11C15/00
    • G11C11/409G11C11/407
    • A high speed Random Access Memory (RAM) array device includes several logical banks, each of which can be uniquely addressed. Each of these logical banks contains a unique memory array segment and associated page register, the latter serving as a temporary storage location during high-speed page hit operations. To reduce latency during an initial page hit, further array optimization is realized by segmenting each logical bank into two segments with one, smaller segment, comprising a faster random access memory (FRAM) for storing initial data in a data stream. A high speed page register connects the FRAM directly to a multiplexer/demultiplexer connected to the device I/O ports bypassing an internal bus protocol such that the initial data can be transferred between the FRAM and the I/O ports faster thereby improving page-hit latency. Hence, segmenting the logical banks to include only a small high speed segment results in a performance gain approaching what could be achieved by implementing the entire memory device with a high speed FRAM, but at much lower cost.
    • 高速随机存取存储器(RAM)阵列器件包括几个逻辑存储体,每个逻辑存储体可以被唯一地寻址。 这些逻辑组中的每一个包含唯一的存储器阵列段和相关联的页寄存器,后者在高速页命中操作期间用作临时存储位置。 为了在初始页面命中期间减少延迟,通过将每个逻辑存储体分割成具有一个较小段的两个段来实现进一步的阵列优化,其包括用于在数据流中存储初始数据的更快的随机存取存储器(FRAM)。 高速页寄存器将FRAM直接连接到绕过内部总线协议的设备I / O端口连接的多路复用器/解复用器,从而可以更快地在FRAM和I / O端口之间传输初始数据,从而提高页命中率 潜伏。 因此,将逻辑存储体分割为仅包含小的高速段导致通过以高速FRAM实现整个存储器件而可以以低得多的成本实现可达到的性能增益。
    • 6. 发明授权
    • Carrier for test, burn-in, and first level packaging
    • 用于测试,老化和一级包装的载体
    • US07132841B1
    • 2006-11-07
    • US09588617
    • 2000-06-06
    • Claude L. BertinWayne F. EllisMark W. KelloggWilliam R. TontiJerzy M. ZalesinskiJames M. LeasWayne J. Howell
    • Claude L. BertinWayne F. EllisMark W. KelloggWilliam R. TontiJerzy M. ZalesinskiJames M. LeasWayne J. Howell
    • G01R31/26G01R31/28
    • G01R31/2867G11C5/04G11C29/06G11C29/1201G11C29/48G11C29/56016G11C29/785G11C2029/2602G11C2029/5602H01L22/22H01L22/32H01L2924/0002H01L2924/00
    • A plurality of semiconductor devices are provided on a carrier for testing or burning-in. The carrier is then cut up to provide single chip-on-carrier components or multi-chip-on-carrier components. The carrier is used as a first level package for each chip. Thus, the carrier serves a dual purpose for test and burn-in and for packaging. A lead reduction mechanism, such as a built-in self-test engine, can be provided on each chip or on the carrier and is connected to contacts of the carrier for the testing and burn-in steps. The final package after cutting includes at least one known good die and may include an array of chips on the carrier, such as a SIMM or a DIMM. The final package can also be a stack of chips each mounted on a separate carrier. The carriers of the stack are connected to each other through a substrate mounted along a side face of the stack that is electrically connected to a line of pads along an edge of each carrier. The carrier is formed of a flex material. It can also be formed of printed circuit board material. A window in the flex permits invoking redundancy on each chip after burn-in is complete, significantly improving yield as compared with present schemes that do not permit repair after burn-in.
    • 在载体上提供多个半导体器件用于测试或烧录。 然后将载体切割以提供单个芯片上载波部件或多芯片载波部件。 载体用作每个芯片的第一级封装。 因此,载体用于测试和烧录和包装的双重目的。 可以在每个芯片或载体上提供诸如内置自检引擎的引线减少机构,并且连接到载体的触点用于测试和老化步骤。 切割后的最终包装包括至少一个已知的良好的模具,并且可以包括载体上的芯片阵列,例如SIMM或DIMM。 最终的包装也可以是一堆芯片,每个芯片都安装在单独的载体上。 堆叠的载体通过沿着堆叠的侧面安装的基板彼此连接,该基板沿着每个载体的边缘电连接到焊盘一排。 载体由柔性材料形成。 它也可以由印刷电路板材料形成。 柔性窗口允许在烧坏完成后在每个芯片上调用冗余度,与不允许在老化后修复的现有方案相比,显着提高产量。
    • 8. 发明授权
    • Power management on a memory card having a signal processing element
    • 对具有信号处理元件的存储卡进行电源管理
    • US06327664B1
    • 2001-12-04
    • US09302916
    • 1999-04-30
    • Timothy J. DellBruce G. HazelzetMark W. KelloggChristopher P. Miller
    • Timothy J. DellBruce G. HazelzetMark W. KelloggChristopher P. Miller
    • G06F132
    • G06F1/3275G06F1/3203Y02D10/13Y02D10/14
    • An improved memory module and its use in a computer system is provided. The module includes a DSP first and second individually addressable banks of memory chips. The first bank is configured to function principally under the control of the signal processing element and the second bank is configured to function principally under the control of a system memory controller, although all the portions of each of the memory banks is addressable by both the signal processing element and the system memory controller. Both banks of memory chips can be placed in at least one higher power state and at least one lower power state by either the system memory controller or the DSP. The activity of each bank is sensed while in the higher power state, and the condition of each of the banks is sensed with respect to any activity during operation of the memory bank at the higher power state. The power state of each bank can be changed by either the signal processing element or the system memory controller responsive to preselected conditions of each bank. Each memory bank is returned to a predetermined known condition when changing from a lower power state to a higher power state. This is especially important when the memory bank assigned to the system controller is placed in another state by the DSP.
    • 提供了一种改进的存储器模块及其在计算机系统中的应用。 该模块包括DSP第一和第二可单独寻址的存储器芯片组。 第一组被配置为主要在信号处理元件的控制下起作用,并且第二存储体被配置为主要在系统存储器控制器的控制下起作用,尽管每个存储体的所有部分都可以由信号 处理元件和系统存储器控制器。 两个存储芯片组可以通过系统存储器控制器或DSP被置于至少一个较高功率状态和至少一个较低功率状态。 在较高功率状态下感测每个存储体的活动,并且相对于在较高功率状态的存储体的操作期间的任何活动来感测每个存储体的状况。 响应于每个银行的预选条件,可以通过信号处理元件或系统存储器控制器改变每个存储体的电源状态。 当从较低功率状态改变到较高功率状态时,每个存储体返回到预定的已知状态。 当分配给系统控制器的存储体被DSP置于另一状态时,这尤其重要。