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    • 4. 发明授权
    • Wafer backside protection apparatus
    • 晶片背面保护装置
    • US06220771B1
    • 2001-04-24
    • US09461349
    • 1999-12-15
    • Fu-Ching TungHong-Ming ChenWu-Lang LinChia-Ming ChenJen-Rong HuangPeter L. MahnekeJanathan Wang
    • Fu-Ching TungHong-Ming ChenWu-Lang LinChia-Ming ChenJen-Rong HuangPeter L. MahnekeJanathan Wang
    • G03D500
    • H01L21/6708G03F7/707G03F7/70916H01L21/67028
    • A wafer backside protection apparatus includes a motor, a vacuum chuck, an annular seat and a top cover. The motor has an output shaft upon which the chuck is mounted. The chuck has a front surface to suck and hold a wafer from its backside. The chuck has a backside in which a water guard ring and a plurality of slant bores are formed. The slant bores run from the water guard ring through the wafer front surface. The annular seat is located below the chuck and has two symmetrical slant nozzles projecting toward motor rotating direction for ejecting protection liquid to the water guard ring. Protection liquid may be spun and splashed out through the slant bores to form a protection liquid film between the chuck and the wafer backside due to centrifugal force resulting from chuck and wafer rotation driven by the motor. The protection liquid film may protect wafer backside from chemical erosion and contamination resulting from wafer production process.
    • 晶片背面保护装置包括电动机,真空吸盘,环形座和顶盖。 马达具有输出轴,卡盘安装在该输出轴上。 卡盘具有从其背面吸取并保持晶片的前表面。 卡盘具有背面,其中形成有防水环和多个倾斜孔。 倾斜的孔从防水环穿过晶片正面。 环形座位于卡盘下方,并具有朝向马达旋转方向突出的两个对称倾斜喷嘴,用于将防护液喷射到防水环上。 保护液体可以通过倾斜孔旋转溅出,由卡盘和由马达驱动的晶片旋转产生的离心力在卡盘和晶片背面之间形成保护液膜。 保护液膜可以保护晶片背面免受晶片生产过程中的化学侵蚀和污染。
    • 6. 发明授权
    • Open-circuit testing system and method
    • 开路测试系统及方法
    • US07612568B2
    • 2009-11-03
    • US11743641
    • 2007-05-02
    • Chien-Wei ChenChia-Ming Chen
    • Chien-Wei ChenChia-Ming Chen
    • G01R31/00G01R31/02
    • G01R31/046
    • The invention discloses a testing system and method suitable for determining the connection state of an electronic component in an electronic device assembly. In an embodiment, the testing system comprises a signal sensing unit configured to provide a sensed signal induced by capacitive coupling in response to the output of a testing signal passing through a tested pin, a signal processor unit configured to filter and over-sample the sensed signal to obtain a digital signal, and an analyzer unit configured to compute the digital signal for determining a connection state of the test pin.
    • 本发明公开了一种适用于确定电子设备组件中的电子部件的连接状态的测试系统和方法。 在一个实施例中,测试系统包括信号感测单元,其被配置为响应于通过测试引脚的测试信号的输出来提供由电容耦合引起的感测信号,信号处理器单元被配置为对所感测的信号进行滤波和过采样 信号以获得数字信号,以及分析器单元,被配置为计算用于确定测试引脚的连接状态的数字信号。
    • 9. 发明授权
    • Audio signal adjusting system and method
    • 音频信号调节系统及方法
    • US08422700B2
    • 2013-04-16
    • US12916403
    • 2010-10-29
    • Chia-Ming Chen
    • Chia-Ming Chen
    • H03G3/00H03G3/20H04R29/00
    • H03G3/32
    • An audio signal adjusting method is disclosed, which comprises steps of: determining an environment noise level; calculating a ratio between an environment noise level and an output audio signal level to form a measuring value; comparing the measuring value with a predetermined threshold as an audio comfort value; and determining whether or not to adjust an audio signal parameter according to the comparison result. If the comparison result is incorrect, then the audio signal parameter is adjusted, and the output audio signal should be outputted according to the adjusted audio signal parameter. The audio signal adjusting method can satisfy the different user needs on different environment types.
    • 公开了一种音频信号调整方法,包括以下步骤:确定环境噪声电平; 计算环境噪声电平和输出音频信号电平之间的比率以形成测量值; 将测量值与预定阈值进行比较,作为音频舒适值; 以及根据比较结果确定是否调整音频信号参数。 如果比较结果不正确,则调整音频信号参数,并根据调整后的音频信号参数输出输出音频信号。 音频信号调节方式可以满足不同用户对不同环境的需求。
    • 10. 发明申请
    • DISCHARGE DEVICE AND TEST SYSTEM HAVING THE SAME
    • 放电装置和测试系统
    • US20120161779A1
    • 2012-06-28
    • US13048572
    • 2011-03-15
    • Jiau-Cheng ShiauChia-Ming Chen
    • Jiau-Cheng ShiauChia-Ming Chen
    • G01R31/02H99Z99/00
    • G01R31/2832
    • A discharge device and a test system having the same are provided. The test system comprises at least one power supply module, a test instrument and a discharge device. The power supply module supplies power to a device under test. The test instrument is connected to the device under test. The test instrument performs a plurality of on-power test procedures on the device under test. The discharge device comprises at least one first constant current discharge unit disposed in the test instrument, at least one second constant current discharge unit disposed in the power supply module and a control module. The control module controls the first and the second constant current discharge units to drain a constant current from the device under test and the power supply module to perform a discharge process when each one of the on-power test procedures is finished.
    • 提供了具有该放电装置的放电装置和测试系统。 测试系统包括至少一个电源模块,测试仪器和放电设备。 电源模块为被测设备供电。 测试仪器连接到被测设备。 测试仪器在被测设备上执行多个通电试验程序。 放电装置包括设置在测试仪器中的至少一个第一恒定电流放电单元,设置在电源模块中的至少一个第二恒定电流放电单元和控制模块。 所述控制模块控制所述第一和第二恒定电流放电单元,以从所述待测器件排出恒定电流,并且当所述接通电力测试程序完成时,所述电源模块执行放电过程。