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1. 发明授权

US09261536B2 Test contactor for electrical testing of electronic components 有权
标题翻译：用于电子元件电气测试的测试接触器
公开(公告)号：US09261536B2
公开(公告)日：2016-02-16
申请号：US13584971
申请日：2012-08-14
申请人： Hing Suen Siu , Yu Sze Cheung , Chi Wah Cheng , Kai Fung Lau
发明人： Hing Suen Siu , Yu Sze Cheung , Chi Wah Cheng , Kai Fung Lau
IPC分类号： G01R31/20 , G01R31/02 , G01R31/26 , G01R31/302 , H01R11/18 , H01R13/00 , H05K1/00 , G01R1/067 , G01R1/04 , G01R1/073
CPC分类号： G01R1/06772 , G01R1/0416 , G01R1/07342
摘要： A testing apparatus for electronic components comprises a mounting block and a plurality of contact strips arranged on the mounting block. The contact strips are configured such that electrical leads of an electronic component are operative to press against and bend the contact strips in a biasing direction to ensure good contact between the electrical leads and the contact strips during testing of the electronic component. Further, a preload block located on the mounting block is operative to contact and apply a pre-stress force onto the contact strips in the biasing direction prior to contact between the electrical leads and the contact strips.
摘要翻译：一种用于电子部件的测试装置包括安装块和布置在安装块上的多个接触条。接触条被配置成使得电子部件的电引线可操作以在偏置方向上按压和弯曲接触片，以确保电子部件测试期间电引线和接触片之间的良好接触。此外，位于安装块上的预加载块可操作以在电引线和接触片之间接触之前在偏压方向上接触并施加预接触力。

2. 发明授权

US09218995B2 Transfer apparatus for transferring electronic devices and changing their orientations 有权
标题翻译：用于传送电子设备和改变其方向的传送设备
公开(公告)号：US09218995B2
公开(公告)日：2015-12-22
申请号：US14258463
申请日：2014-04-22
申请人： Chi Wah Cheng , Kai Fung Lau , Hing Suen Siu
发明人： Chi Wah Cheng , Kai Fung Lau , Hing Suen Siu
IPC分类号： B65G47/84 , H01L21/677 , H01L21/67
CPC分类号： H01L21/67718 , H01L21/67132
摘要： A transfer apparatus for transferring electronic devices from a wafer to a test handler. The transfer apparatus comprises: i) a rotary device rotatable about an axis; and ii) a plurality of holders configured to hold the electronic devices for transfer from the wafer to the test handler. The plurality of holders are coupled to, and extendable from, the rotary device to pick the electronic devices from the wafer. Specifically, the plurality of holders are arranged circumferentially around, and inclined with respect to, the axis of the rotary device, so as to change an orientation of the electronic devices on the wafer to a desired orientation of the electronic devices on the test handler.
摘要翻译：一种用于将电子设备从晶片传送到测试处理器的传送设备。传送装置包括：i）可围绕轴线旋转的旋转装置; 以及ii）多个保持器，其构造成保持用于从晶片转移到测试处理器的电子设备。多个保持器联接到旋转装置并且可从旋转装置延伸以从晶片拾取电子装置。具体地说，多个保持器周向地布置并相对于旋转装置的轴线倾斜，以便将晶片上的电子设备的取向改变到测试处理器上的电子设备的期望取向。

3. 发明授权

US08967368B2 Apparatus for processing electronic devices 有权
标题翻译：电子设备处理装置
公开(公告)号：US08967368B2
公开(公告)日：2015-03-03
申请号：US14047143
申请日：2013-10-07
申请人： Chi Wah Cheng , Kai Fung Lau
发明人： Chi Wah Cheng , Kai Fung Lau
IPC分类号： B65G29/00 , B65G47/84 , H01L21/677
CPC分类号： B65G29/00 , B65G47/846 , H01L21/677 , H01L21/67721
摘要： An apparatus for processing electronic devices includes a rotary turret having first device concentric around the rotary turret, which transfer the electronic devices; a rotary wheel having second device holders concentric around the rotary wheel, which receive the electronic devices and a processing device to process the electronic devices. The rotary turret rotates the first device holders along a first circular path, and the rotary wheel rotates the second device holders along a second circular path. The first axis of the rotary turret is perpendicular to the second axis of the rotary wheel, and that a projection of the second circular path of the second device holders in a direction perpendicular to the second axis of the rotary wheel onto the first circular path of the first device holders defines a line from the inside to the outside of the first circular path of the first device holders.
摘要翻译：一种用于处理电子设备的设备包括：旋转转台，其具有围绕旋转转台同心的第一设备，其传送电子设备; 旋转轮具有围绕旋转轮同心的第二装置保持器，其接收电子装置和处理装置以处理电子装置。旋转转台沿着第一圆形路径旋转第一装置保持器，并且旋转轮沿着第二圆形路径旋转第二装置保持器。旋转转台的第一轴线垂直于旋转轮的第二轴线，并且第二装置保持器的第二圆形路径在垂直于旋转轮的第二轴线的方向上的突起到第一圆形路径上第一装置保持器限定从第一装置保持器的第一圆形路径的内侧到外侧的线。

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