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    • 5. 发明授权
    • Dynamic threshold for VCO calibration
    • VCO校准的动态阈值
    • US06949981B2
    • 2005-09-27
    • US10708233
    • 2004-02-18
    • Joseph NatonioMichael A. Sorna
    • Joseph NatonioMichael A. Sorna
    • H03L7/00H03L7/099H03L7/10H03L7/18
    • H03L7/099H03L7/10H03L7/18
    • A voltage controlled oscillator (VCO) is provided which includes a threshold level setting circuit operable to set a lower variable threshold level and to set an upper variable threshold level. The VCO includes a frequency band selection unit operable to adjust a frequency band setting of the VCO to one of a plurality of frequency band settings. The VCO further includes a comparator operable to determine whether a control voltage of the VCO falls between the lower threshold level and the upper threshold level. The VCO further includes a threshold adjustment and calibration circuit operable to maintain the frequency band setting when the control voltage falls between the lower and upper threshold levels. Otherwise, when the control voltage lies below the lower threshold level, the lower threshold level is adjusted downward and the upper threshold level is adjusted upward, and when the control voltage lies above the upper threshold level, the frequency band selection is increased to a next higher frequency band.
    • 提供了一种压控振荡器(VCO),其包括阈值电平设置电路,其可操作以设置较低的可变阈值电平并设置较高的可变阈值电平。 VCO包括频带选择单元,其可操作以将VCO的频带设置调整为多个频带设置中的一个。 VCO还包括比较器,其可操作以确定VCO的控制电压是否落在下阈值电平和上阈值电平之间。 VCO还包括阈值调整和校准电路,其可操作以在控制电压落在下限和上限阈值水平之间时维持频带设置。 否则,当控制电压低于下阈值电平时,下阈值电平向下调整,上阈值电平向上调整,当控制电压高于上阈值电平时,频段选择增加到下一阈值 较高频段。
    • 6. 发明申请
    • DYNAMIC THRESHOLD FOR VCO CALIBRATION
    • 用于VCO校准的动态阈值
    • US20050179501A1
    • 2005-08-18
    • US10708233
    • 2004-02-18
    • Joseph NatonioMichael Sorna
    • Joseph NatonioMichael Sorna
    • H03L7/00H03L7/099H03L7/10H03L7/18
    • H03L7/099H03L7/10H03L7/18
    • A voltage controlled oscillator (VCO) is provided which includes a threshold level setting circuit operable to set a lower variable threshold level and to set an upper variable threshold level. The VCO includes a frequency band selection unit operable to adjust a frequency band setting of the VCO to one of a plurality of frequency band settings. The VCO further includes a comparator operable to determine whether a control voltage of the VCO falls between the lower threshold level and the upper threshold level. The VCO further includes a threshold adjustment and calibration circuit operable to maintain the frequency band setting when the control voltage falls between the lower and upper threshold levels. Otherwise, when the control voltage lies below the lower threshold level, the lower threshold level is adjusted downward and the upper threshold level is adjusted upward, and when the control voltage lies above the upper threshold level, the frequency band selection is increased to a next higher frequency band.
    • 提供了一种压控振荡器(VCO),其包括阈值电平设置电路,其可操作以设置较低的可变阈值电平并设置较高的可变阈值电平。 VCO包括频带选择单元,其可操作以将VCO的频带设置调整为多个频带设置中的一个。 VCO还包括比较器,其可操作以确定VCO的控制电压是否落在下阈值电平和上阈值电平之间。 VCO还包括阈值调整和校准电路,其可操作以在控制电压落在下限和上限阈值水平之间时维持频带设置。 否则,当控制电压低于下阈值电平时,下阈值电平向下调整,上阈值电平向上调整,当控制电压高于上阈值电平时,频段选择增加到下一阈值 较高频段。
    • 8. 发明申请
    • Design structure for CMOS differential rail-to-rail latch circuits
    • CMOS差分轨到轨锁存电路的设计结构
    • US20090108885A1
    • 2009-04-30
    • US11982206
    • 2007-10-31
    • Joseph NatonioSteven J. Zier
    • Joseph NatonioSteven J. Zier
    • H03K3/3562H03K21/00H03K3/00
    • H03K3/35625
    • A design structure including a CMOS rail-to-rail differential latch is provided in which a plurality of cross-coupled devices pull first and second nodes of the latch to opposite rail-to-rail voltages. Desirably, first and second output isolating elements have inputs coupled to the first and second nodes, the output isolating elements being operable to output versions of the opposite rail-to-rail voltages as a true and a complementary output of the latch. In this way, the true output has a rising edge occurring simultaneously with a falling edge of the complementary output. The complementary output has a rising edge occurring simultaneously with a falling edge of the true output. First and second input isolating elements of the latch have outputs coupled to the first and second nodes, the first and second input isolating elements being operable to apply versions of input signals to the first and second nodes.
    • 提供了包括CMOS轨到轨差分锁存器的设计结构,其中多个交叉耦合器件将闩锁的第一和第二节点拉到相对的轨至轨电压。 期望地,第一和第二输出隔离元件具有耦合到第一和第二节点的输入,输出隔离元件可操作以将相对的轨至轨电压的版本输出为锁存器的真实和互补输出。 以这种方式,真正的输出具有与互补输出的下降沿同时出现的上升沿。 互补输出具有与真实输出的下降沿同时发生的上升沿。 锁存器的第一和第二输入隔离元件具有耦合到第一和第二节点的输出,第一和第二输入隔离元件可操作以将输入信号的版本应用于第一和第二节点。
    • 9. 发明申请
    • Method of testing connectivity using dual operational mode CML latch
    • 使用双操作模式CML锁定测试连接的方法
    • US20080129329A1
    • 2008-06-05
    • US12002878
    • 2007-12-19
    • Joseph O. MarshJoseph NatonioJames M. Wilson
    • Joseph O. MarshJoseph NatonioJames M. Wilson
    • H03K19/003
    • H03K3/356043
    • A method of testing connectivity through a plurality of dual purpose current mode logic (“CML”) latch circuits connected in a series is provided. Each of the CML latch circuits are operable to latch at least one output signal at a timing in accordance with at least one clock signal and having a mode control device for operating the CML latch circuit as a buffer amplifier when the at least one clock signal is inactive. The method comprises the steps of activating the mode control devices of each of the CML latches to operate each of the CML latches as a buffer; inputting a first signal to a first CML latch of the series; latching an output signal of a second CML latch of the series, the second CML latch being connected at a point in the series downstream from the first CML latch; and determining whether the output signal changes in accordance with a change in the first signal.
    • 提供了通过串联连接的多个双用途电流模式逻辑(“CML”)锁存电路来测试连接性的方法。 每个CML锁存电路可操作以根据至少一个时钟信号在定时锁存至少一个输出信号,并具有一个模式控制装置,用于当至少一个时钟信号为 不活跃 该方法包括以下步骤:激活每个CML锁存器的模式控制装置,以操作每个CML锁存器作为缓冲器; 向所述系列的第一CML锁存器输入第一信号; 锁存串联的第二CML锁存器的输出信号,第二CML锁存器在第一CML锁存器下游的串联点连接; 以及确定所述输出信号是否根据所述第一信号的改变而改变。
    • 10. 发明授权
    • Testing of digital to analog converters in serial interfaces
    • 在串行接口中测试数模转换器
    • US08686884B2
    • 2014-04-01
    • US13586176
    • 2012-08-15
    • Steven J. BaumgartnerWilliam D. CortiJoseph Natonio
    • Steven J. BaumgartnerWilliam D. CortiJoseph Natonio
    • H03M1/10
    • H03M1/109H03M1/66
    • A system and method for testing digital to analog converters (DAC) in a serial interface having a comparator to receive an input signal and a local offset signal is disclosed. A first DAC selectably provides one of a global offset to the input signal during a normal mode of operation and a first test signal to the comparator during a test mode of operation. A second DAC selectably provides one of the local offset signals to the comparator during the normal mode of operation and a second test signal to the comparator during the test mode of operation. A test module may cause the first DAC to determine a first test signal to provide to the local offset input of the comparator and may cause the second DAC to incrementally change a test signal provided to the comparator.
    • 公开了一种用于在具有用于接收输入信号和本地偏移信号的比较器的串行接口中测试数模转换器(DAC)的系统和方法。 在操作的正常模式期间,第一DAC可选地提供输入信号的全局偏移中的一个,以及在测试操作模式期间向比较器提供第一测试信号。 第二DAC在正常操作模式期间可选地将一个局部偏置信号提供给比较器,并且在测试操作模式期间将第二测试信号提供给比较器。 测试模块可以使得第一DAC确定第一测试信号以提供给比较器的本地偏移输入,并且可以使得第二DAC递增地改变提供给比较器的测试信号。