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    • 5. 发明授权
    • Apparatus for substrate processing with improved throughput and yield
    • 用于基板处理的装置,具有改善的生产量和产量
    • US6129044A
    • 2000-10-10
    • US409477
    • 1999-10-06
    • Jun ZhaoAshok SinhaAvi TepmanMei ChangLee LuoAlex SchreiberTalex SajotoStefan WolffCharles DornfestMichal Danek
    • Jun ZhaoAshok SinhaAvi TepmanMei ChangLee LuoAlex SchreiberTalex SajotoStefan WolffCharles DornfestMichal Danek
    • C23C16/44C23C16/46C23C16/52C23C16/56H01J37/32C23C16/00G06F19/00
    • C23C16/4411C23C16/4412C23C16/46C23C16/52C23C16/56H01J37/3244H01J37/32834H01J2237/2001
    • The present invention provides an approach which provides an increase in the number of usable substrates with a film, such as titanium nitride, deposited thereon at a sufficient deposition rate and where the film meets uniformity and resistivity specifications as well as providing good step coverage. In accordance with an embodiment, the present invention provides an apparatus for substrate processing. The apparatus circulates a heat exchange medium through a passage in a chamber body of a vacuum chamber, and heats a heater pedestal having a surface for supporting the substrate to a heater temperature. The heat exchange medium has a heat exchange temperature of about 60.degree. C. or less. The the apparatus also flows a gas into the chamber at a flow rate to deposit a film on a substrate, where the flow rate provides an effective temperature of the substrate lower than the heater temperature and where the film meets uniformity and resistance specifications after deposition onto a number of substrates. This number is less than twenty-five, in some embodiments, and less than ten in other embodiments. The use of the present invention thus avoids the discarding of the initial hundreds of processed substrates not meeting specifications that is typically experienced with the prior art processes.
    • 本发明提供了一种方法,其以足够的沉积速率在其上沉积有诸如氮化钛的膜,并且其中膜满足均匀性和电阻率规格以及提供良好的阶梯覆盖,提高了可用基板的数量的增加。 根据实施例,本发明提供了一种用于基板处理的装置。 该装置使热交换介质通过真空室的室主体中的通道循环,并将具有用于支撑基板的表面的加热器基座加热到加热器温度。 热交换介质的热交换温度为约60℃以下。 该设备还以流速将气体流入室中,以将膜沉积在基底上,其中流速提供了低于加热器温度的基底的有效温度,并且其中膜在沉积之后满足均匀性和电阻规格 一些基板。 在其他实施例中,该数量少于二十五个,在一些实施例中小于十个。 因此,本发明的使用避免了丢弃初始数百个处理过的基板,这些基板不符合现有技术工艺通常经历的规格。
    • 6. 发明授权
    • Apparatus for ceramic pedestal and metal shaft assembly
    • 陶瓷基座和金属轴组件的装置
    • US5994678A
    • 1999-11-30
    • US798004
    • 1997-02-12
    • Jun ZhaoTalex SajotoLeonid SelyutinCharles DornfestStefan WolffLee LuoEller Juco
    • Jun ZhaoTalex SajotoLeonid SelyutinCharles DornfestStefan WolffLee LuoEller Juco
    • C23C16/458C23C16/46C23C16/509H05B3/06C23C16/00
    • C23C16/463C23C16/4586C23C16/46C23C16/5096
    • The present invention provides systems, methods and apparatus for depositing titanium films at rates up to 200 .ANG./minute on semiconductor substrates from a titanium tetrachloride source. In accordance with an embodiment of the invention, a ceramic heater assembly with an integrated RF plane for bottom powered RF capability allows PECVD deposition at a temperature of at least 400.degree. C. for more efficient plasma treatment. A thermal choke isolates the heater from its support shaft, reducing the thermal gradient across the heater to reduce the risk of breakage and improving temperature uniformity of the heater. A deposition system incorporates a flow restrictor ring and other features that allow a 15 liters/minute flow rate through the chamber with minimal backside deposition and minimized deposition on the bottom of the chamber, thereby reducing the frequency of chamber cleanings, and reducing clean time and seasoning. Deposition and clean processes are also further embodiments of the present invention.
    • 本发明提供了用于从四氯化钛源在半导体衬底上以高达200安培/分钟的速率沉积钛膜的系统,方法和装置。 根据本发明的实施例,具有用于底部供电RF能力的集成射频平面的陶瓷加热器组件允许在至少400℃的温度下进行PECVD沉积以用于更有效的等离子体处理。 热扼流器将加热器与其支撑轴隔离,减少了加热器两端的热梯度,以减少加热器断裂的危险并改善加热器的温度均匀性。 沉积系统包括限流器环和其它特征,其允许通过腔室的15升/分钟的流速具有最小的背侧沉积并且最小化在室的底部上的沉积,从而降低室清洁的频率,并且减少清洁时间和 调味料。 沉积和清洁过程也是本发明的进一步的实施方案。
    • 8. 发明授权
    • High temperature, high deposition rate process and apparatus for
depositing titanium layers
    • 高温,高沉积速率工艺和用于沉积钛层的设备
    • US6051286A
    • 2000-04-18
    • US918706
    • 1997-08-22
    • Jun ZhaoLee LuoXiao Liang JinJia-Xiang WangStefan WolffTalex Sajoto
    • Jun ZhaoLee LuoXiao Liang JinJia-Xiang WangStefan WolffTalex Sajoto
    • C23C16/44C23C16/52C23C16/08
    • H01J37/3244C23C16/4401C23C16/4405C23C16/4412C23C16/52H01J2237/3321
    • The present invention provides systems, methods and apparatus for depositing titanium films at rates up to 200 .ANG./minute on semiconductor substrates from a titanium tetrachloride source. In accordance with an embodiment of the invention, a ceramic heater assembly with an integrated RF plane for bottom powered RF capability allows PECVD deposition at a temperature of at least 400.degree. C. for more efficient plasma treatment. A thermal choke isolates the heater from its support shaft, reducing the thermal gradient across the heater to reduce the risk of breakage and improving temperature uniformity of the heater. A deposition system incorporates a flow restrictor ring and other features that allow a 15 liters/minute flow rate through the chamber with minimal backside deposition and minimized deposition on the bottom of the chamber, thereby reducing the frequency of chamber cleanings, and reducing clean time and seasoning. Deposition and clean processes are also further embodiments of the present invention.
    • 本发明提供了用于从四氯化钛源在半导体衬底上以高达200安培/分钟的速率沉积钛膜的系统,方法和装置。 根据本发明的实施例,具有用于底部供电RF能力的集成射频平面的陶瓷加热器组件允许在至少400℃的温度下进行PECVD沉积以用于更有效的等离子体处理。 热扼流器将加热器与其支撑轴隔离,减少了加热器两端的热梯度,以减少加热器断裂的危险并改善加热器的温度均匀性。 沉积系统包括限流器环和其它特征,其允许15升/分钟的流速通过室,具有最小的背侧沉积并且最小化在室底部上的沉积,从而降低室清洁的频率,并且减少清洁时间和 调味料。 沉积和清洁过程也是本发明的进一步的实施方案。