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    • 1. 发明授权
    • Production of conductive metal silicide films from ultrafine powders
    • 从超细粉末制造导电金属硅化物薄膜
    • US4617237A
    • 1986-10-14
    • US609628
    • 1984-05-14
    • Arunava GuptaGary A. WestJames T. Yardley
    • Arunava GuptaGary A. WestJames T. Yardley
    • C04B41/87C23C24/08H01L21/28B05D3/06B05D5/12B32B9/04B32B19/00
    • C23C24/082H01L21/28097
    • A method of producing a thin film comprising a conductive metal silicide and the products produced therefrom are disclosed. The method is much less complex than methods employed in the prior art for producing conductive thin films and the method reduces substrate damage by maintaining processing temperatures at about 1,000.degree. C. or less. The process employs a stable suspension comprising ultrafine powders in a solvent. This suspension is deposited on a surface of a substrate and is subsequently heated to form a thin conductive film. The thin conductive film comprises polycrystalline metal silicide, preferably a refractory metal silicide, and may also contain silicon. Composites comprising the thin conductive films and a substrate are also disclosed. The process and products are particularly suited for use in VLSI and VVLSI production.
    • 公开了一种制造包含导电金属硅化物的薄膜及其产生的产品的方法。 该方法比用于制造导电薄膜的现有技术中使用的方法复杂得多,并且该方法通过将处理温度维持在约1000℃以下来降低基板损伤。 该方法采用在溶剂中包含超细粉末的稳定悬浮液。 将该悬浮液沉积在基材的表面上,随后被加热以形成薄的导电膜。 薄导电膜包括多晶金属硅化物,优选难熔金属硅化物,并且还可以含有硅。 还公开了包括薄导电膜和基底的复合材料。 该工艺和产品特别适用于VLSI和VVLSI生产。
    • 7. 发明授权
    • Stable suspensions of boron, phosphorus, antimony and arsenic dopants
    • 硼,磷,锑和砷掺杂剂的稳定悬浮液
    • US4490192A
    • 1984-12-25
    • US502360
    • 1983-06-08
    • Arunava GuptaGary A. WestJeffrey P. Donlan
    • Arunava GuptaGary A. WestJeffrey P. Donlan
    • C30B31/02H01L21/22H01L21/225
    • C30B31/02H01L21/2225H01L21/2254H01L21/2257Y10S252/95Y10S252/951
    • Semiconductor doping compositions comprising a suspension of (a) a dopant material, in the form of finely divided spherical particles of narrow size distribution from about 0.1 D to D, where D is the diameter of the largest particle and is no more than about (1.mu.) comprising a member selected from the group consisting of B.sub.x Si.sub.y, B.sub.x N.sub.y, P.sub.x Si.sub.y, P.sub.x N.sub.y, As.sub.x Si.sub.y and Sb.sub.x Si.sub.y wherein x and y vary from about 0.001 to about 99.999 mole percent, (b) an effective amount of a thermally degradable polymeric organic binder such as polymethyl methacrylate; and (c) an amount of an organic solvent, such a cyclohexanone, sufficient to dissolve said polymeric organic binder, such as polymethylmethacrylate, and to disperse said dopant material are disclosed. Three diffusion processes using the semiconductor doping compositions of the present invention for preparation of semiconductor materials having a wide range of sheet resistances and junction depths are also disclosed. The dopant materials selected for the semiconductor compositions of the present invention are less sensitive to moisture and chemical degradation and thereby afford greater processing latitude, are more reproducible and are less prone to create damage to and/or staining of the semiconductor substrate.
    • 半导体掺杂组合物,其包含(a)掺杂剂材料的悬浮液,所述掺杂剂材料为从0.1D到D的窄尺寸分布的精细分散的球形颗粒形式,其中D是最大颗粒的直径且不大于约(1 包括选自BxSiy,BxNy,PxSiy,PxNy,AsxSiy和SbxSiy的成员,其中x和y从约0.001至约99.999摩尔%变化,(b)有效量的可热降解的聚合有机粘合剂,例如 作为聚甲基丙烯酸甲酯; 和(c)公开了一定量的足以溶解所述聚合物有机粘合剂的有机溶剂,例如环己酮,例如聚甲基丙烯酸甲酯,并分散所述掺杂剂材料。 还公开了使用本发明的半导体掺杂组合物制备具有宽范围的薄层电阻和结深度的半导体材料的三个扩散方法。 为本发明的半导体组合物选择的掺杂剂材料对水分和化学降解较不敏感,从而提供更大的加工范围,更可再现,并且不太容易对半导体衬底造成损害和/或染色。
    • 9. 发明授权
    • Micro goniometer for scanning probe microscopy
    • 用于扫描探针显微镜的微测角仪
    • US06552339B1
    • 2003-04-22
    • US09572209
    • 2000-05-17
    • Arunava GuptaRavi Saraf
    • Arunava GuptaRavi Saraf
    • G01N2300
    • G01Q70/06G01B7/30G01Q20/04G11B9/14G11B9/1409G11B9/1418G11B2005/0002Y10S977/852Y10S977/872
    • A goniometer for performing scanning probe microscopy on a substrate surface is disclosed. The goniometer has a cantilever, having a cantilevered end and a supported end and a tip disposed at the cantilevered end of the cantilever. The goniometer also has a block disposed at the supported end of the cantilever. The block has at least one pair of piezoelectric layers, a pair of electrodes disposed about each individual piezoelectric layer such that varying a potential difference applied between the individual electrodes of a pair of electrodes causes the corresponding piezoelectric layer to deform, and a first insulating material disposed between the individual electrodes for insulating the individual electrodes from each other. The individual piezoelectric layers are deformed at different rates resulting in a deformity of the block and tilting of the cantilever and tip connected therewith. Also disclosed are methods of using the goniometer of the present invention to measure the interactive forces between two molecular structures using a scanning probe microscope equipped with a goniometer of the present invention.
    • 公开了一种用于在衬底表面上执行扫描探针显微镜的测角器。 测角器具有悬臂,具有悬臂端和支撑端,以及设置在悬臂悬臂端的尖端。 测角器还具有设置在悬臂的支撑端处的块。 该块具有至少一对压电层,围绕每个单独的压电层设置的一对电极,使得改变施加在一对电极的各个电极之间的电势差导致相应的压电层变形,并且第一绝缘材料 设置在各个电极之间,用于使各个电极彼此绝缘。 单个压电层以不同的速率变形,导致块的变形和与其连接的悬臂和尖端的倾斜。 还公开了使用本发明的测角器的方法,使用配备有本发明的测角器的扫描探针显微镜来测量两个分子结构之间的相互作用力。