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    • 5. 发明授权
    • Analog to digital converter with improved input overload recovery
    • 具有改进的输入过载恢复模数转换器
    • US07786909B2
    • 2010-08-31
    • US12337658
    • 2008-12-18
    • Anand Hariraj UdupaNeeraj ShrivastavaNitin Agarwal
    • Anand Hariraj UdupaNeeraj ShrivastavaNitin Agarwal
    • H03M1/06
    • H03M1/129H03M1/069H03M1/164
    • With high speed analog to digital converters (ADCs), components within the ADC can enter a saturation region when an input exceeded the input range of the ADC, which can cause errors. Here, a sample of an input signal to an ADC is compared with the upper and lower full-scale levels of the ADC. If input overload is detected, inputs to amplifiers in an input stage of the ADC are forced to zero for the duration of the input overload, and are thus prevented from going into saturation. Input overload conditions are signaled directly to an output digital block of the ADC, which provides output digital codes equivalent to either the upper or the lower full scale level depending on whether the input overload is signaled as exceeding the upper level or the lower level. Input overload recovery time of the ADC may thus be minimized.
    • 使用高速模数转换器(ADC)时,当输入超过ADC的输入范围时,ADC内部的器件可能会进入饱和区,从而导致错误。 这里,将ADC的输入信号的样本与ADC的上限和下限满量程电平进行比较。 如果检测到输入过载,则在输入过载的持续时间内,ADC输入级放大器的输入被强制为零,从而防止输入过饱和。 输入过载条件直接发送到ADC的输出数字模块,根据输入过载信号是否超过上限或下限,提供与上限或下限满量程电平相当的输出数字代码。 因此可以将ADC的输入过载恢复时间最小化。
    • 6. 发明申请
    • ANALOG TO DIGITAL CONVERTER WITH IMPROVED INPUT OVERLOAD RECOVERY
    • 模拟到具有改进的输入过载恢复的数字转换器
    • US20090184853A1
    • 2009-07-23
    • US12337658
    • 2008-12-18
    • Anand Hariraj UdupaNeeraj ShrivastavaNitin Agarwal
    • Anand Hariraj UdupaNeeraj ShrivastavaNitin Agarwal
    • H03M1/06H03M1/12
    • H03M1/129H03M1/069H03M1/164
    • An aspect of the present invention avoids an amplifier of an analog to digital converter (ADC) from entering a saturation region. In an embodiment, a sample of an input signal to an ADC is compared with the upper and lower full-scale levels of the ADC. If input overload is detected, inputs to amplifiers in an input stage of the ADC are forced to zero for the duration of the input overload, and are thus prevented from going into saturation. Input overload conditions are signaled directly to an output digital block of the ADC, which provides output digital codes equivalent to either the upper or the lower full scale level depending on whether the input overload is signaled as exceeding the upper level or the lower level. Input overload recovery time of the ADC may thus be minimized.
    • 本发明的一个方面避免了模数转换器(ADC)的放大器进入饱和区域。 在一个实施例中,将ADC的输入信号的样本与ADC的上限和下限满量程电平进行比较。 如果检测到输入过载,则在输入过载的持续时间内,ADC输入级放大器的输入被强制为零,从而防止输入过饱和。 输入过载条件直接发送到ADC的输出数字模块,该输出数字模块根据输入过载信号是否超过上限或下限,提供相当于上限或下限满量程级别的输出数字代码。 因此可以将ADC的输入过载恢复时间最小化。
    • 9. 发明授权
    • Increasing the common mode range of a circuit
    • 增加电路的共模范围
    • US07898331B2
    • 2011-03-01
    • US11164503
    • 2005-11-28
    • Anand Hariraj UdupaJagannathan Venkataraman
    • Anand Hariraj UdupaJagannathan Venkataraman
    • H03F3/45
    • H03F3/45H03F3/45479
    • Increasing the input common-mode range of a circuit which accepts differential signals as inputs. Such an increase may be attained by correcting an input signal at continuous levels or at 2 or more discrete levels) without changing the strength represented by the input signal. In an embodiment, the common-mode component of an input signal is measured, and a correction voltage proportional to the difference between the measured common-mode component and a reference voltage, is generated. The correction voltage is coupled to the input terminals of the differential circuit to correct for any deviations from a desired level of common-mode voltage at the input terminals of the differential circuit. The approaches are applied to a switched-capacitor differential amplifier used in a sample-and-hold portion of an ADC.
    • 增加接收差分信号作为输入的电路的输入共模范围。 这种增加可以通过以连续电平或2个或更多个离散电平校正输入信号而不改变由输入信号表示的强度来实现。 在一个实施例中,测量输入信号的共模分量,并且产生与所测量的共模分量与参考电压之间的差成比例的校正电压。 校正电压耦合到差分电路的输入端,以校正在差分电路的输入端处与共模电压的期望电平的任何偏差。 这些方法被应用于在ADC的采样和保持部分中使用的开关电容差分放大器。